Patent classifications
H03M1/00
Gain programmability techniques for delta-sigma analog-to-digital converter
An excess loop delay compensation (ELDC) technique for use with a successive approximation register (SAR) based quantizer in a continuous time delta-sigma ADC is described. The techniques can efficiently program and calibrate the ELD gain in ELD compensation SAR quantizers. An ELDC circuit can include a charge pump having a digitally programmable capacitance to adjust a gain, such as the gain of the ELDC digital-to-analog converter (DAC) or the gain of the SAR DAC.
Gated asynchronous multipoint network interface monitoring system
Systems, methods, and devices for monitoring operation of industrial equipment are disclosed. In one embodiment, a monitoring system is provided that includes a passive backplane and one more functional circuits that can couple to the backplane. Each of the functional circuits that are coupled to the backplane can have access to all data that is delivered to the backplane. Therefore, resources (e.g., computing power, or other functionality) from each functional circuits can be shared by all active functional circuits that are coupled to the backplane. Because resources from each of the functional circuits can be shared, and because the functional circuits can be detachably coupled to the backplane, performance of the monitoring systems can be tailored to specific applications. For example, processing power can be increased by coupling additional processing circuits to the backplane.
Method of reducing conduction loss and switching loss applied in driving circuit and driving circuit using the same
A method, which is applied in a driving circuit including an analog-to-digital convertor (ADC) and a switching circuit including an inductor and coupled to a load, includes steps of: performing an analog-to-digital conversion on a load voltage of the load at a first rate; and producing at least a current pulse flowing through the inductor at a second rate. Wherein, each current pulse among the at least a current pulse is accomplished within a second cycle corresponding to the second rate, all of the at least a current pulse are accomplished within a first cycle corresponding to the first rate, and a first length of the first cycle is longer than twice of a second length of the second cycle.
Single-ended linear current operative analog to digital converter (ADC) with thermometer decoder
A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.
Reference buffer
A reference voltage generator comprises a comparator, a digital-to-analog converter (DAC) and a switched capacitor accumulator. The comparator receives a reference voltage input, a feedback input, and a control signal. The DAC is coupled to an output of the comparator, and the switched capacitor accumulator is coupled to an output of the DAC. In some implementations, a digital filter is coupled between the output of the comparator and the input of the DAC. The switched capacitor accumulator can be coupled to a buffer that outputs the feedback input and a reference voltage for an analog-to-digital converter (ADC). In some implementations, the feedback loop includes N one-bit DACs coupled to the output of the comparator and N switched capacitor accumulators, each of which is coupled to a unique one-bit DAC.
TIME-TO-DIGITAL CONVERTER AND DIGITAL PHASE LOCKED LOOP
A time-to-digital converter including N stages of converting circuits, where N≧2, and N is an integer. Each stage of converting circuit includes a first delayer and an arbiter; an output end of the first delayer in each stage of converting circuit outputs a delayed signal of the stage of converting circuit; and the arbiter in each stage of converting circuit receives a sampling clock and the delayed signal of the stage of converting circuit, and compares the sampling clock with the delayed signal to obtain an output signal of the stage of converting circuit. Output signals of the N stages of converting circuits form a non-linear binary number, to indicate a time difference between a clock signal and a reference signal.
Adaptive On-Time Switching Converter
Adaptive-on-time techniques to improve the frequency variations inherent in constant-on-time COT converters are presented. A switching converter contains a power switch; a pulse generator adapted to generate a pulsed signal to switch the power switch on with a switching frequency; a ramp generator adapted to generate a ramp signal; and a controller adapted to detect a parameter of the ramp signal, compare the parameter with a reference value, and to generate a control signal based on the comparison to control the switching frequency. This allows controlling a switching frequency of the converter without increasing a noise level of the converter.
Successive approximation register analog-to-digital converter
A successive approximation register (SAR) analog-to-digital converter (ADC) includes a plurality of differential capacitive digital-to-analog converters (C-DACs), comparators, and an SAR controller. Each differential C-DAC comprises a pair of C-DACs for positive and negative polarities and each C-DAC comprises a capacitor array. A capacitor for each bit position may include a pair of equal-sized capacitors. Each outer comparator is coupled to one of the differential C-DACs and the middle comparator is coupled to a differential output node pair of C-DACs from two differential C-DACs. The SAR controller generates a control signal for the differential C-DACs for each conversion step based on outputs of the comparators. The outputs of the comparators are provided to the differential C-DACs as the control signal without encoding. Single-bit/cycle shorting switches for shorting top plates of capacitors of the C-DACs of same polarity may be closed during a single-bit/cycle conversion.
Error-feedback digital-to-analog converter (DAC)
In one embodiment, a method for converting an input digital signal into an analog signal is provided. The method comprises modulating the input digital signal into a modulated digital signal, and converting the modulated digital signal into the analog signal using a digital-to-analog converter (DAC). The modulation shapes quantization noise of the DAC to place a notch at a frequency within an out-of-bound frequency band to reduce the quantization noise within the out-of-bound frequency band.
Testing a capacitor array by delta charge
In some examples, a method includes controlling a first set of switches to deliver a first voltage signal through a first set of capacitors to a common node. The method also includes controlling a second set of switches to deliver a second voltage signal through a second set of capacitors to the common node, wherein the first set of capacitors is electrically connected to the second set of capacitors by the common node. The method further includes measuring a time duration to discharge the common node. The second voltage signal includes an opposing polarity to the first voltage signal.