The invention generally relates to methods and devices for synchronization of ion generation with cycling of a discontinuous atmospheric interface. In certain embodiments, the invention provides a system for analyzing a sample that includes a mass spectrometry probe that generates sample ions, a discontinuous atmospheric interface, and a mass analyzer, in which the system is configured such that ion formation is synchronized with cycling of the discontinuous atmospheric interface.

An ion source is provided comprising a nebuliser or electrospray probe (1) for nebulising a sample and an impact surface or target electrode (5). The impact surface or target electrode (5) comprises a tarnishable or oxidisable metal or an alloy comprising a tarnishable or oxidisable metal. Also provided is an ion source comprising a nebuliser or electrospray probe with a central wire comprising a tarnishable or oxidisable metal or an alloy comprising a tarnishable or oxidisable metal or an alloy comprising a tarnishable or oxidisable metal. Adducts with relatively heavy metals result in simplified multiply-charged mass spectra that are easier to interpret.

Disclosed are techniques for mass spectrometry. In one example, an isotopologue of a target analyte is added to a sample. The sample and isotopologue are analyzed as it elutes from a chromatography system to form precursor ions. The precursor ions are mass analysed using a data independent acquisition (DIA) methodology comprising performing mass analysis scans in the MS1 domain and performing mass analysis scans in the MS2 domain. Upon identifying that the isotopologue is eluting from the chromatography system, a plurality of target scans are performed, each having a target isolation window including a mass to charge ratio representative of the target analyte over the duration of a chromatographic peak of the isotopologue for at least one of identification and quantitation of the target analyte. The target scans are configured to provide additional quantitation data for the target analyte.

A method comprises measuring a first physico-chemical property of analyte ions so as to produce a data set, and identifying a first group of analyte ions within the data set. Analyte ions within the first group each have a value of an attribute that corresponds to a first value or that is within a first range of the attribute. The method further comprises selecting, from a plurality of different calibrations, a first calibration associated with the first value or first range of the attribute, and calibrating the measured first physico-chemical property of the first group of analyte ions using the first calibration.

Described herein are systems and methods for imaging mass spectrometry, including imaging mass cytometry. Aspects of the subject application include apparatus and methods for imaging mass spectrometry (IMS) that improve speed of sample acquisition, signal sensitivity, and/or signal stability. Systems and methods described herein may minimize the transfer time and/or may minimize the spread of plumes of sample material ablated from a sample to be transferred to the components of the imaging mass spectrometer or mass cytometer that ionize and analyze the sample material.

A mode of a chromatograph mass spectrometer configured to collect chromatograph mass spectrometry data by repeatedly performing MS analysis and MS/MS analysis or only MS/MS analysis according to a predetermined condition in the mass spectrometer unit on a sample containing a compound separated by a chromatograph unit; a scatter diagram creation section (45) configured to create, based on the data collected by the measurement unit, a scatter diagram in which a retention time and a mass-to-charge ratio of precursor ions are set to axes orthogonal to each other and positions or ranges of the precursor ions from which MS/MS spectra are acquired are plotted; a spectrum creation unit (46) configured to create MS/MS spectra corresponding to the precursor ions indicated on the scatter diagram; and a display processing unit (48) configured to display the scatter diagram and the MS/MS spectra together on a screen of a display unit.

A method for detecting radicals in process gases in a semiconductor fabrication assembly is provided where the semiconductor fabrication includes a plasma source and a mass spectrometer with an ion source. The method includes separating ions from the process gases and determining a fixed electron energy in which to measure the process gases. Process gases in the semiconductor fabrication assembly are continuously sampled. A first measurement is performed on the sampled process gases at the electron energy using the mass spectrometer, where the first measurement is performed with the plasma source off. A second measurement of the sampled process gases is performed at the fixed electron energy using the mass spectrometer, where the second measurement is performed with the plasma source on. An amount of a radical present in the sampled process gases is determined as a difference between the second measurement and the first measurement.

An electron-ion interaction module for use in a mass spectrometer, having a plurality of rod sets arranged relative to one another such that said rod sets share a common longitudinal axis and each of said rod sets is longitudinally separated from an adjacent rod set by a gap, each of said rod sets comprising a plurality of rods arranged around said common longitudinal axis. The module further includes at least one magnet disposed around said rod sets so as to at least partially surround one or more of said plurality of rod sets and configured to generate a static magnetic field along said longitudinal axis. The rod sets are configured to receive electrons from an electron source and ions from an ion source within an interaction volume defined by the rods. One or more RF voltage sources coupled to the plurality of rod sets applies voltages to the rods.

In a system for processing gas, a gas analyzer in a gas analyzer chamber measures a quantity of ions generated from a gas. An ionization source includes an ionization chamber and an electron source for generating ions for the gas analyzer. The ionization chamber encompasses an ionization region in which particles of the gas are charged to form the ions. A channel directs the gas from a gas source into the ionization chamber, and the channel extends to a surface of the ionization chamber. An ionization source vacuum pump is in gaseous communication with the ionization chamber via a substantially large opening, and operates to draw gas from the ionization chamber.

The present invention provides reagents for instrumentation quality control and methods of use thereof. In particular, sets of peptides or other molecules are provided for evaluating the performance of instruments with mass spectrometry (MS) and/or liquid chromatography (LC) functionalities.