Patent classifications
C
C07
C07C
69/00
C07C69/62
C07C69/63
C07C69/635
C07C69/635
RESIST COMPOSITION AND PATTERNING PROCESS
A resist composition comprising a base polymer and a sulfonium salt capable of generating fluorinated aminobenzoic acid offers a satisfactory dissolution contrast and minimal LWR independent of whether it is of positive or negative tone.