An organic light-emitting diode (OLED) display is disclosed. In one aspect, the display includes an OLED layer including a plurality of OLEDs that respectively form a plurality of sub-pixels and an encapsulation layer disposed over the OLED layer. The OLED display also includes an optical film disposed over the encapsulation layer and comprising a reflection control layer, a first lens disposed below the reflection control layer, and a second lens disposed over the reflection control layer, wherein the reflection control layer comprises i) a plurality of color filters respectively corresponding to the sub-pixels, and ii) a light shielding portion disposed between the color filters. The OLED display further includes an intermediate layer disposed between the encapsulation layer and the optical film, wherein the first lens is disposed over sides of at least one sub-pixels and wherein the second lens is disposed over center portions of selected sub-pixels.

The present invention discloses a sensing circuit, a processing method of the sensing circuit and a curved surface profile measuring method. Conductors of the sensing circuit are arranged in flexible protection bodies in a braiding manner, and the conductors and the flexible protection bodies are at a compressed state. Therefore, the sensing circuit of the present invention has better flexibility and tensile property, can be attached to a surface of equipment, can be used for sensing multiple situations of the equipment, such as slight touch and collision of a large displacement, and can also be applied to precise measurement of a size of a curved surface profile.

The present invention discloses a sensing circuit, a processing method of the sensing circuit and a curved surface profile measuring method. Conductors of the sensing circuit are arranged in flexible protection bodies in a braiding manner, and the conductors and the flexible protection bodies are at a compressed state. Therefore, the sensing circuit of the present invention has better flexibility and tensile property, can be attached to a surface of equipment, can be used for sensing multiple situations of the equipment, such as slight touch and collision of a large displacement, and can also be applied to precise measurement of a size of a curved surface profile.

A system and a method for uniformed surface measurement are provided, in which a sensor is provided to perform measurements on a carrier in a polishing machine, and a measuring trajectory of the sensor on the carrier is adjusted by controlling the pivoting of a sensor carrier carrying the sensor and the rotation of a rotating platform in the polishing machine in order to achieve uniformed surface measurements of the carrier and real-time constructions of the surface topography. This allows the polishing state of the carrier to be monitored in real time, thereby improving the efficiency of the polishing process. A sensing apparatus for uniformed surface measurement is also provided.

A vibration amplification and detection device may include a coiled diaphragm coupled to a pin that is also coupled to a substrate. The coiled diaphragm may be coupled to the pin via at least one axle and a fulcrum disc, and the vibration detection device may be coupled to a surface via the substrate. Responsive to vibration associated with or proximate the surface, the coiled diaphragm may receive and amplify the received vibration. In addition, a sensor associated with the vibration detection device may capture or detect the received and amplified vibration. Further, the detected vibration may be processed and compared with known vibrations and associated properties. Moreover, one or more actions may be instructed based on the detected vibration and associated properties.

A metal strip is rolled in a roll stand and a control device for the roll stand determines, by means of a working cycle, a number of manipulated variables for flatness actuators of the roll stand and actuates them accordingly. The control device implements an optimizer, which provisionally sets the current correction values, and determines a totality of flatness values. Then, the optimizer minimizes the relationship by varying the current correction variables. When determining the current correction variables (s), the optimizer considers linear ancillary conditions, based at least in part on a vector having the ancillary conditions upheld by the current correction values and a vector having the ancillary conditions upheld by the difference of the current correction values relative to the correction values of the preceding working cycle. The control device determines the manipulated variables for the flatness actuators in consideration of the determined current correction variables.

A metal strip is rolled in a roll stand and a control device for the roll stand determines, by means of a working cycle, a number of manipulated variables for flatness actuators of the roll stand and actuates them accordingly. The control device implements an optimizer, which provisionally sets the current correction values, and determines a totality of flatness values. Then, the optimizer minimizes the relationship by varying the current correction variables. When determining the current correction variables (s), the optimizer considers linear ancillary conditions, based at least in part on a vector having the ancillary conditions upheld by the current correction values and a vector having the ancillary conditions upheld by the difference of the current correction values relative to the correction values of the preceding working cycle. The control device determines the manipulated variables for the flatness actuators in consideration of the determined current correction variables.

A system and a method for uniformed surface measurement are provided, in which a sensor is provided to perform measurements on a carrier in a polishing machine, and a measuring trajectory of the sensor on the carrier is adjusted by controlling the pivoting of a sensor carrier carrying the sensor and the rotation of a rotating platform in the polishing machine in order to achieve uniformed surface measurements of the carrier and real-time constructions of the surface topography. This allows the polishing state of the carrier to be monitored in real time, thereby improving the efficiency of the polishing process. A sensing apparatus for uniformed surface measurement is also provided.

A multibend sensor is able to provide information regarding bending of the sensor data in a manner able to mitigate error propagation. A reference strip and a sliding strip are separated from each other by a spacer. Electrodes are located on the reference strip and the sliding strip. The bending of the multibend sensor will be reflected in the shifting of the sliding strip with respect to the reference strip and the measurements obtained from the electrodes. A finger may be operably connected to the reference strip, wherein the finger extends in the direction of the sliding strip, wherein movement of the reference strip with respect to the sliding strip is translated through the finger.

A multibend sensor is able to provide information regarding bending of the sensor data in a manner able to mitigate error propagation. A reference strip and a sliding strip are separated from each other by a spacer. Electrodes are located on the reference strip and the sliding strip. The bending of the multibend sensor will be reflected in the shifting of the sliding strip with respect to the reference strip and the measurements obtained from the electrodes. A finger may be operably connected to the reference strip, wherein the finger extends in the direction of the sliding strip, wherein movement of the reference strip with respect to the sliding strip is translated through the finger.