Patent classifications
C
C07
C07C
309/00
C07C309/01
C07C309/02
C07C309/23
C07C309/23
RESIST COMPOSITION AND PATTERNING PROCESS
A resist composition comprising a base polymer and a sulfonium or iodonium salt of sulfonic acid containing a cyclic hydrocarbon-substituted amino group offers dimensional stability on PPD and a satisfactory resolution.