A built-in-self-test (BIST) circuit is connected to a processor and a sigma-delta modulator (SDM) and includes an averaging circuit, a reference signal generator, and a comparator. The averaging circuit calculates an average of a sum of a set of bit signals of the SDM output signal over a period of time period, and generates an average SDM signal. The reference signal generator generates a reference SDM signal based on an SDM input signal. The comparator compares the voltage levels of the average SDM and reference SDM signals with a threshold value, and generates a test output signal based on the comparison.

A discrete-time (e.g., digital) filter can be used as an interpolation filter for processing an oversampled input signal, such as included as a portion of a sigma-delta digital-to-analog conversion circuit. An interpolation filter control circuit can be configured to adjust a filter order of the discrete-time interpolation filter at least in part in response to information indicative of an envelope signal magnitude. For example, higher-level input signals might be processed using an interpolation filter having a stop-band attenuation that is more stringently-specified (e.g., having greater attenuation) than a corresponding attenuation used for lower-level input signals. The filter order can be variable, such as varied in response to a detected envelope magnitude of the input signal to achieve power savings as compared to a filter having fixed parameters.

The present application discloses a data converter (112). The data converter includes an input terminus (98), a digital-to-analog (D/A) converter (116) and a mapping unit (114). The input terminus is configured to receive an input signal. The D/A converter includes a plurality of D/A converter units configured to generate an output signal. The mapping unit is coupled between the input terminus and the D/A converter and is configured to cause the plurality of D/A conversion units to be equivalently arranged in a relative order in which the plurality of D/A conversion units are gated according to specific electrical characteristics of the plurality of D/A conversion units for digital-to-analog conversion. The present application further provides an A/D converter, a D/A converter and a related chip.

Instability of an internal state in a current-input-type delta-sigma modulator is reduced in a case where input changes sharply. A signal current is input to a first integration node. A difference current between a fixed current and the signal current is input to a second integration node. A voltage-to-current converter that converts a difference voltage between the voltage of the first integration node and a first reference voltage into a current and outputs it is connected between the first integration node and the second integration node. The voltage of the second integration node is compared with a second reference voltage, and a 1-bit digital signal is output. Current is draws from the first integration node or the second integration node according to the 1-bit digital signal. A short-circuit switch is provided between the first integration node and the second integration node for short-circuiting them.

Superconductor analog-to-digital converters (ADC) offer high sensitivity and large dynamic range. One approach to increasing the dynamic range further is with a subranging architecture, whereby the output of a coarse ADC is converted back to analog and subtracted from the input signal, and the residue signal fed to a fine ADC for generation of additional significant bits. This also requires a high-gain broadband linear amplifier, which is not generally available within superconductor technology. In a preferred embodiment, a distributed digital fluxon amplifier is presented, which also integrates the functions of integration, filtering, and flux subtraction. A subranging ADC design provides two ADCs connected with the fluxon amplifier and subtractor circuitry that would provide a dynamic range extension by about 30-35 dB.

A system for generating an RFPWM signal comprises a delta sigma modulator having a plurality of outputs, a phase-locked loop comprising a plurality of phase quantization outputs, at least one multiplexer having a plurality of signal inputs, a plurality of selector inputs, and at least one output, the signal inputs communicatively connected to the phase quantization outputs of the phase-locked loop and the selector inputs electrically connected to the outputs of the delta sigma modulator, and a driver having an input communicatively connected to the output of the multiplexer and an output generating an RFPWM signal. A method of generating an RFPWM signal is also described.

An electrical circuit includes a signal processing chain and a controller. The signal processing chain includes an integrator configured to integrate an input signal over an integration time. The controller is connected to a signal output of the signal processing chain to receive and evaluate an output signal of the signal processing chain. The controller is further configured to adapt the integration time based on the output signal.

An optical network includes a transmitting portion configured to (i) encode an input digitized sequence of data samples into a quantized sequence of data samples having a first number of digits per sample, (ii) map the quantized sequence of data samples into a compressed sequence of data samples having a second number of digits per sample, the second number being lower than the first number, and (iii) modulate the compressed sequence of data samples and transmit the modulated sequence over a digital optical link. The optical network further includes a receiving portion configured to (i) receive and demodulate the modulated sequence from the digital optical link, (ii) map the demodulated sequence from the second number of digits per sample into a decompressed sequence having the first number of digits per sample, and (iii) decode the decompressed sequence.

In some embodiments, a method of operating a sigma-delta analog-to-digital converter (ADC) includes converting an analog input signal into a sequence of digital data using a sigma-delta modulator of the sigma-delta ADC, setting a first configuration for a decimation filter of the sigma-delta ADC according to a first condition of a measurement window, filtering the sequence of digital data using a low-pass filter (LPF) of the decimation filter, and in response to a change in the measurement window, setting a second configuration for the decimation filter according to a second condition of the measurement window.

A capacitance to digital converter, CDC, has a first and a second reference terminal for receiving first and second reference voltages, a reference block comprising one or more reference charge stores and being coupled to the first and second reference terminals via a first switching block, a scaling block for providing at third and fourth reference terminals downscaled voltages from the first and second reference voltages depending on a scaling factor, first and second measurement terminals for connecting a capacitive sensor element, the first measurement terminal being coupled to the third and fourth reference terminals via a second switching block, and a processing block coupled to the reference block and to the second measurement terminal and being configured to determine a digital output signal based on a charge distribution between the sensor element and the reference block and based on the scaling factor, the output signal representing a capacitance value of the sensor element.