H05H13/00

CHARGED PARTICLE SCANNERS

A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as portable electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The exemplary systems and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.

Cyclotron for extracting charged particles at various energies

A cyclotron for accelerating a beam of charged particles and extracting the beam. The cyclotron includes a vacuum chamber; a target support element sealed and coupled to the vacuum chamber and including a tubular channel leading to a target; first energy specific extraction kit including a first stripper assembly with a stripper located at a first stripping position for stripping charged particles at a first energy and a second energy specific extraction kit for driving modified charged particles of second energy along a second extraction path towards a target holder, wherein the energy specific extraction kit includes: a second stripper assembly with a stripper located at a second stripping position for stripping charged particles at a second energy and an insert for modifying an orientation of the tubular channel to match the second extraction path such that the modified charged particles of second energy intercept the target holder.

Particle accelerator

A particle accelerator includes: a pair of magnetic poles disposed to face each other; a coil which surrounds each of the magnetic poles and generates a first magnetic flux density directing from the magnetic pole on one side to the magnetic pole on the other side; a foil stripper provided on a circling orbit of charged particles to strip off electrons from the charged particles; and a magnetic flux density adjustment unit which generates a second magnetic flux density directing in an opposite direction to a direction of the first magnetic flux density, in which the magnetic flux density adjustment unit makes an absolute value of magnetic flux density at a position of the foil stripper when viewed in a plan view smaller than an absolute value of the first magnetic flux density.

COMPACT ROTATIONAL GANTRY FOR PROTON RADIATION SYSTEMS
20200306562 · 2020-10-01 ·

Embodiments of the present invention provide a rotational gantry designed to provide proton radiation therapy using a mono-energetic proton beam. The mono-energetic proton beam is transported by a beam line transport system having two or more bending magnets and a plurality of quadrupole and steerer magnets for directing and focusing the proton beam. Energy variation of the beam is performed directly before the beam reaches an isocenter of the gantry.

ADJUSTABLE TRANSMISSION DEVICE FOR MEASURING TRANSVERSE PARAMETERS OF BEAMS

Disclosed is an adjustable transmission device for measuring transverse parameters of beams, including: a CCD transmission support assembly, an external transmission rod, the CCD transmission support assembly is connected with a support block, and the support block is provided with the slotted set screw with flat point, and is connected with a limit block via a first fastener; a snap ring is arranged in the rear of the external transmission and is matched with a base; the base is connected with the CCD fixed plate via a second fastener. The external transmission rod is provided with a second groove for mounting the first retaining ring, and a side of the first retaining ring is sequentially provided with a vacuum observation window, a second retaining ring, a head assembly, a retaining sleeve and a screwing mechanism.

Particle beam accelerator and particle beam therapy apparatus
10757799 · 2020-08-25 · ·

A magnet device that includes upper and lower disk-shaped return yokes, a pair of upper magnetic pole and lower magnetic pole respectively fixed to a disk-shaped surface of the upper return yoke and a disk-shaped surface of the lower return yoke, in which a space to circulate and accelerate an ion beam is formed between the upper magnetic pole and the lower magnetic pole. The upper magnetic pole and the lower magnetic pole have a plurality of concave and convex parts along a track along which the ion beam circulates, are plane-symmetrical with respect to a horizontal symmetry plane formed by the track along which an ion beam circulates, and are plane-symmetrical to one of the vertical planes vertical to the horizontal symmetry plane. Also, the magnetic pole intervals between the concave parts of the upper magnetic pole and the lower magnetic pole are different from each other.

Particle beam accelerator and particle beam therapy apparatus
10757799 · 2020-08-25 · ·

A magnet device that includes upper and lower disk-shaped return yokes, a pair of upper magnetic pole and lower magnetic pole respectively fixed to a disk-shaped surface of the upper return yoke and a disk-shaped surface of the lower return yoke, in which a space to circulate and accelerate an ion beam is formed between the upper magnetic pole and the lower magnetic pole. The upper magnetic pole and the lower magnetic pole have a plurality of concave and convex parts along a track along which the ion beam circulates, are plane-symmetrical with respect to a horizontal symmetry plane formed by the track along which an ion beam circulates, and are plane-symmetrical to one of the vertical planes vertical to the horizontal symmetry plane. Also, the magnetic pole intervals between the concave parts of the upper magnetic pole and the lower magnetic pole are different from each other.

Cryogenic magnet structure with integral maintenance boot

A cryogenic magnet structure includes at least two superconducting coils that are substantially symmetric about a central axis and on opposite sides of a median plane. At least one cryostat contains the superconducting coils; and a magnetic yoke surrounds the superconducting coils and contains at least a portion of a chamber, wherein the median plane extends through the chamber. At least one integral maintenance boot assembly is in thermal contact with the superconducting coils and is configured to preserve a sealed vacuum in the cryostat; and a cryogenic refrigerator is in thermal contact with the maintenance boot assembly and is configured to cool the superconducting coils below their critical superconducting temperatures and is configured for removal from thermal contact with the integral maintenance boot assembly without breaking the sealed vacuum in the cryostat.

WAFER-BASED CHARGED PARTICLE ACCELERATOR, WAFER COMPONENTS, METHODS, AND APPLICATIONS

A wafer-based charged particle accelerator includes a charged particle source and at least one RF charged particle accelerator wafer sub-assembly and a power supply coupled to the at least one RF charged particle accelerator wafer sub-assembly. The wafer-based charged particle accelerator may further include a beam current-sensor. The wafer-based charged particle accelerator may further include at least a second RF charged particle accelerator wafer sub-assembly and at least one ESQ charged particle focusing wafer. Fabrication methods are disclosed for RF charged particle accelerator wafer sub-assemblies, ESQ charged particle focusing wafers, and the wafer-based charged particle accelerator.

WAFER-BASED CHARGED PARTICLE ACCELERATOR, WAFER COMPONENTS, METHODS, AND APPLICATIONS

A wafer-based charged particle accelerator includes a charged particle source and at least one RF charged particle accelerator wafer sub-assembly and a power supply coupled to the at least one RF charged particle accelerator wafer sub-assembly. The wafer-based charged particle accelerator may further include a beam current-sensor. The wafer-based charged particle accelerator may further include at least a second RF charged particle accelerator wafer sub-assembly and at least one ESQ charged particle focusing wafer. Fabrication methods are disclosed for RF charged particle accelerator wafer sub-assemblies, ESQ charged particle focusing wafers, and the wafer-based charged particle accelerator.