Patent classifications
C07C309/39
RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMATION METHOD
A radiation-sensitive resin composition includes: a resin including a structural unit represented by formula (1); at least one onium salt each including an organic acid anion moiety and an onium cation moiety; and a solvent. At least part of the organic acid anion moiety in the at least one onium salt includes an iodine-substituted aromatic ring structure. R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms, Y.sup.1 is a divalent linking group, and X.sup.1 is an acid-dissociable group, and n is 0 or 1. When n is 0, X.sup.1 is represented by formula (s1) or (s2).
##STR00001##
RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMATION METHOD
A radiation-sensitive resin composition includes: a resin including a structural unit represented by formula (1); at least one onium salt each including an organic acid anion moiety and an onium cation moiety; and a solvent. At least part of the organic acid anion moiety in the at least one onium salt includes an iodine-substituted aromatic ring structure. R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms, Y.sup.1 is a divalent linking group, and X.sup.1 is an acid-dissociable group, and n is 0 or 1. When n is 0, X.sup.1 is represented by formula (s1) or (s2).
##STR00001##
Titanium ligand-modified black phosphorus and preparation method and use thereof
The present invention provides a titanium ligand-modified black phosphorus and the preparation method and use thereof. The titanium ligand-modified black phosphorus is a complex of black phosphorus and a titanium ligand having a structure represented by formula (I): ##STR00001##
wherein in the formula (I), R.sub.1 comprises C.sub.1-C.sub.6 alkyl, or phenyl optionally further substituted with 0 to 5 groups each independently selected from halogen atom, C.sub.1-C.sub.6 alkyl, nitro, hydroxy, amino or C.sub.1-C.sub.3 alkoxy; the C.sub.1-C.sub.6 alkyl or C.sub.1-C.sub.3 alkoxy is optionally further substituted with 0 to 3 groups each independently selected from halogen atom, nitro, hydroxy, amino, methyl, ethyl or n-propyl. The titanium ligand-modified black phosphorus of the present invention is not likely oxidized without changing inherent properties of the black phosphorus, and the antioxidant capacity is greatly enhanced.
Titanium ligand-modified black phosphorus and preparation method and use thereof
The present invention provides a titanium ligand-modified black phosphorus and the preparation method and use thereof. The titanium ligand-modified black phosphorus is a complex of black phosphorus and a titanium ligand having a structure represented by formula (I): ##STR00001##
wherein in the formula (I), R.sub.1 comprises C.sub.1-C.sub.6 alkyl, or phenyl optionally further substituted with 0 to 5 groups each independently selected from halogen atom, C.sub.1-C.sub.6 alkyl, nitro, hydroxy, amino or C.sub.1-C.sub.3 alkoxy; the C.sub.1-C.sub.6 alkyl or C.sub.1-C.sub.3 alkoxy is optionally further substituted with 0 to 3 groups each independently selected from halogen atom, nitro, hydroxy, amino, methyl, ethyl or n-propyl. The titanium ligand-modified black phosphorus of the present invention is not likely oxidized without changing inherent properties of the black phosphorus, and the antioxidant capacity is greatly enhanced.
RESIST COMPOSITION AND RESIST PATTERNING PROCESS
The present invention provides a resist composition, including: (A) a sulfonium salt containing an anion and a cation, the cation including a partial structure shown by the following general formula (A1); and (B) a polymer compound containing a repeating unit shown by the following general formula (B1). The present invention provides a resist composition that causes few defects and is excellent in lithography performance, having regulated acid diffusion, in photolithography using a high energy beam as a light source, and a resist patterning process using this resist composition.
##STR00001##
RESIST COMPOSITION AND RESIST PATTERNING PROCESS
The present invention provides a resist composition, including: (A) a sulfonium salt containing an anion and a cation, the cation including a partial structure shown by the following general formula (A1); and (B) a polymer compound containing a repeating unit shown by the following general formula (B1). The present invention provides a resist composition that causes few defects and is excellent in lithography performance, having regulated acid diffusion, in photolithography using a high energy beam as a light source, and a resist patterning process using this resist composition.
##STR00001##
RESIST COMPOSITION AND PATTERNING PROCESS
A resist composition comprising a base polymer and a sulfonium or iodonium salt capable of generating fluorobenzenesulfonic acid bonded to iodized benzoic acid offers a high sensitivity and minimal LWR independent of whether it is of positive or negative tone.
RESIST COMPOSITION AND PATTERNING PROCESS
A resist composition comprising a base polymer and a sulfonium or iodonium salt capable of generating sulfonic acid bonded to iodized benzene ring offers a high sensitivity and minimal LWR independent of whether it is of positive or negative tone.
RESIST COMPOSITION AND PATTERNING PROCESS
A resist composition comprising a base polymer and a quencher in the form of an iodonium salt capable of generating fluorobenzoic acid bonded to iodized benzene offers a high sensitivity and minimal LWR independent of whether it is of positive or negative tone.
IMPROVED PROCESS FOR MAKING DIARYL SULFONES
A process for preparing diaryl sulfones, such as 4,4-dichlorodiphenylsulfone is disclosed. The process comprises contacting an aryl compound with sulfur trioxide to provide a benzene sulfonic acid. The benzene sulfonic acid is coupled to additional aryl compound in the presence of a catalyst. During the coupling step, the additional aryl compound is continuously added while water is removed.