Patent classifications
C07C309/06
Radiation-sensitive resin composition and resist pattern-forming method
A radiation-sensitive resin composition includes a polymer including a phenolic hydroxyl group, a compound represented by formula (1-1) or formula (1-2), and a compound represented by formula (2). In the formula (1-1), a sum of a, b, and c is no less than 1; at least one of R.sup.1, R.sup.2, and R.sup.3 represents a fluorine atom or the like; and R.sup.4 and R.sup.5 each independently represent a hydrogen atom, a fluorine atom, or the like. In the formula (1-2), in a case in which d is 1, R.sup.6 represents a fluorine atom or the like, and in a case in which d is no less than 2, at least one of the plurality of R.sup.6s represents a fluorine atom or the like; and R.sup.8 represents a single bond or a divalent organic group having 1 to 20 carbon atoms. ##STR00001##
NON-AQUEOUS ELECTROLYTE FOR BATTERY, PRECURSOR FOR LITHIUM SECONDARY BATTERY, METHOD FOR MANUFACTURING LITHIUM SECONDARY BATTERY, LITHIUM SECONDARY BATTERY, PHOSPHAZENE COMPOUND, AND ADDITIVE FOR BATTERY
A non-aqueous electrolyte solution for a battery contains a phosphazene compound (A) that contains at least one of a phosphazene compound represented by Formula (1) or a phosphazene compound represented by Formula (2). In Formulae (1) and (2), each of Y.sup.− and Z.sup.− independently represents an anion in which a proton is removed from an inorganic acid or an active hydrogen compound; each of twenty-four Rs independently represents a hydrocarbon group having from 1 to 10 carbon atoms; and, among the twenty-four Rs, two Rs bonded to the same nitrogen atom are optionally bonded to each other.
##STR00001##
Salt, acid generator, resist composition and method for producing resist pattern
Disclosed are a salt represented by formula (I), and an acid generator and a resist composition which include the same: ##STR00001## wherein R1 represents a fluorine atom or a fluorinated alkyl group; R2, R3 and R4 each represent a halogen atom, a fluorinated alkyl group or a hydrocarbon group; m2 and m3 represent an integer of 0 to 4; m4 represents an integer of 0 to 5; Q1 and Q2 each represent a fluorine atom or a perfluoroalkyl group; L1 represents a saturated hydrocarbon group, —CH2- included in the group may be replaced by —O— or —CO—, and a hydrogen atom included in the group may be substituted with a fluorine atom or a hydroxy group; Y1 represents a methyl group which may have a substituent or an alicyclic hydrocarbon group which may have a substituent.
Salt, acid generator, resist composition and method for producing resist pattern
Disclosed are a salt represented by formula (I), and an acid generator and a resist composition which include the same: ##STR00001## wherein R1 represents a fluorine atom or a fluorinated alkyl group; R2, R3 and R4 each represent a halogen atom, a fluorinated alkyl group or a hydrocarbon group; m2 and m3 represent an integer of 0 to 4; m4 represents an integer of 0 to 5; Q1 and Q2 each represent a fluorine atom or a perfluoroalkyl group; L1 represents a saturated hydrocarbon group, —CH2- included in the group may be replaced by —O— or —CO—, and a hydrogen atom included in the group may be substituted with a fluorine atom or a hydroxy group; Y1 represents a methyl group which may have a substituent or an alicyclic hydrocarbon group which may have a substituent.
RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
A resist composition containing a resin component having a structural unit represented by general formula (a0-1), and a compound represented by general formula (b1). In general formula (a0-1), R is a hydrogen atom, an alkyl group, or a halogenated alkyl group. Va.sup.1 is a divalent hydrocarbon group. n.sub.a1 represents an integer of 0 to 2. Ra′.sup.12 and Ra′.sup.13 are a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms or a hydrogen atom. Ra′.sup.14 is a phenyl group, a naphthyl group, or an anthryl group. In general formula (b1), R.sup.b1 represents a cyclic hydrocarbon group. Y.sup.b1 represents a divalent linking group containing an ester bond. V.sup.b1 represents an alkylene group, a fluorinated alkylene group, or a single bond. m is an integer of 1 or more, and M.sup.m+ is an m-valent organic cation.
