According to an example, an electronic device includes a component, a supply line providing a supply voltage, a transistor with a control input, a linear first control loop, and a non-linear second control loop. The transistor outputs an output voltage to the component depending on a signal applied to the control input. The linear first control loop includes an ADC to convert an analog output voltage level into a digital measurement signal, a controller to generate a digital control signal for the transistor depending on the digital measurement signal, and a DAC to convert the digital control signal into a first analog control signal. The non-linear second control loop is configured to generate a second analog control signal depending on the analog output voltage level. The second analog control signal is superimposed with the first analog control signal and the combined control signals are fed to the control input of the transistor.

A sensor circuit comprising a sensor input includes a delta-sigma analogue to digital converter. The delta-sigma analogue to digital converter includes a switched capacitor, a common mode voltage source, a reference voltage source, and a switch network. The switch network, in a first clock phase, connects the switched capacitor to charge it to either a sum or difference voltage, and in a second clock phase connects the switched capacitor to transfer charge into a summing junction. A controller controls the switch network responsive to a comparator output to selectively connect the switched capacitor to one of the common mode voltage and the reference voltage in the first clock phase. Implementations of the sensor circuit transfer charge every clock cycle and have low noise and high sensitivity.

A circuit includes an operational amplifier and a resistor network coupled to an output of the operational amplifier. The resistor network includes a first set of resistors coupled between the output of the operational amplifier and a first node of the resistor network, wherein the resistors of the first set are electrically connected in series with each other, a second set of resistors coupled between the first node and a second node of the resistor network, wherein the resistors of the second set are electrically connected in series with each other and include a first number of resistors, a third set of resistors coupled between the second node and a third node of the resistor network, wherein the third node is coupled to a first voltage, and wherein the resistors of the third set are electrically connected in parallel with each other and include a second number of resistors, and a resistor coupled between the first node and the second node and arranged in parallel with the second set of resistors.

A digital conversion system including a sigma-delta converter, a tone generator that generates injects a tone signal into the conversion path of the sigma-delta converter at a frequency that is outside operating signal frequency range, a tone detector that isolates and detects a level of the injected tone signal and provides a corresponding tone level value, a tone ratio comparator that converts the tone level value into a tone level ratio and that compares the converted tone level ratio with an expected tone level ratio to provide an error signal, and a loop controller that converts the error signal to a correction signal to adjust a loop filter frequency the sigma-delta converter. Tones may be serially injected one at a time or simultaneously in parallel for determining a measured tone level ratio for comparison with a corresponding one of multiple stored expected tone level ratios.

An analog circuit including a voltage regulator, at least one analog-to-digital convertor (ADC), at least one comparator and a multiplexer is provided. The voltage regulator generates an output voltage. The at least one ADC generates at least one digital signal. The multiplexer is configured to conduct the at least one comparator to either the voltage regulator or the at least one ADC. When the voltage regulator is triggered, the multiplexer conducts the at least one comparator to the voltage regulator, and the voltage regulator generates the output voltage according to an output of the at least one comparator. When the at least one ADC is triggered, the multiplexer conducts the at least one comparator to the at least one ADC, and the at least one ADC generates the at least one digital signal according to the output of the at least one comparator.

A method adapts a resonant frequency of a first filter of a closed control loop to a given frequency. The method includes feeding an output signal of a delta sigma modulator of the closed control loop into a frequency adaptation circuit and determining a first noise spectrum of the output signal in a first frequency band and a second noise spectrum of the output signal in a second frequency band. The first frequency band and the second frequency band are arranged symmetrically with respect to the given frequency. The method includes comparing the first noise spectrum with the second noise spectrum, generating an adaptation signal that causes a frequency adaptation of the resonant frequency if the first noise spectrum differs from the second noise spectrum, and outputting the adaptation signal from the frequency adaptation circuit to a control input of the first filter for adapting the resonant frequency.

A device includes a sensor configured to output an analog sensor signal, an analog-to-digital converter circuit configured to convert the analog sensor signal into a sigma-delta-modulated digital signal having a bit width of n bits, and a pulse width modulator configured to generate a pulse-width-modulated signal based on the sigma-delta-modulated digital signal.

An analog to digital converter (ADC) that is configured to service a photo-diode includes a capacitor and a self-referenced latched comparator. The capacitor produces a photo-diode voltage based on charging by a photo-diode current associated with the photo-diode and a digital to analog converter (DAC) source current and/or a DAC sink current. The self-referenced latched comparator generates a first digital signal that is based on a difference between the photo-diode voltage and a threshold voltage associated with the self-referenced latched comparator. Also, one or more processing modules executes operational instructions to process the first digital signal to generate a second digital signal and/or a third digital signal. An N-bit DAC generates the DAC source current based on the second digital signal, and an M-bit DAC generates the DAC sink current based on the third digital signal. The DAC source current and/or the DAC sink current tracks the photo-diode current.

A sigma-delta ADC comprising: a first-input-terminal configured to receive a first-high-voltage-analogue-input-signal; a second-input-terminal configured to receive a second-high-voltage-analogue-input-signal; an output-terminal configured to provide an output-digital-signal, wherein the output-digital-signal is representative of the difference between the first-high-voltage-analogue-input-signal and the second-high-voltage-analogue-input-signal. The sigma-delta ADC also includes a feedback-current-block, which comprises: a first-feedback-transistor having a conduction channel; a second-feedback-transistor having a conduction channel; a first-feedback-switch; a second-feedback-switch; a first-feedback-current-source; and a second-feedback-current-source.

An integrated circuit can include an amplifier coupled to receive an analog input signal, an anti-aliasing filter (AAF) coupled to an output of the amplifier, a buffer circuit coupled to an output of the AAF, a sigma-delta modulator configured to generate a digital data stream in response to an output of the buffer, and a plurality of chopping circuits nested within one another, including a first pair of chopping circuits having at least the amplifier disposed therebetween and configured to remove offset in the analog input signal, and a second pair of chopping circuit having at least the first pair of chopping circuits disposed therebetween. The amplifier, AAF, sigma-delta modulator, and chopping circuits can be formed with the same integrated circuit substrate. Corresponding methods and systems are also disclosed.