Patent classifications
G01B3/18
Electric load labeling post itemization based on analysis of power measurements at a single point
A facility is connected to an electricity utility and includes a plurality of control computer controlled devices and a plurality of devices that is uncontrolled by control computers. An operational status of each of the control computer controlled devices is monitored by a server. The facility has a power meter that provides data representing actual power consumption to the server which is connected via a network to the control computer. The server is configured to determine power consumption of each device in the plurality of controlled devices from operational status data and power consumption data.
Digital comparator having a retractable anvil supported at one end of a U-shaped frame
Provided is a comparator including: a substantially U-shaped frame; an anvil supported at one end of the frame in an advanceable and retractable manner; a spindle supported at another end of the frame coaxially with the anvil in an advanceable and retractable manner; a measurement unit that measures the advancement and retraction of the anvil; and a display unit that displays a measurement result of the measurement unit. The measurement unit includes: an anvil contact portion that rotates around a support shaft in accordance with the advancement and retraction of the anvil; an interlocking portion that is formed to have a length greater than the length of the anvil contact portion, is supported so as to be rotatable around the support shaft, and is coupled to the anvil contact portion; and a detection unit that detects a displacement of rotation of the interlocking portion.
Digital comparator having a retractable anvil supported at one end of a U-shaped frame
Provided is a comparator including: a substantially U-shaped frame; an anvil supported at one end of the frame in an advanceable and retractable manner; a spindle supported at another end of the frame coaxially with the anvil in an advanceable and retractable manner; a measurement unit that measures the advancement and retraction of the anvil; and a display unit that displays a measurement result of the measurement unit. The measurement unit includes: an anvil contact portion that rotates around a support shaft in accordance with the advancement and retraction of the anvil; an interlocking portion that is formed to have a length greater than the length of the anvil contact portion, is supported so as to be rotatable around the support shaft, and is coupled to the anvil contact portion; and a detection unit that detects a displacement of rotation of the interlocking portion.
Precision Hydrostatic Level and Flatness Measuring Devices, Systems and Methods
A micrometer system and water holding cup and related for use in connection with a hydrostatic level-measuring system for measuring with precision, a level normal to gravitation of physical surfaces, the micrometer system comprising: a micrometer; an elongated micrometer probe tip at a lower extremity of the micrometer; a micrometer dial for extending and retracting the probe tip in response to a dialing thereof; a micrometer alignment section fixed to the micrometer, and a substantially rigid support structure for supporting the a micrometer alignment section at a fixed height above the physical surfaces when a footing of the support structure is rested upon the physical surfaces. The cup comprises mirroring on a bottom surface thereof; at least one reference feature on the mirroring surface for providing to a user, a visual reference for at least one micrometer grade marker reflected by the mirroring surface, for dialing a micrometer.
Precision Hydrostatic Level and Flatness Measuring Devices, Systems and Methods
A micrometer system and water holding cup and related for use in connection with a hydrostatic level-measuring system for measuring with precision, a level normal to gravitation of physical surfaces, the micrometer system comprising: a micrometer; an elongated micrometer probe tip at a lower extremity of the micrometer; a micrometer dial for extending and retracting the probe tip in response to a dialing thereof; a micrometer alignment section fixed to the micrometer, and a substantially rigid support structure for supporting the a micrometer alignment section at a fixed height above the physical surfaces when a footing of the support structure is rested upon the physical surfaces. The cup comprises mirroring on a bottom surface thereof; at least one reference feature on the mirroring surface for providing to a user, a visual reference for at least one micrometer grade marker reflected by the mirroring surface, for dialing a micrometer.
FLATNESS MEASURING DEVICE
A flatness measurement device includes a movement platform, a standard component, a first flatness measuring device, a second flatness measuring device and a processor. The movement platform is used for driving a to-be-measured object to move. The standard component and the movement platform move together. The first flatness measuring device is used for measuring a first flatness information of the to-be-measured object when the to-be-measured object moves. The second flatness measuring device is used for measuring a second flatness information of the standard component when the standard component moves. A flatness information of the to-be-measured object is obtained by deducting the second flatness information from the first flatness information by the processor.
FLATNESS MEASURING DEVICE
A flatness measurement device includes a movement platform, a standard component, a first flatness measuring device, a second flatness measuring device and a processor. The movement platform is used for driving a to-be-measured object to move. The standard component and the movement platform move together. The first flatness measuring device is used for measuring a first flatness information of the to-be-measured object when the to-be-measured object moves. The second flatness measuring device is used for measuring a second flatness information of the standard component when the standard component moves. A flatness information of the to-be-measured object is obtained by deducting the second flatness information from the first flatness information by the processor.
CONNECTION UNIT FOR CONNECTING EXTERNAL DEVICE TO MEASUREMENT DEVICE AND MEASUREMENT DEVICE OPTIONAL SYSTEM USING THE CONNECTION UNIT
There is provided a connection unit for connecting an external device to a measurement device.
Connection units 600 and 700 each include a flat plate shaped connection unit main part 610, a connector terminal 651 for measurement device provided at the connection unit main part 610 and connected to a signal inputting/outputting connection port 110 or 210 corresponding to each of measurement devices 100 to 400, and a connector terminal 660 for external device provided at the connection unit main part 610 and connected to a signal inputting/outputting connection port 511 of each of external devices 510 to 540. The connection unit main part 610 is further provided with a manually operable switch.
EXTERNAL DEVICE FOR MEASURING INSTRUMENT
An external device is configured to be detachably attached to a measuring instrument via a connector. The external device includes a connector part, an external device body part and a movable connection part. The connector part has a connection terminal. The external device body part has a display part on a side surface of the external device body part. The movable connection part is configured to connect the connector part with the external device body part. The movable connection part is a biaxial rotation hinge having two pivot axes which are in a twisted position relationship with respect to each other.
Apparatus and method for detection of deformation in battery cells
A deformation detection apparatus includes a cell movement-control assembly to handle a linear motion and a rotational motion of a battery cell, a body that supports the cell movement-control assembly, a digital micrometer, and control circuitry. The control circuitry controls a displacement of the battery cell between a first position and a second position along a longitudinal axis through a scanning region of the digital micrometer and a plurality of rotational positions of the battery cell at a plurality of charge states and a plurality of discharge states. The control circuitry measures a plurality of outer diameter values of the battery cell for a plurality of linear positions and a plurality of rotational positions along the longitudinal axis of the battery cell and determines a change in a geometrical shape (deformation and/or strain) of the battery cell for the plurality of linear positions and the plurality of rotational positions.