A reference voltage buffer circuit includes an operational amplifier, a capacitor switching module, a first transistor and a second transistor. The operational amplifier includes two input terminals and an output terminal, where the two input terminals receive an input reference voltage and a feedback voltage, respectively. A gate electrode of the first transistor is coupled to the capacitor switching module, and a source electrode of the first transistor provides the feedback voltage. A gate electrode of the second transistor is coupled to the capacitor switching module, and a source electrode of the second transistor provides an output reference voltage. In addition, the operational amplifier generates a stable control voltage to the gate electrodes of the first transistor and the second transistors via the capacitor switching module while the output terminal of the operational amplifier is not directly connect to the gate electrodes of the first transistor and the second transistors.

According to an aspect, a current mode logic circuit comprise a first trim resistor and a second trim resistor connected to a supply voltage, a first transistor connected to an input voltage, a second transistor connected to an inverted input voltage and a third transistor and a fourth transistor connected to the first transistor and the second transistor, respectively, in a cascode manner in order to control magnitudes of an output voltage and an inverted output voltage of the current mode logic circuit.

A method of using memristor aided logic (MAGIC), comprises connecting together two input and one output memristor between a bit line and a word line, each memristor having a high resistance state and a low resistance state, setting the output memristor to the low resistance state as an initiation state and then applying logic inputs to the input memristors. The output then depends on whether the logic inputs have set the output memristor to the high resistance state.

Various implementations described herein are directed to circuit. The circuit may include a first input stage having first devices and a first path for slow slew input detection. The circuit may include a second input stage having second devices and a second path for fast slew input detection. The circuit may include a separation stage that couples the second input stage to the first input stage during a first mode of operation so as to reduce power consumption of the circuit during slow slew input detection.

Memory including an array of memory cells might include an input buffer having calibration circuitry, a first input, a second input, and an output; and calibration logic having an input selectively connected to the output of the input buffer and comprising an output connected to the calibration circuitry, wherein the calibration logic is configured to cause the memory to determine whether the input buffer exhibits offset while a particular voltage level is applied to the first and second inputs of the input buffer, and, in response to determining that the selected input buffer exhibits offset, apply an adjustment to the calibration circuitry while the particular voltage level is applied to the first and second inputs until a logic level of the output of the selected input buffer transitions.

A digital buffer device with self-calibration includes a first buffer circuit, detection circuit, and calibration circuit. The first buffer circuit has a buffer input terminal for receiving an input signal and a buffer output terminal as output of the digital buffer device. The detection circuit includes at least one second buffer circuit for receiving at least one reference signal and generating at least one detection signal to indicate circuit characteristic variations of the at least one second buffer circuit. The at least one second buffer circuit is of a same type of buffer as the first buffer circuit. The calibration circuit has a calibration input terminal for receiving the input signal, and a calibration output terminal coupled to the buffer output terminal. The calibration circuit is for calibrating the first buffer circuit to generate an output signal according to the input signal and the at least one detection signal.

A code shift calculation circuit is provided. A first operation circuit of the code shift calculation circuit generates a first output value according to a temperature difference and a first change rate of a driving strength code to temperature. The temperature difference is a difference between a previous temperature when getting a previous ZQ command and a current temperature when getting a current ZQ command. A second operation circuit generates a second output value according to a voltage difference and a second change rate of the driving strength code to voltage. The voltage difference is a difference between a previous working voltage when getting the previous ZQ command and a current working voltage when getting the current ZQ command. A third operation circuit sums up the first output value and the second output value to generate a shift value, thereby adjusting the driving strength code calibrated by ZQ calibration.

A circuit architecture for expanded design for testability functionality is provided that includes an Intellectual Property (IP) core for use with a design for an integrated circuit (IC). The IP core provides an infrastructure harness circuit configured to control expanded design for testability functions available within the IC. An instance of the IP core can be included in a circuit block of the design for the IC. The infrastructure harness circuit can include an outward facing interface configured to connect to circuitry outside of the circuit block and an inward facing interface configured to connect to circuitry within the circuit block. The instance of the IP core can be parameterized to configure the infrastructure harness circuit to control a plurality of functions selected from the expanded design for testability functions based on a user parameterization of the instance of the IP core.

A circuit architecture for expanded design for testability functionality is provided that includes an Intellectual Property (IP) core for use with a design for an integrated circuit (IC). The IP core provides an infrastructure harness circuit configured to control expanded design for testability functions available within the IC. An instance of the IP core can be included in a circuit block of the design for the IC. The infrastructure harness circuit can include an outward facing interface configured to connect to circuitry outside of the circuit block and an inward facing interface configured to connect to circuitry within the circuit block. The instance of the IP core can be parameterized to configure the infrastructure harness circuit to control a plurality of functions selected from the expanded design for testability functions based on a user parameterization of the instance of the IP core.

A driver for transmitting multi-level signals on a multi-wire bus is described that includes at least one current source connected to a transmission line, each current source selectively enabled to source current to the transmission line to drive a line voltage above a termination voltage of a termination voltage source connected to the transmission line via a termination impedance element, wherein each of the at least one current sources has an output impedance different than a characteristic impedance of the transmission line, and at least one current sink connected to the transmission line, each current sink selectively enabled to sink current from the transmission line to drive a line voltage below the termination voltage, each of the at least one current sinks having an output impedance different than the characteristic impedance of the transmission line.