A sample shape measuring method includes a step of preparing illumination light passing through a predetermined illumination region, a step of applying the illumination light to a sample, and a predetermined processing step. The predetermined illumination region is set so as to include an optical axis at a pupil position of an illumination optical system. Light transmitted through the sample is incident on the observation optical system. The predetermined processing step includes a step of receiving light emerged from the observation optical system, a step of obtaining a quantity of light of the received light, a step of calculating a difference or a ratio between the quantity of light and a reference quantity of light, and a step of calculating an amount of tilt in a surface of the sample from the difference or the ratio.

A sample shape measuring method includes a step of preparing illumination light passing through a predetermined illumination region, a step of applying the illumination light to a sample, and a predetermined processing step. The predetermined illumination region is set so as to include an optical axis at a pupil position of an illumination optical system. Light transmitted through the sample is incident on the observation optical system. The predetermined processing step includes a step of receiving light emerged from the observation optical system, a step of obtaining a quantity of light of the received light, a step of calculating a difference or a ratio between the quantity of light and a reference quantity of light, and a step of calculating an amount of tilt in a surface of the sample from the difference or the ratio.

The present invention concerns a method for producing a microscopic image with an extended depth of field by means of a microscope. The microscope comprises an images sensor that comprises pixels that are arranged as a matrix that is formed by lines. In a step of the method, a plurality of microscopic frames of a specimen is acquired while a focus position (z) is changed. The microscopic frames are acquired line by line. The focus position (z) is changed over a course of acquiring individuals of the microscopic frames. In a further step, parts of individuals of the acquired lines are identified. These parts sharply image the specimen. The identified parts of the lines are composed in order to form a microscopic image of the specimen with an extended depth of field. Furthermore, the present invention concerns a microscope.

A multi-photon imaging system includes a laser module having a first channel for outputting a two-photon excitation laser pulse and a second channel for outputting a three-photon excitation laser pulse. The system further includes a first optical path for guiding the two-photon laser pulse from the first channel of the laser module and a second optical path for guiding the three-photon laser pulse from the second channel of the laser module. A microscope is also provided for simultaneously receiving the two-photon laser pulse from the first optical path and the three-photon laser pulse from the second optical path, and simultaneously, or with well controllable delays, delivering the two-photon laser pulse and the three-photon pulse to a target volume. The system further includes a photodetector configured to collect photons generated within the target volume in response to simultaneous excitation of the target volume by both the two-photon laser pulse and the three-photon laser pulse.

The invention relates to a device, such as a digital holographic microscope (1), for detecting and processing a first full image of a measurement object, measured with a first offset, wherein an arrangement is provided for generating at least one further full image with at least one offset that differs from said first offset.

A scanning microscope includes: a charged particle beam source configured to output a charged particle beam to be emitted to a sample; a detector configured to detect charged particles from the sample; and a controller configured to control the charged particle beam source and the detector, wherein the controller changes one or more variable parameters to determine a plurality of different parameter value sets, acquires a measurement result of a temporal change of absorption current in a target sample material under each of the plurality of different parameter value sets, and, based on the measurement results, selects a parameter value set for use in measurement of the target sample from the plurality of different parameter value sets.

A scanning microscope includes: a charged particle beam source configured to output a charged particle beam to be emitted to a sample; a detector configured to detect charged particles from the sample; and a controller configured to control the charged particle beam source and the detector, wherein the controller changes one or more variable parameters to determine a plurality of different parameter value sets, acquires a measurement result of a temporal change of absorption current in a target sample material under each of the plurality of different parameter value sets, and, based on the measurement results, selects a parameter value set for use in measurement of the target sample from the plurality of different parameter value sets.

Provided are a captured image evaluation apparatus, a captured image evaluation method, and a captured image evaluation program capable of evaluating a thickness and a density of stacked cultured cells in a short imaging time. The captured image evaluation apparatus includes: an image acquisition section 52 that acquires captured images obtained by imaging a subject under a condition in which a numerical aperture of an objective lens is changed; a thickness estimation section 53 that estimates a thickness of the subject on the basis of a low NA captured image obtained under a condition in which the numerical aperture of the objective lens is relatively small; and a density estimation section 54 that estimates a density of the subject on the basis of a high NA captured image obtained under a condition in which the numerical aperture of the objective lens is relatively large.

The current invention relates to a method of structured lilumination microscopy for determining a height map of a test surface wherein use is made of a structured lilumination microscope. The invention is further related to a structured illumination microscope for determining a height map of a test surface. The microscope comprises a light source, a spatial light modulator, scanner, an optical detector, and a processor.

The current invention relates to a method of structured lilumination microscopy for determining a height map of a test surface wherein use is made of a structured lilumination microscope. The invention is further related to a structured illumination microscope for determining a height map of a test surface. The microscope comprises a light source, a spatial light modulator, scanner, an optical detector, and a processor.