A specimen radiography system may include a controller and a cabinet. The cabinet may include an x-ray source, an x-ray detector, and a specimen drawer disposed between the x-ray source and the x-ray detector. The specimen drawer may be automatically positionable along a vertical axis between the x-ray source and the x-ray detector.

Systems, devices, and methods of Fourier ptychographic imaging configured for illuminating a specimen being imaged from a plurality of incidence angles, for acquiring variably-illuminated, low-resolution intensity images of the specimen, and for reconstructing a high-resolution image of the specimen by iteratively determining the high resolution image that is self-consistent with the variably-illuminated, low-resolution intensity images, for example, by updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space.

Systems, devices, and methods of Fourier ptychographic imaging configured for illuminating a specimen being imaged from a plurality of incidence angles, for acquiring variably-illuminated, low-resolution intensity images of the specimen, and for reconstructing a high-resolution image of the specimen by iteratively determining the high resolution image that is self-consistent with the variably-illuminated, low-resolution intensity images, for example, by updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space.

Disclosed herein is an apparatus comprising: a radiation absorption layer comprising an electrode; a counter; a controller configured to cause a number registered by the counter to change, in response to an absolute value of an electrical signal on the electrode equaling or exceeding an absolute value of a second threshold during a time delay that is started from a time at which the absolute value of the electrical signal equals or exceeds an absolute value of a first threshold.

A system for high-resolution high-contrast x-ray ghost diffraction comprises: A) a laboratory x-ray source configured to provide an input beam; B) a diffuser configured to induce intensity fluctuations in the input beam; C) a beam splitter configured to split the input beam into: i) a test arm comprising an object and a single-pixel detector; and ii) a reference arm comprising one of: (a) a multi-pixel detector and (b) a single-pixel detector and an aperture or a scanning slit configured to simulate a one or two dimensional multi-pixel detector; and D) a processor configured to receive output intensity measurements of the detectors in the test arm and the reference arm, to record the output intensity measurements at different rotational positions of the rotating diffuser, to correlate the output intensity measurements, and to use the correlated output measurements to reconstruct a diffraction pattern of the object; wherein the object is placed as close as possible to the beam splitter and the detectors in the test arm and the reference arm are equidistant from the beam splitter.

The present disclosure discusses systems and methods to detect blur in digital images. The solution can be incorporated into the quality control systems of pathology and other slide scanners or can be a stand-alone solution. The solution can identify scanned images that include blur and cause the scanner to automatically rescan the blurry image. The solution can also identify regions of the scanned image that include blur. The solution can generate blur maps for each of the scanned images that identify regions of the scanned image that include blur.

A mask inspection apparatus includes an image acquisition mechanism that acquires an optical image of the pattern by making an inspection light incident on an EUV mask and detecting a reflection inspection light reflected from the EUV mask, in a state where the relation between the incident direction of the inspection light used for inspecting the pattern formed on the EUV mask, and the arrangement direction of the EUV mask serving as the inspection substrate is matched with the relation between the incident direction of the EUV light on the EUV mask, and the arrangement direction of the EUV mask in the EUV exposure apparatus.

A system for radiographic tissue density evaluation includes a cassette for exposure to an X-ray source, where the cassette is configured to obtain information to perform intensity standardization of a captured radiographic image of a subject, a calibration bar with a predetermined radiographic signature on or within the cassette to serve as reference for performing the intensity standardization, and a software program to perform analysis on and to provide a display of the captured radiographic image. The cassette also includes a radio-opaque backing with a spatial homogenous X-ray radiographic signature used to estimate a source-detector geometrical inhomogeneity.

A system for radiographic tissue density evaluation includes a cassette for exposure to an X-ray source, where the cassette is configured to obtain information to perform intensity standardization of a captured radiographic image of a subject, a calibration bar with a predetermined radiographic signature on or within the cassette to serve as reference for performing the intensity standardization, and a software program to perform analysis on and to provide a display of the captured radiographic image. The cassette also includes a radio-opaque backing with a spatial homogenous X-ray radiographic signature used to estimate a source-detector geometrical inhomogeneity.

A target for generating x-rays includes at least one substrate including a first material and a plurality of discrete structures including at least one second material configured to generate x-rays in response to electron bombardment. The discrete structures are distributed across a first surface of the at least one substrate in an array pattern function A that has a corresponding function B such that a combination operation of the array pattern function A with the corresponding function B generates a resultant function C comprising a first portion with a single peak and a substantially flat second portion surrounding the first portion. The combination operation includes a cross-correlation operation or a convolution operation