Patent classifications
G01B7/28
MRI TRACKING DEVICE DESIGN, FABRICATION, AND METHODS OF USE FOR MRI-GUIDED ROBOTIC SYSTEM
An MR marker (501, 601, 803, 902) for magnetic resonance imaging (MRI) guided intervention and method of fabricating same. The tracking device can be integrated with an MRI-guided robotic system to provide precise positional tracking of the interventional tools and robotic components, allowing safe operation inside the human body. The MR tracking device includes a plurality of stacked flexible printed circuit boards; a plurality of flat planar spirals comprised of a non-ferromagnetic material and directly disposed on a top surface and a bottom surface side of each flexible printed circuit board, a biocompatible, non-ferromagnetic material encapsulating the flexible printed circuit boards; and an adhesive bonding the flexible printed circuit boards. In another aspect, an orientation-independent device is provided including three or more markers (501, 601, 803, 902) in an array around a cylindrical substrate.
MRI TRACKING DEVICE DESIGN, FABRICATION, AND METHODS OF USE FOR MRI-GUIDED ROBOTIC SYSTEM
An MR marker (501, 601, 803, 902) for magnetic resonance imaging (MRI) guided intervention and method of fabricating same. The tracking device can be integrated with an MRI-guided robotic system to provide precise positional tracking of the interventional tools and robotic components, allowing safe operation inside the human body. The MR tracking device includes a plurality of stacked flexible printed circuit boards; a plurality of flat planar spirals comprised of a non-ferromagnetic material and directly disposed on a top surface and a bottom surface side of each flexible printed circuit board, a biocompatible, non-ferromagnetic material encapsulating the flexible printed circuit boards; and an adhesive bonding the flexible printed circuit boards. In another aspect, an orientation-independent device is provided including three or more markers (501, 601, 803, 902) in an array around a cylindrical substrate.
Sensor for detecting a bending, flexible display apparatus, and method of detecting bending in flexible display apparatus
The present application discloses a sensor for detecting a bending in a flexible display apparatus. The sensor includes a first flexible base substrate, and a first electrode layer on a side of the first flexible base substrate. The first electrode layer includes an array of a plurality of first electrodes configured to detect a first bending toward a first bent direction relative to a surface of the first flexible base substrate.
Sensor for detecting a bending, flexible display apparatus, and method of detecting bending in flexible display apparatus
The present application discloses a sensor for detecting a bending in a flexible display apparatus. The sensor includes a first flexible base substrate, and a first electrode layer on a side of the first flexible base substrate. The first electrode layer includes an array of a plurality of first electrodes configured to detect a first bending toward a first bent direction relative to a surface of the first flexible base substrate.
Method for measuring and calculating geometric parameters of the wheels of a wheelset for rail vehicles
The invention relates to a method for measuring and calculating geometric parameters of the wheels of a wheelset for rail vehicles, wherein the wheelset to be evaluated is rotatably mounted in a wheelset machine tool or in a wheelset diagnostic system and wherein measured values for profile measurement with respect to profile wear to be detected are determined during rotational motion of said wheelset. The problem addressed by the invention is to expand already available measuring methods on known wheelset machine tools and wheelset diagnostic systems in such a way that further geometric parameters can be detected and evaluated. This problem is solved in that methods for measuring and calculating the equivalent conicity and the radial run-out property of a wheelset are integrated as new measurement functions, wherein solution approaches are proposed for these additional methods.
Method for measuring and calculating geometric parameters of the wheels of a wheelset for rail vehicles
The invention relates to a method for measuring and calculating geometric parameters of the wheels of a wheelset for rail vehicles, wherein the wheelset to be evaluated is rotatably mounted in a wheelset machine tool or in a wheelset diagnostic system and wherein measured values for profile measurement with respect to profile wear to be detected are determined during rotational motion of said wheelset. The problem addressed by the invention is to expand already available measuring methods on known wheelset machine tools and wheelset diagnostic systems in such a way that further geometric parameters can be detected and evaluated. This problem is solved in that methods for measuring and calculating the equivalent conicity and the radial run-out property of a wheelset are integrated as new measurement functions, wherein solution approaches are proposed for these additional methods.
FINGER FOR MULTIBEND SENSOR
A multibend sensor is able to provide information regarding bending of the sensor data in a manner able to mitigate error propagation. A reference strip and a sliding strip are separated from each other by a spacer. Electrodes are located on the reference strip and the sliding strip. The bending of the multibend sensor will be reflected in the shifting of the sliding strip with respect to the reference strip and the measurements obtained from the electrodes. A finger may be operably connected to the reference strip, wherein the finger extends in the direction of the sliding strip, wherein movement of the reference strip with respect to the sliding strip is translated through the finger.
FINGER FOR MULTIBEND SENSOR
A multibend sensor is able to provide information regarding bending of the sensor data in a manner able to mitigate error propagation. A reference strip and a sliding strip are separated from each other by a spacer. Electrodes are located on the reference strip and the sliding strip. The bending of the multibend sensor will be reflected in the shifting of the sliding strip with respect to the reference strip and the measurements obtained from the electrodes. A finger may be operably connected to the reference strip, wherein the finger extends in the direction of the sliding strip, wherein movement of the reference strip with respect to the sliding strip is translated through the finger.
METHOD AND APPARATUS FOR INSPECTION OF SPHERICAL SURFACES
Disclosed are a method and an apparatus for inspection of workpieces and products having curved and, in particular, spherical surfaces. The method is based on scanning inspected objects with a narrow probing beam of electromagnetic radiation and concurrently measuring the radiation scattered on the surface. The method and apparatus improve the detectability of features and imperfections on inspected surfaces by providing invariable parameters and conditions of scanning, robust mechanical stability of scanning systems, high positioning accuracy of the probing electromagnetic beam and efficient collection of the scattered radiation. The apparatus allows surface defect classification, determining defect dimensions and convenient automation of inspection.
Fingerprint sensing panel and fingerprint sensor thereof
A fingerprint sensing panel and a fingerprint sensor thereof are provided. The fingerprint sensor includes first to third switches, a first capacitor, an impedance variation element and a sensing circuit. The first switch receives a system high voltage and is controlled by a pre-charge signal. The first capacitor is coupled between the first switch and a reference voltage. The impedance variation element is coupled between the first switch and the reference voltage, and an impedance value of the impedance variation element is changed according to a vertical distance between the impedance variation element and a skin surface. The second switch receives the system high voltage. The third switch receives a read signal. The sensing circuit is coupled to the third switch and provides a fingerprint determination voltage.