A dielectric composition, a dielectric element, an electronic component and a laminated electronic component are disclosed. In an embodiment the dielectric composition includes particles having a perovskite crystal structure including at least Bi, Na, Sr and Ti, wherein the content of the at least one element selected from La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Yb, Ba, Ca, Mg or Zn is between 0.5 molar parts and 11.1 molar parts, taking the Ti content of the dielectric composition as 100 molar parts, wherein 0.172.83, where is the molar ratio of Bi with respect to Sr in the dielectric composition, and wherein at least some of the particles include a high-Bi phase having a Bi concentration of at least 1.2 times the mean Bi concentration of the dielectric composition as a whole.

A dielectric composition, a dielectric element, an electronic component and a laminated electronic component are disclosed. In an embodiment the dielectric composition includes particles having a perovskite crystal structure including at least Bi, Na, Sr and Ti, wherein the content of the at least one element selected from La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Yb, Ba, Ca, Mg or Zn is between 0.5 molar parts and 11.1 molar parts, taking the Ti content of the dielectric composition as 100 molar parts, wherein 0.172.83, where is the molar ratio of Bi with respect to Sr in the dielectric composition, and wherein at least some of the particles include a high-Bi phase having a Bi concentration of at least 1.2 times the mean Bi concentration of the dielectric composition as a whole.

The invention relates to a lead-free piezoceramic material based on bismuth sodium titanate (BST) having the following parent composition: x(Bi.sub.0.5Na.sub.0.5)TiO.sub.3-yBaTiO.sub.3-zSrTiO.sub.3 where x+y+z=1 and 0<x<1, 0<y<1, 0z0.07 or x(Bi.sub.0.5Na.sub.0.5)TiO.sub.3-yBaTiO.sub.3-zCaTiO.sub.3 where x+y+z=1 and 0<x<1, 0<y<1, 0<z0.05 or x(Bi.sub.0.5Na.sub.0.5)TiO.sub.3-y(Bi.sub.0.5K.sub.0.5)TiO.sub.3-zBaTiO.sub.3 where x+y+z=1 and 0<x<1, 0<y<1, 0z<1, characterized by addition of a phosphorus-containing material in a quantity that gives a phosphorus concentration of from 100 to 2000 ppm in the piezoceramic material.

The invention relates to a lead-free piezoceramic material based on bismuth sodium titanate (BST) having the following parent composition: x(Bi.sub.0.5Na.sub.0.5)TiO.sub.3-yBaTiO.sub.3-zSrTiO.sub.3 where x+y+z=1 and 0<x<1, 0<y<1, 0z0.07 or x(Bi.sub.0.5Na.sub.0.5)TiO.sub.3-yBaTiO.sub.3-zCaTiO.sub.3 where x+y+z=1 and 0<x<1, 0<y<1, 0<z0.05 or x(Bi.sub.0.5Na.sub.0.5)TiO.sub.3-y(Bi.sub.0.5K.sub.0.5)TiO.sub.3-zBaTiO.sub.3 where x+y+z=1 and 0<x<1, 0<y<1, 0z<1, characterized by addition of a phosphorus-containing material in a quantity that gives a phosphorus concentration of from 100 to 2000 ppm in the piezoceramic material.

A dielectric composition, a dielectric element, an electronic component and a laminated electronic component are disclosed. In an embodiment a dielectric composition includes particles comprising a perovskite crystal structure including at least Bi, Na, Sr and Ti and at least one element selected from the group consisting of La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Yb, Ba, Ca, Mg and Zn, wherein a content of the element is between 0.5 molar pails and 11.1 molar parts, defining a Ti content of the dielectric composition as 100 molar parts, wherein 0.172.83, where is a molar ratio of Bi with respect to Sr in the dielectric composition, wherein at least some of the particles include a low-Bi phase, and wherein a total surface area of the low-Bi phase within the particles is between 0.1% and 15% of the total surface area of the particles.

