Patent classifications
H03M1/00
Cell site architecture that supports 5G and legacy protocols
In modern networks, RRU and BBU equipment of an access point site typically handles traffic from a single sector. An RRU-BBU pair process that traffic (often limited to a single spectrum from a single sector) according to implemented capabilities and other equipment located further upstream perform functions that rely on information from multiple sectors. An integrated device (e.g., white box) can integrate the functionality of multiple RRU (or NR in 5G) and the functionality of multiple BBU (or DU/CU splits in 5G), which can reduce implementation footprint, costs, and can provide related services more efficiently without going upstream.
Non-uniform sampling photonic analog-to-digital converter
A non-uniform sampling pADC is disclosed. The pADC may include an optical pulse source configured to generate uniform optic pulses. The pADC may include a non-uniform sampling system. The non-uniform sampling system may include an inter-pulse timing modulation sub-system configured to convert the uniform optic pulses into non-uniform optic pulses. The non-uniform sampling system may include a timing control sub-system configured to control the timing of the optical pulse source. The pADC may include an optical modulator configured to modulate the non-uniform optical pulses. The pADC may include a photodetector configured to convert the modulated non-uniform optic pulses into electronic pulses. The pADC may include a pulse capture assembly configured to capture a pulse amplitude of the electronic pulses and generate sampled radio frequency output pulses. The pADC may include a quantizer configured to quantize the sampled radio frequency output pulses and generate digital radio frequency output signals.
ADC circuitry
This application relates to ADC circuitry. An ADC circuit (200) has first and second conversion paths (201a, 201b) for converting analogue signals to digital and is operable in first and second modes. In the first mode, the first and second conversion paths are connected to respective first and second input nodes (202a, 202b) to receive and convert full scale first and second analogue input signals (Ain1, Ain2) to separate digital outputs (Dout1, Dout2). In the second mode, the first and second conversion paths are both connected to the first input node (202a), to convert the first analogue input signal (Ain1) to respective first and second digital signals, and the first and second conversion paths are configured for processing different signal levels of the first analogue input signal. A selector (207) select the first digital signal or the second digital to be output as an output signal based on an indication of amplitude of the first analogue input signal.
Solid-state imaging element and imaging device
To shorten time required for AD conversion when a solid-state imaging element that detects presence or absence of an address event further captures image data. In a detection block, a first pixel that generates a first analog signal by photoelectric conversion and a second pixel that generates a second analog signal by photoelectric conversion are arrayed. A first analog-digital converter converts the first analog signal into a digital signal on the basis of whether or not a change amount of an incident light amount of the detection block exceeds a predetermined threshold. A second analog-digital converter converts the second analog signal into a digital signal on the basis of whether or not the change amount exceeds the threshold.
Multistage analog-to-digital converters for crossbar-based circuits
In accordance with some embodiments of the present disclosure, an apparatus including a crossbar circuit is provided. The crossbar circuit may include a plurality of cross-point devices with programmable conductance, a transimpedance amplifier (TIA), and an analog-to-digital converter (ADC). The TIA is configured to produce an output voltage based on an input current corresponding to a summation of current from a first plurality of the cross-point devices. The ADC is configured to generate a digital output corresponding to a digital representation of the output voltage of the TIA. To generate the digital output, the ADC is to generate, using a comparator, a first plurality of bits (e.g., MSBs) of the digital output by performing a coarse conversion process and a second plurality of bits (e.g., LSBs) of the digital output by performing a fine conversion process on a sample-and-hold voltage produced in the coarse conversion process.
ELECTRONIC DEVICE AND METHOD OF OPERATING THE SAME
An electronic device includes analog-to-digital converters each configured to receive an analog input signal and output a digital output signal corresponding to the analog input signal, an analog input signal generator configured to generate analog input signals provided to each analog-to-digital converter based on input voltages and weight data, an input signal distribution information generator configured to generate input signal distribution information indicating a distribution of the analog input signals for each of the analog-to-digital converters, an analog-to-digital converter group classifier configured to classify the analog-to-digital converters into a plurality of first analog-to-digital converter groups based on the input signal distribution information, and an analog-to-digital converter input range optimizer configured to determine an input range of each first analog-to-digital converter group based on the input signal distribution information, and each analog-to-digital converter is configured to operate according to an input range of a corresponding first analog-to-digital converter groups.
Optical DSP operating at half-baud rate with full data rate converters
An optical Digital Signal Processor (DSP) circuit includes a digital core configured to implement digital signal processing functionality and configured to operate at a plurality of baud rates including a full baud rate and a half-baud rate; and an analog interface including a Digital-to-Analog Converter (DAC) section and an Analog-to-Digital Converter (ADC) section, wherein the analog interface is connected to the digital core and is configured to operate at the full baud rate when the digital core is configured to operate at any of the plurality of baud rates.
Analog front-end circuit capable of use in a sensor system
During a sampling phase, an analog front end circuit connects input of a first sampling capacitor to an analog input signal and input of a second sampling capacitor to a reference signal, and connects first and second hold capacitors to ground. During a partial tracking phase, input of the first sampling capacitor is connected to the reference voltage and the input of the second sampling capacitor is connected to the analog input signal. The first hold capacitor is connected to a first output of a gain amplifier and the second hold capacitor to a second output of the gain amplifier. Output of the first sampling capacitor is coupled to a first input of an amplifier and output of the second sampling capacitor is coupled to a second input of the amplifier.
In-memory analog neural cache
Embodiments are directed to systems and methods of implementing an analog neural network using a pipelined SRAM architecture (“PISA”) circuitry disposed in on-chip processor memory circuitry. The on-chip processor memory circuitry may include processor last level cache (LLC) circuitry. One or more physical parameters, such as a stored charge or voltage, may be used to permit the generation of an in-memory analog output using a SRAM array. The generation of an in-memory analog output using only word-line and bit-line capabilities beneficially increases the computational density of the PISA circuit without increasing power requirements. Thus, the systems and methods described herein beneficially leverage the existing capabilities of on-chip SRAM processor memory circuitry to perform a relatively large number of analog vector/tensor calculations associated with execution of a neural network, such as a recurrent neural network, without burdening the processor circuitry and without significant impact to the processor power requirements.
Apparatus and method for conversion between analog and digital domains with a time stamp
An apparatus and method are disclosed with some embodiments including an analog and time to digital converter (ATDC) including a receiver, the receiver for receiving an analog channel input for conversion to a digital data, the digital data having at least one bit, and a defined absolute reference time stamp, the defined absolute reference time stamp representing an absolute reference time associated with conversion of the analog channel input to the digital data and an analog-to-digital converter, the converter converting the analog channel input to the digital data.