The present disclosure relates to a method of removing, by an imaging processing device, remanence artifacts from an image (f.sub.n) of a sequence of images captured by an infrared imaging device, the method comprising: generating a remanence measure for at least some pixels in the image (f.sub.n) based on a difference between the pixels values of the image (f.sub.n) and the pixel values a previous image (f.sub.n1) of the sequence; and removing remanence artifacts from at least some pixels of the image (f.sub.n) based on a remanence estimation for each of the at least some pixels, each remanence estimation being generated based on the remanence measure and on one or more previous remanence estimations of the at least some pixels and on a model of the exponential decay of the remanence.

Video information may define spherical video content having a duration. Spherical video content may define visual content viewable from a point of view as a function of progress through the spherical video content. Path information may define a path selection for the spherical video content. Path selection may include movement of a viewing window within the spherical video content. The viewing window may define extents of the visual content viewable from the point of view as the function of progress through the spherical video content. Time lapse parameter information may define at least two of a time portion of the duration, an image sampling rate, and a time lapse speed effect. A time lapse video may be generated based on the video information, the path information, and the time lapse parameter information.

Systems, apparatuses, and methods are presented for taking a combination of images taken synchronous in time with one another. According to one example, the present disclosure proposes one or more sensor arrays, each of which comprises multiple pixel sensors arranged to capture image data responsive to light exposure. Light is incident on the respective sensor arrays during substantially synchronous exposures. The one or more sensor arrays are configured such that the image data captured by the respective sensor arrays during the synchronous exposure differ in at least one of a luminance output or a color profile from one another.

Systems and methods for reconstructing an object boundary in a disparity map generated by a structured light system are disclosed. One aspect is a structured light system. The system includes an image projecting device configured to project codewords. The system further includes a receiver device including a sensor, the receiver device configured to sense the projected codewords reflected from an object. The system further includes a processing circuit configured to generate a disparity map of the object, detect a first boundary of the object in the disparity map, identify a shadow region in the disparity map adjoining the first boundary, the shadow region including pixels with codeword outages, and change a shape of the object in the disparity map based on the detected shadow region. The system further includes a memory device configured to store the disparity map.

Systems and methods for reconstructing an object boundary in a disparity map generated by a structured light system are disclosed. One aspect is a structured light system. The system includes an image projecting device configured to project codewords. The system further includes a receiver device including a sensor, the receiver device configured to sense the projected codewords reflected from an object. The system further includes a processing circuit configured to generate a disparity map of the object, detect a first boundary of the object in the disparity map, identify a shadow region in the disparity map adjoining the first boundary, the shadow region including pixels with codeword outages, and change a shape of the object in the disparity map based on the detected shadow region. The system further includes a memory device configured to store the disparity map.

The present disclosure provides a high resolution structured light system that is also capable of maintaining high throughput. The high resolution structured light system includes one or more image capture devices, such as a camera and/or an image sensor, a projector, and a blurring element. The projector is configured to project a binary pattern so that the projector can operate at high throughput. The binary projection pattern is subsequently filtered by the blurring element to remove high frequency components of the binary projection pattern. This filtering smoothes out sharp edges of the binary projection pattern, thereby creating a blurred projection pattern that changes gradually from the low value to the high value. This gradual change can be used by the structured light system to resolve spatial changes in the 3D profile that could not otherwise be resolved using a binary pattern.

The present disclosure provides a high resolution structured light system that is also capable of maintaining high throughput. The high resolution structured light system includes one or more image capture devices, such as a camera and/or an image sensor, a projector, and a blurring element. The projector is configured to project a binary pattern so that the projector can operate at high throughput. The binary projection pattern is subsequently filtered by the blurring element to remove high frequency components of the binary projection pattern. This filtering smoothes out sharp edges of the binary projection pattern, thereby creating a blurred projection pattern that changes gradually from the low value to the high value. This gradual change can be used by the structured light system to resolve spatial changes in the 3D profile that could not otherwise be resolved using a binary pattern.

An imaging device includes a first substrate with a pixel array having a plurality of first pixels; a second substrate stacked with the first substrate on a side opposite to a light-receiving surface of the pixel array; a filter for narrowing a band of light of a first wavelength; and a plurality of second pixels included in the second substrate for receiving light whose band is narrowed by the filter, wherein the filter configured by a first Fabry-Perot filter or a second Fabry-Perot filter, the first Fabry-Perot filter and the second Fabry-Perot filter have different transmission wavelength bands, a peak wavelength of the transmission wavelength band of the first Fabry-Perot filter is narrow band light in the vicinity of 600 nm, and a peak wavelength of the transmission wavelength band of the second Fabry-Perot filter is narrow band light in the vicinity of 630 nm.

A display device includes: a video display that displays a video for projecting a virtual image onto a target space on a video display surface; an optical element; and a projector. The optical element moves a partial video, which is a part of the video displayed on the video display surface, to a position distant from the video display in a projection direction in which the video is projected. The projector projects a virtual image viewed by a user by projecting light output from the video display and the optical element to a reflecting member. The optical element has an incident surface on which the partial video is incident, and an emitting surface from which the partial video incident on the incident surface emits. The incident surface and the emitting surface are parallel to each other.

An imaging cell includes a skimming gate transistor coupled between a photosensitive charge node and an intermediate node and a transfer gate transistor coupled between the intermediate node and a sense node. The skimming gate transistor includes a vertical gate electrode structure formed by a first capacitive deep trench isolation extending into a substrate and a second capacitive deep trench isolation extending into the substrate. A channel of the skimming gate transistor is positioned between the first and second capacitive deep trench isolations. Each capacitive deep trench isolation is formed by a trench that is lined with an insulating liner and filled with a conductive or semiconductive material.