Disclosed is a method of forming a doughnut-shaped skyrmion, the method including heating a local area of a vertical magnetic thin film magnetized in a first direction, which is any one of an upward direction and a downward direction, applying a magnetic field having a second direction, which is opposite the first direction, and having intensity higher than coercive force of the vertical magnetic thin film to the vertical magnetic thin film to form a first area magnetized in the second direction, applying a magnetic field having the second direction to the vertical magnetic thin film to form a second area, which is an extension of the first area, and applying a magnetic field having the first direction to the vertical magnetic thin film to form a third area magnetized in the first direction in the second area.

The present disclosure relates to a graphene spin transistor for all-electrical operation at room temperature and a logic gate using the graphene Rashba spin transistor. A graphene spin transistor of the present disclosure provides a graphene spin FET (Field Effect Transistor) for all-electrical operation at room temperature without a magnetic field or a ferromagnetic electrode by utilizing the Rashba-Edelstein effect in the graphene or the spin Hall effect of a TMDC (Transition Metal Dichalcogenide) material in order to replace CMOS transistors and extend Moore's Law, and further provides a logic gate using the graphene Rashba spin transistor.

A MRAM memory cell comprises a SHE layer, a magnetic bit layer with perpendicular anisotropy and an Oersted layer. The magnetic bit layer has a switchable direction of magnetization in order to store data. Data is written to the MRAM memory cell using the Spin Hall Effect so that spin current generated in the SHE layer exerts a torque on the magnetic bit layer while the Oersted layer provides heat and an Oersted field to enable deterministic switching. Data is read form the MRAM memory cell using the Anomalous Hall Effect and sensing voltage at the Oersted layer.

A non-reciprocal quantum device that comprises a first terminal and a second terminal, a transmission structure connected between the first and second terminals and configured to transmit microscopic particles in at least a partially phase-coherent manner from the first terminal to the second terminal and possibly from the second terminal to the first terminal, wherein a time-reversal symmetry of the transmission of the particles is broken with respect to at least a portion of the transmission structure; wherein the time-reversal symmetry is broken in such a way that the transmission structure comprises a higher transmission probability for particles moving in a first direction from the first terminal to the second terminal than in a second direction from the second terminal to the first terminal.

A MRAM memory cell comprises a SHE layer, a magnetic bit layer with perpendicular anisotropy and an Oersted layer. The magnetic bit layer has a switchable direction of magnetization in order to store data. Data is written to the MRAM memory cell using the Spin Hall Effect so that spin current generated in the SHE layer exerts a torque on the magnetic bit layer while the Oersted layer provides heat and an Oersted field to enable deterministic switching. Data is read form the MRAM memory cell using the Anomalous Hall Effect and sensing voltage at the Oersted layer.

A magnetic sensor 1 includes: a thin film magnet 20 which is constituted by a hard magnetic material layer 103 and has magnetic anisotropy in an in-plane direction; and a sensitive part 30 including a sensitive element 31 sensing a magnetic field by a magnetic impedance effect, the sensitive element 31 being constituted by a soft magnetic material layer 105 laminated on the hard magnetic material layer 103, having a longitudinal direction and a short direction, and having uniaxial magnetic anisotropy in a direction intersecting the longitudinal direction, in which the longitudinal direction faces in the direction of a magnetic field generated by the thin film magnet 20. The thin film magnet 20 and the sensitive element 31 are provided to constitute a magnetic circuit with a facing member provided outside to face one of magnetic poles of the thin film magnet 20.

A magneto-impedance sensor which makes it possible to further improve the accuracy of external magnetic field measurement includes a magneto-impedance element, a detection circuit, a magneto-sensitive body wiring line and a conductive layer wiring line. The magneto-impedance element includes a magneto-sensitive body and a conductive layer adjacent to the magneto-sensitive body. The magneto-sensitive body and the conductive layer pass a current therethrough in the opposite directions. The magneto-sensitive body wiring line and the conductive layer wiring line are electrically connected to the magneto-sensitive body and the conductive layer, respectively. A detection coil and a detection circuit of the magneto-impedance element are electrically connected to each other through detecting conductive wires. At least parts of these lines are adjacent to each other and allow a current to pass therethrough in opposite directions.

A method for producing an MI element includes: an insulation step of forming an insulator layer on an outer periphery of an amorphous wire; an electroless plating step of forming an electroless plating layer on an outer peripheral surface of the insulator layer; an electrolytic plating step of forming an electrolytic plating layer on an outer peripheral surface of the electroless plating layer; a resist step of forming a resist layer on an outer peripheral surface of the electrolytic plating layer; an exposure step of exposing the resist layer with a laser to form a spiral groove strip on an outer peripheral surface of the resist layer; an etching step of performing etching using the resist layer as a masking material and removing the electroless plating layer and the electrolytic plating layer in the groove strip to form a coil with the remaining electroless plating layer and electrolytic plating layer.

A base element for switching a magnetization state of a nanomagnet includes a heavy-metal nanostrip having a surface. The heavy-metal nanostrip includes at least a first layer including a heavy metal and a second layer which includes a different heavy-metal. A ferromagnetic nanomagnet is disposed adjacent to the surface. The ferromagnetic nanomagnet includes a shape having a long axis and a short axis, the ferromagnetic nanomagnet having both a perpendicular-to-the-plane anisotropy H.sub.kz and an in-plane anisotropy H.sub.kx and the ferromagnetic nanomagnet having a first magnetization equilibrium state and a second magnetization equilibrium state. The first magnetization equilibrium state or the second magnetization equilibrium state is settable by a flow of electrical charge through the heavy-metal nanostrip. A direction of the flow of electrical charge through the heavy-metal nanostrip includes an angle with respect to the short axis of the nanomagnet.

A material layer stack for a pSTTM device includes a fixed magnetic layer, a tunnel barrier disposed above the fixed magnetic layer and a free layer disposed on the tunnel barrier. The free layer further includes a stack of bilayers where an uppermost bilayer is capped by a magnetic layer including iron and where each of the bilayers in the free layer includes a non-magnetic layer such as Tungsten, Molybdenum disposed on the magnetic layer. In an embodiment, the non-magnetic layers have a combined thickness that is less than 15% of a combined thickness of the magnetic layers in the stack of bilayers. A stack of bilayers including non-magnetic layers in the free layer can reduce the saturation magnetization of the material layer stack for the pSTTM device and subsequently increase the perpendicular magnetic anisotropy.