##STR00001##
RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
A resist composition containing a resin component having a structural unit represented by general formula (a0-1), and a compound represented by general formula (b1). In general formula (a0-1), R is a hydrogen atom, an alkyl group, or a halogenated alkyl group. Va.sup.1 is a divalent hydrocarbon group. n.sub.a1 represents an integer of 0 to 2. Ra′.sup.12 and Ra′.sup.13 are a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms or a hydrogen atom. Ra′.sup.14 is a phenyl group, a naphthyl group, or an anthryl group. In general formula (b1), R.sup.b1 represents a cyclic hydrocarbon group. Y.sup.b1 represents a divalent linking group containing an ester bond. V.sup.b1 represents an alkylene group, a fluorinated alkylene group, or a single bond. m is an integer of 1 or more, and M.sup.m+ is an m-valent organic cation.
##STR00001##
Hydrogen oxidation catalyst
The present invention is to provide a hydrogen oxidation catalyst that does not contain platinum. Disclosed is a hydrogen oxidation catalyst that is a dinuclear transition metal complex having a chemical structure represented by the following general formula (1) or (2): ##STR00001##
wherein, in the general formulae (1) and (2), M.sup.1 and M.sup.2 are each independently Fe or Ru; Ar.sup.1 and Ar.sup.2 are each independently a cyclopentadienyl group or a pentamethylcyclopentadienyl group; Ar.sup.3 and Ar.sup.4 are each independently a divalent aromatic hydrocarbon group having 6 to 12 carbon atoms; and Ar.sup.5 is a monovalent aromatic hydrocarbon group having 6 to 12 carbon atoms, and in the general formula (2), R.sup.1 and R.sup.2 are each independently a hydrogen atom or a monovalent aliphatic hydrocarbon group having 1 to 3 carbon atoms.
Hydrogen oxidation catalyst
The present invention is to provide a hydrogen oxidation catalyst that does not contain platinum. Disclosed is a hydrogen oxidation catalyst that is a dinuclear transition metal complex having a chemical structure represented by the following general formula (1) or (2): ##STR00001##
wherein, in the general formulae (1) and (2), M.sup.1 and M.sup.2 are each independently Fe or Ru; Ar.sup.1 and Ar.sup.2 are each independently a cyclopentadienyl group or a pentamethylcyclopentadienyl group; Ar.sup.3 and Ar.sup.4 are each independently a divalent aromatic hydrocarbon group having 6 to 12 carbon atoms; and Ar.sup.5 is a monovalent aromatic hydrocarbon group having 6 to 12 carbon atoms, and in the general formula (2), R.sup.1 and R.sup.2 are each independently a hydrogen atom or a monovalent aliphatic hydrocarbon group having 1 to 3 carbon atoms.
Compound, resist composition and method for producing resist pattern
The present invention can provide a salt capable of producing a resist pattern with satisfactory CD uniformity (CDU), and a resist composition. A resist composition comprising a resin including a structural unit having an acid-labile group, an acid generator and a compound represented by formula (I): ##STR00001##
wherein, in formula (I), R.sup.1 represents a hydrocarbon group having 1 to 36 carbon atoms which may have a substituent, X.sup.1 represents *—CO—O—, *—O—CO—, *—O—CO—O— or *—O—, and * represents a bonding site to R.sup.1, L.sup.1 represents a single bond or a hydrocarbon group having 1 to 36 carbon atoms which may have a substituent, and —CH.sub.2— included in the hydrocarbon group may be replaced by —O—, —S—, —CO— or —SO.sub.2—, R.sup.2 represents a saturated hydrocarbon group having 1 to 12 carbon atoms, u1 represents an integer of 0 to 2, s1 represents 1 or 2, t1 represents 0 or 1, in which s1+t1 is 1 or 2, n represents an integer of 2 or more, and a plurality of X.sup.1, L.sup.1, s1, t1, R.sup.2 and u1 each may be the same or different from each other.
COMPOUND, PRODUCTION METHOD THEREFOR, ACID GENERATOR, COMPOSITION, RESIST FILM, UNDERLAYER FILM, PATTERN FORMATION METHOD, AND OPTICAL COMPONENT
To provide a compound which is high in sensitivity and which provides high resolution and high flatness. A compound represented by the following formula (P-0):
##STR00001##
wherein Ar is a group having an aryl group having 6 to 60 carbon atoms, each OR.sup.TS is independently a hydroxy group or a group having a specified ion moiety, and n.sup.1 is an integer of 1 to 20, provided that at least one OR.sup.TS is a group having a specified ion moiety.