A meta projector includes an edge emitting device configured to emit light through a side surface thereof, a meta-structure layer spaced apart from the upper surface of the edge emitting device that includes a plurality of nanostructures having a sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device, and a path changing member configured to change a path of the light emitted from the edge emitting device so as to direct the path toward the meta-structure layer. The meta projector may thus be configured to emit a light pattern of structured light, based on directing the light emitted from the edge emitting device through the meta-structure layer, while having a relatively compact device size.

A meta projector includes an edge emitting device configured to emit light through a side surface thereof, a meta-structure layer spaced apart from the upper surface of the edge emitting device that includes a plurality of nanostructures having a sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device, and a path changing member configured to change a path of the light emitted from the edge emitting device so as to direct the path toward the meta-structure layer. The meta projector may thus be configured to emit a light pattern of structured light, based on directing the light emitted from the edge emitting device through the meta-structure layer, while having a relatively compact device size.

In some example embodiments, there may be provided a metasurface for edge detection. The metasurface may include a nano or subwavelengh surface structure configured to provide an output having optical separation to enable detection of at least one edge of an object being illuminated, wherein the optical separation is based on a phase profile configured on the nano or subwavelengh surface structure of the metasurface.

A meta projector includes an edge emitting device configured to emit light through a side surface thereof, a meta-structure layer spaced apart from the upper surface of the edge emitting device that includes a plurality of nanostructures having a sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device, and a path changing member configured to change a path of the light emitted from the edge emitting device so as to direct the path toward the meta-structure layer. The meta projector may thus be configured to emit a light pattern of structured light, based on directing the light emitted from the edge emitting device through the meta-structure layer, while having a relatively compact device size.

A meta projector includes an edge emitting device configured to emit light through a side surface thereof, a meta-structure layer spaced apart from the upper surface of the edge emitting device that includes a plurality of nanostructures having a sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device, and a path changing member configured to change a path of the light emitted from the edge emitting device so as to direct the path toward the meta-structure layer. The meta projector may thus be configured to emit a light pattern of structured light, based on directing the light emitted from the edge emitting device through the meta-structure layer, while having a relatively compact device size.

A measurement system includes a light source configured to emitting a source light, a detection platform configured to support a reference sample and a test sample; a light guiding element on an optical path of the source light; and a detector. The detection platform is configured to synchronously move the reference sample and the test sample on a same surface of the detection platform. The light guiding element is configured to divide the source light into a measurement light and a reference light and guide the measurement light to the test sample, and the reference light to the reference sample. The measurement light reflected by the test sample and the reference light reflected by the reference sample are combined as an interference light. The detector is configured to receive the interference light and obtain optical information of the test sample according to the interference light.

Disclosed herein is a method of inspecting a secondary bond of a laminated part. The method comprises positioning the laminated part within a sealed chamber. The method also comprises reducing a pressure within the sealed chamber to below a pressure outside the sealed chamber when the laminated part is positioned within the sealed chamber. The method further comprises, when the pressure within the sealed chamber is reduced to below the pressure outside the sealed chamber, measuring a gradient of change of a surface profile of the laminated part. The method additionally comprises determining a condition of the secondary bond based on the gradient of change of the surface profile of the laminated part.

A meta projector includes an edge emitting device configured to emit light through a side surface thereof, a meta-structure layer spaced apart from the upper surface of the edge emitting device that includes a plurality of nanostructures having a sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device, and a path changing member configured to change a path of the light emitted from the edge emitting device so as to direct the path toward the meta-structure layer. The meta projector may thus be configured to emit a light pattern of structured light, based on directing the light emitted from the edge emitting device through the meta-structure layer, while having a relatively compact device size.

A meta projector includes an edge emitting device configured to emit light through a side surface thereof, a meta-structure layer spaced apart from the upper surface of the edge emitting device that includes a plurality of nanostructures having a sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device, and a path changing member configured to change a path of the light emitted from the edge emitting device so as to direct the path toward the meta-structure layer. The meta projector may thus be configured to emit a light pattern of structured light, based on directing the light emitted from the edge emitting device through the meta-structure layer, while having a relatively compact device size.

Apparatuses, systems and methods associated with a trigger management device for managing triggering of sensors within measurement equipment are disclosed herein. In embodiments, a trigger management device may include trigger circuitry coupled to a sensor, the trigger circuitry to determine an amount of delay from trigger transmission to data capture for the sensor, and transmit a trigger to the sensor, the trigger to cause the sensor to capture sensor data. The trigger management device may further include encoder circuitry coupled to one or more encoders, the one or more encoders to indicate positions of one or more actuators or motors, the encoder circuitry to capture encoder data from the one or more encoders at a time that is the amount of delay after transmission of the trigger, wherein the encoder data indicates current positions of the one or more actuators or motors. Other embodiments may include circuitry to manage and/or transmit encoder and other data to multiple devices.