A degradation display system according to an aspect of the present disclosure includes: at least one memory configured to store instructions, and at least one processor configured to execute the instructions to perform: acquiring a degradation index indicating a degradation state of a road section, changing display form of a map in accordance with a display range and a scale of the map, and superimposing degradation information on the map, the degradation information based on the degradation index of an area on the map or the road section in the area, wherein the superimposing includes: superimposing, for each area, the degradation information in a display form corresponding to a degree of the degradation index of the area in a case that the map is at a first scale, and superimposing, for each road section, the degradation information in a display form corresponding to a degree of the degradation index of the road section in a case that the map is at a second scale larger than the first scale.

A degradation display system according to an aspect of the present disclosure includes: at least one memory configured to store instructions, and at least one processor configured to execute the instructions to perform: acquiring a degradation index indicating a degradation state of a road section, changing display form of a map in accordance with a display range and a scale of the map, and superimposing degradation information on the map, the degradation information based on the degradation index of an area on the map or the road section in the area, wherein the superimposing includes: superimposing, for each area, the degradation information in a display form corresponding to a degree of the degradation index of the area in a case that the map is at a first scale, and superimposing, for each road section, the degradation information in a display form corresponding to a degree of the degradation index of the road section in a case that the map is at a second scale larger than the first scale.

An indium phosphide substrate, a method of inspecting thereof and a method of producing thereof are provided, by which an epitaxial film grown on the substrate is rendered excellently uniform, thereby allowing improvement in PL characteristics and electrical characteristics of an epitaxial wafer formed using this epitaxial film. The indium phosphide substrate has a first main surface and a second main surface, a surface roughness Ra1 at a center position on the first main surface, and surface roughnesses Ra2, Ra3, Ra4, and Ra5 at four positions arranged equidistantly along an outer edge of the first main surface and located at a distance of 5 mm inwardly from the outer edge. An average value m1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.5 nm or less, and a standard deviation σ1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.2 nm or less.

An indium phosphide substrate, a method of inspecting thereof and a method of producing thereof are provided, by which an epitaxial film grown on the substrate is rendered excellently uniform, thereby allowing improvement in PL characteristics and electrical characteristics of an epitaxial wafer formed using this epitaxial film. The indium phosphide substrate has a first main surface and a second main surface, a surface roughness Ra1 at a center position on the first main surface, and surface roughnesses Ra2, Ra3, Ra4, and Ra5 at four positions arranged equidistantly along an outer edge of the first main surface and located at a distance of 5 mm inwardly from the outer edge. An average value m1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.5 nm or less, and a standard deviation σ1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.2 nm or less.

The present disclosure relates to a surface roughness sensor apparatus. The surface roughness sensor apparatus includes: a rotatable rotation shaft; a piezoelectric sensor provided along a circumference of the rotation shaft, rotated by rotation of the rotation shaft, and configured to generate a sensing signal in response to a pressure applied by a surface of an object as being in direct contact with the surface of the object; and a signal transfer unit configured to transfer the sensing signal generated and transmitted by the piezoelectric sensor to the outside of the sensor apparatus, and the piezoelectric sensor may be rotated in a direction in which a relative movement between the piezoelectric sensor and the surface of the object is made at a contact point with the object to minimize damage to the surface of the object.

The present disclosure relates to a surface roughness sensor apparatus. The surface roughness sensor apparatus includes: a rotatable rotation shaft; a piezoelectric sensor provided along a circumference of the rotation shaft, rotated by rotation of the rotation shaft, and configured to generate a sensing signal in response to a pressure applied by a surface of an object as being in direct contact with the surface of the object; and a signal transfer unit configured to transfer the sensing signal generated and transmitted by the piezoelectric sensor to the outside of the sensor apparatus, and the piezoelectric sensor may be rotated in a direction in which a relative movement between the piezoelectric sensor and the surface of the object is made at a contact point with the object to minimize damage to the surface of the object.

An approach to determining vehicle usage makes use of a sensor that provides a vibration signal associated with the vehicle, and that vibration signal is used to infer usage. Usage can include distance traveled, optionally associated with particular ranges of speed or road type. In a calibration phase, auxiliary measurements, for instance based on GPS signals, are used to determine a relationship between the vibration signal and usage. In a monitoring phase, the determined relationship is used to infer usage from the vibration signal.

A method for producing a chemically strengthened glass, including a step of bringing a glass containing sodium into contact with an inorganic salt containing potassium nitrate, thereby performing ion exchange of a Na ion in the glass with a K ion in the inorganic salt, in which the inorganic salt contains at least one salt selected from the group consisting of K.sub.2CO.sub.3, Na.sub.2CO.sub.3, KHCO.sub.3, NaHCO.sub.3, K.sub.3PO.sub.4, Na.sub.3PO.sub.4, K.sub.2SO.sub.4, Na.sub.2SO.sub.4, KOH and NaOH, and the method includes: a step of washing the glass after the ion exchange; a step of subjecting the glass to an acid treatment after the washing; and a step of subjecting the glass to an alkali treatment after the acid treatment.

A method for producing a chemically strengthened glass, including a step of bringing a glass containing sodium into contact with an inorganic salt containing potassium nitrate, thereby performing ion exchange of a Na ion in the glass with a K ion in the inorganic salt, in which the inorganic salt contains at least one salt selected from the group consisting of K.sub.2CO.sub.3, Na.sub.2CO.sub.3, KHCO.sub.3, NaHCO.sub.3, K.sub.3PO.sub.4, Na.sub.3PO.sub.4, K.sub.2SO.sub.4, Na.sub.2SO.sub.4, KOH and NaOH, and the method includes: a step of washing the glass after the ion exchange; a step of subjecting the glass to an acid treatment after the washing; and a step of subjecting the glass to an alkali treatment after the acid treatment.

A measuring assembly for measuring the contour of a workpiece has a measuring probe that is pivotably supported and deflectable about a first axis (measuring axis) in order to contact a surface of the workpiece, and has a second axis that is associated with the workpiece. The first axis and the second axis are parallel or approximately parallel to one another for radially contacting a surface of the workpiece. A device for rotating the measuring probe and the workpiece relative to one another is provided, such that the measuring probe contacts the surface of the workpiece during the rotation, and a device for plotting the angular deflection of the measuring probe as a function of the particular rotational position of the workpiece relative to the measuring probe is provided.