A dielectric composition, a dielectric element, an electronic component and a laminated electronic component are disclosed. In an embodiment a dielectric composition includes particles comprising a perovskite crystal structure including at least Bi, Na, Sr and Ti and at least one element selected from the group consisting of La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Yb, Ba, Ca, Mg and Zn, wherein a content of the element is between 0.5 molar pails and 11.1 molar parts, defining a Ti content of the dielectric composition as 100 molar parts, wherein 0.172.83, where is a molar ratio of Bi with respect to Sr in the dielectric composition, wherein at least some of the particles include a low-Bi phase, and wherein a total surface area of the low-Bi phase within the particles is between 0.1% and 15% of the total surface area of the particles.

A dielectric composition, a dielectric element, an electronic component and a laminated electronic component are disclosed. In an embodiment the dielectric composition includes particles having a perovskite crystal structure including at least Bi, Na, Sr and Ti, wherein at least some of the particles have a core-shell structure including a core portion and a shell portion, and wherein the content of Bi present in the core portion is no greater than 0.83 times the content of Bi present in the shell portion.

A dielectric composition, a dielectric element, an electronic component and a laminated electronic component are disclosed. In an embodiment the dielectric composition includes particles having a perovskite crystal structure including at least Bi, Na, Sr and Ti, wherein at least some of the particles have a core-shell structure including a core portion and a shell portion, and wherein the content of Bi present in the core portion is no greater than 0.83 times the content of Bi present in the shell portion.

The object of the present invention is to provide the dielectric composition having good specific permittivity, high DC breakdown voltage and AC breakdown voltage, small dielectric loss and heat generating property, and good temperature property even though lead is not substantially used. A dielectric composition of the first aspect includes a, Ca, Bi, Ti, and Sr, wherein the dielectric composition includes two phases having different Sr characteristic X ray intensities when a characteristic X ray intensity derived from Sr is measured by EPMA, and when Sr1 represents the characteristic X ray intensity derived from Sr of a first phase measured by EPMA and Sr2 represents the characteristic X ray intensity derived from Sr of a second phase measured by EPMA, a ratio (Sr2/Sr1) of Sr2 with respect to Sr1 satisfies 2 or larger. A dielectric composition of the second aspect includes Ba, Ca, Bi, Ti, and Sr, wherein the dielectric composition includes three phases having different Sr characteristic X ray intensities when a characteristic X ray intensity derived from Sr is measured by EPMA, and when Sr1 represents the characteristic X ray intensity derived from Sr of a first phase measured by EPMA, Sr2 represents the characteristic X ray intensity derived from Sr of a second phase measured by EPMA, and Sr3 represents the characteristic X ray intensity derived from Sr of a third phase measured by EPMA, an intensity ratio (Sr1/Sr3) of Sr1 with respect to Sr3 is 0.6 or less and an intensity ratio (Sr2/Sr3) of Sr2 with respect to Sr3 is 1.4 or more.

The object of the present invention is to provide the dielectric composition having good specific permittivity, high DC breakdown voltage and AC breakdown voltage, small dielectric loss and heat generating property, and good temperature property even though lead is not substantially used. A dielectric composition of the first aspect includes a, Ca, Bi, Ti, and Sr, wherein the dielectric composition includes two phases having different Sr characteristic X ray intensities when a characteristic X ray intensity derived from Sr is measured by EPMA, and when Sr1 represents the characteristic X ray intensity derived from Sr of a first phase measured by EPMA and Sr2 represents the characteristic X ray intensity derived from Sr of a second phase measured by EPMA, a ratio (Sr2/Sr1) of Sr2 with respect to Sr1 satisfies 2 or larger. A dielectric composition of the second aspect includes Ba, Ca, Bi, Ti, and Sr, wherein the dielectric composition includes three phases having different Sr characteristic X ray intensities when a characteristic X ray intensity derived from Sr is measured by EPMA, and when Sr1 represents the characteristic X ray intensity derived from Sr of a first phase measured by EPMA, Sr2 represents the characteristic X ray intensity derived from Sr of a second phase measured by EPMA, and Sr3 represents the characteristic X ray intensity derived from Sr of a third phase measured by EPMA, an intensity ratio (Sr1/Sr3) of Sr1 with respect to Sr3 is 0.6 or less and an intensity ratio (Sr2/Sr3) of Sr2 with respect to Sr3 is 1.4 or more.