A digital speckle pattern interferometer (DSPI) is provided for long-range measurement of displacement of materials within a hazardous environments. A test arm of a portion of coherent beam from a laser is aimed at a selected angle to traverse a distance to a test surface. An input collimator has a lens wide enough to receive a reflected beam from the test surface and is focused at a corresponding distance. The reflected beam is combined with a reference beam split from the coherent radiation onto a camera for measuring displacement of the test surface based on an electronic speckle pattern interferometer (ESPI).

A laser interferometer that includes a light source configured to emit laser light, an optical divider configured to divide the laser light into a first optical path and a second optical path, an optical modulator being provided on the first optical path or the second optical path, including an oscillator that oscillates when a current is applied, and being configured to modulate the laser light by using the oscillator, a photoreceptor configured to receive the laser light and output a photoreception signal, the laser light being reflected by an object to be measured that is provided on the first optical path or the second optical path, and a demodulation circuit configured to demodulate, from the photoreception signal, a Doppler signal derived from the object to be measured, based on a reference signal and a modulation signal derived from the optical modulator, wherein Iq/f≤1×10.sup.−7 is satisfied, where an amplitude value of the current applied to the oscillator that is oscillating is Iq [A] and an oscillation frequency of the oscillator is f [Hz].

A laser interferometer that includes a laser light source configured to emit emission light, a light splitter configured to split the emission light into first split light, and second split light incident on an object to be measured, a light modulator disposed on an optical path on which the first split light advances, and configured to modulate the first split light into a reference light having a different frequency from a frequency of the first split light, an optical path length change unit provided between the light splitter and the light modulator, and configured to change a first optical path length, the first optical path length being an optical path length between the light splitter and the light modulator, a photoreceptor configured to receive an interference light of the reference light and an object light generated by reflecting the emission light at the object to be measured, and to output a light reception signal, and a controller configured to control operation of the optical path length change unit in accordance with a second optical path length, the second optical path length being an optical path length between the light splitter and the object to be measured.

The present disclosure provides a common-path optical waveguide probe. The common-path optical waveguide probe includes an optical waveguide, a lens, and a reference reflector. The optical waveguide includes a proximal end and a distal end. The lens is coupled to the distal end. The reference reflector is positioned between the optical waveguide and the lens. The disclosure also provides a catheter and an optical coherence tomography system utilizing the common-path optical waveguide probe. The disclosure also provides methods of making and using the common-path optical waveguide probe.

Provided is a measurement device that includes a pixel including a light receiver, a plurality of storage sections, and an electric charge supplying section. The light receiver generates received-light electric charge by performing photoelectric conversion on the basis of light. The plurality of storage sections stores the received-light electric charge and the plurality of storage sections includes a first storage section and a second storage section. The electric charge supplying section selectively supplies the received-light electric charge generated by the light receiver to the plurality of storage sections. The measurement device includes a processor that generates a first detection value on the basis of an electric charge amount of the received-light electric charge stored in the first storage section, and generates a second detection value on the basis of an electric charge amount of the received-light electric charge stored in the second storage section. The processor generates a first pixel value on the basis of a difference between the first detection value and the second detection value.

A focus scan type imaging device for imaging a target object in a sample that induces aberration proposed. The device includes: a light source unit for emitting a beam; an optical interferometer for splitting the beam emitted from the light source into a sample wave and a reference wave, and providing an interference wave formed by interference between a reflection wave that is the sample wave reflected from the sample and the reference wave; a camera module for imaging the interference wave; a scanning mirror disposed on an optical path of the sample wave of the optical interferometer and configured to reflect the sample wave to cause the sample wave to scan the sample; a wavefront shaping modulator disposed on the optical path of the sample wave of the optical interferometer; and an imaging controller configured to operate in a phase map calculation mode and in an imaging mode.

A method of improving axial resolution of interferometric measurements of a 3D feature of a sample may comprise illuminating the feature using a first limited number of successively different wavelengths of light at a time; generating an image of at least the 3D feature based on intensities of light reflected from the feature at each of the successively different wavelengths of light; measuring a fringe pattern of intensity values for each corresponding pixel of the generated images; resampling the measured fringe patterns as k-space interferograms; estimating interference fringe patterns for a spectral range that is longer than available from the generated images using the k-space interferograms; appending the estimated interference fringe patterns to the respective measured fringe patterns; and measuring the height or depth of the 3D feature using the measured interference fringe patterns and appended estimated fringe patterns.

An implementation cost of a line-scan optical coherence tomography (OCT) apparatus is reduced by miniaturizing a scanning mirror and using a light source with relaxed requirement in intensity uniformity. The mirror reflects a probe light beam to different parts of a sample for line-scanning the sample. A line-compressing lens compresses the probe light beam's cross-sectional length before the beam reaches the mirror, allowing the mirror to be miniaturized to reflect only the compressed beam. In generating a linear light beam that gives the probe light beam, a cascade of collimating lens, Powell lens and focusing lens generates the linear light beam from a raw light beam of a point source. A slit further filters the linear light beam to remove a peripheral portion thereof such that the linear light beam is substantially uniform in intensity even if an asymmetrical divergent light source is used.

An analysis apparatus includes an acquisition part that acquires a plurality of interference images based on lights having a plurality of different wavelengths from an interference measurement apparatus, a removing part that outputs an interference component by removing a non-interference component included in an interference signal for each pixel in the plurality of the interference images, a conversion part that generates an analysis signal by performing a Hilbert transformation on the interference component, and a calculation part that calculates a distance between a reference surface and a surface of an object to be measured by specifying a phase gradient of a wavelength of light radiated onto the reference surface and the surface of the object to be measured on the basis of the interference component and the analysis signal.

A quantum device includes a non-reciprocal transmission structure, wherein the transmission structure is designed such that for first waves traversing the transmission structure in a forward direction the phases of the first waves are at least partially conserved, and for second waves traversing the transmission structure in a backward direction, the phases of the second waves are at least partially replaced by random ones, such that the phase conservation is more pronounced in the forward direction than in the backward direction.