A digital micrometer includes a main-body frame, a spindle, a thimble part, and a displacement detector that detects displacement of the spindle. The main-body frame includes a U-shaped frame part, and a spindle holding part provided on the other end side of the U-shaped frame part and having a length in a direction away from an anvil. The spindle is held by a spindle holding part, provided to be movable forward and backward in an axial direction with respect to the anvil, and includes a contactor on one end face. The main-body frame and the spindle are formed of a non-magnetic material.

An inductive position encoder includes a scale, a detector and a signal processor. The scale includes a periodic pattern of signal modulating elements (SME) arranged along a measuring axis (MA) with a spatial wavelength W1. The detector comprises sensing elements and a field generating coil that generates a changing magnetic flux. The sensing elements comprise conductive loops that provide detector signals responsive to a local effect on the changing magnetic flux provided by adjacent SME's. Some or all of the conductive loops are configured according to an intra-loop shift relationship wherein equal “shifted proportions” of a loop are shifted in opposite directions by W1/4K. K is an odd integer. The intra-loop shift relationship can be used to suppress Kth spatial harmonic components in the detector signals, while also overcoming longstanding detrimental layout problems. It combines easily with “loop width” spatial filtering techniques that filter other spatial harmonic signal components.

A spindle drive comprising a threaded spindle with an external thread, a spindle nut with an internal thread that is in engagement with the external thread of the threaded spindle, characterized in that the external thread of the threaded spindle has multiple threaded areas that are separated from each other by first flattenings on their circumference extending in the longitudinal direction, and the first flattenings have guide areas that abut the core diameter of the internal thread of the spindle nut.

A spindle drive comprising a threaded spindle with an external thread, a spindle nut with an internal thread that is in engagement with the external thread of the threaded spindle, characterized in that the external thread of the threaded spindle has multiple threaded areas that are separated from each other by first flattenings on their circumference extending in the longitudinal direction, and the first flattenings have guide areas that abut the core diameter of the internal thread of the spindle nut.

A micrometer according to the present invention comprises: a frame of conductive material; an anvil of conductive material that is fixedly coupled to one end of the frame in an electrically insulated manner from the frame; a spindle of conductive material coupled to other end of the frame in such a way as to be moved back and forth along direction of the anvil in synchronization with rotation of a thimble while making electrical contact with the frame; and a controller configured to transmit a value for current gap between the anvil and the spindle to an external device as a measurement in case the anvil and the frame are electrically short-circuited. This configuration of the micrometer allows a measurement to be sent to the external device only in the case that a conductive object is necessarily mounted between the anvil and the spindle and electrically short-circuits them.

A micrometer according to the present invention comprises: a frame of conductive material; an anvil of conductive material that is fixedly coupled to one end of the frame in an electrically insulated manner from the frame; a spindle of conductive material coupled to other end of the frame in such a way as to be moved back and forth along direction of the anvil in synchronization with rotation of a thimble while making electrical contact with the frame; and a controller configured to transmit a value for current gap between the anvil and the spindle to an external device as a measurement in case the anvil and the frame are electrically short-circuited. This configuration of the micrometer allows a measurement to be sent to the external device only in the case that a conductive object is necessarily mounted between the anvil and the spindle and electrically short-circuits them.

A micrometer according to the present invention comprises: a frame of conductive material; an anvil of conductive material that is fixedly coupled to one end of the frame in an electrically insulated manner from the frame; a spindle of conductive material coupled to other end of the frame in such a way as to be moved back and forth along direction of the anvil in synchronization with rotation of a thimble while making electrical contact with the frame; and a controller configured to transmit a value for current gap between the anvil and the spindle to an external device as a measurement in case the anvil and the frame are electrically short-circuited. This configuration of the micrometer allows a measurement to be sent to the external device only in the case that a conductive object is necessarily mounted between the anvil and the spindle and electrically short-circuits them.

A micrometer according to the present invention comprises: a frame of conductive material; an anvil of conductive material that is fixedly coupled to one end of the frame in an electrically insulated manner from the frame; a spindle of conductive material coupled to other end of the frame in such a way as to be moved back and forth along direction of the anvil in synchronization with rotation of a thimble while making electrical contact with the frame; and a controller configured to transmit a value for current gap between the anvil and the spindle to an external device as a measurement in case the anvil and the frame are electrically short-circuited. This configuration of the micrometer allows a measurement to be sent to the external device only in the case that a conductive object is necessarily mounted between the anvil and the spindle and electrically short-circuits them.

A measuring instrument and a method of remote quantity value transfer/traceability are provided. The measuring instrument includes a central processing component, a local quantity value transfer/traceability component connected to the central processing component, a remote quantity value transfer/traceability component connected to the central processing component and a remote communication component connected to the central processing component; a metrological grade of the remote quantity value transfer/traceability component is greater than or equal to that of the local quantity value transfer/traceability component; the remote quantity value transfer/traceability component is configured to perform quantity value transfer/traceability to the local quantity value transfer/traceability component by using one of the in-machine metrological standard and the remote high-grade metrological standard provided from the remote quantity value transfer/traceability component. The method of remote quantity value transfer/traceability can be achieved to make the quantity value transfer/traceability of the measuring instrument very convenient, simple and less costly.

A measuring instrument and a method of remote quantity value transfer/traceability are provided. The measuring instrument includes a central processing component, a local quantity value transfer/traceability component connected to the central processing component, a remote quantity value transfer/traceability component connected to the central processing component and a remote communication component connected to the central processing component; a metrological grade of the remote quantity value transfer/traceability component is greater than or equal to that of the local quantity value transfer/traceability component; the remote quantity value transfer/traceability component is configured to perform quantity value transfer/traceability to the local quantity value transfer/traceability component by using one of the in-machine metrological standard and the remote high-grade metrological standard provided from the remote quantity value transfer/traceability component. The method of remote quantity value transfer/traceability can be achieved to make the quantity value transfer/traceability of the measuring instrument very convenient, simple and less costly.