A surface shape measuring apparatus for measuring a specular surface includes an illuminator configured to illuminate the specular surface with a first light pattern, an imaging device configured to capture an image of a second light pattern which is light transmitted through the illuminator after the first light pattern from the illuminator is reflected by the specular surface, and a processing apparatus configured to acquire a positional deviation amount of the second light pattern from a predetermined position in the image captured by the imaging device, and to output information related to a surface shape of the specular surface acquired from the positional deviation amount.

Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.

Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.

A depth camera assembly (DCA) optimizes illumination and image capture of a local area to generate depth information of the local area. The DCA determines depth information for a first portion of the local area viewable at a first pose. The DCA is moved from the first pose to a second pose, where a second portion of the local area is viewable and overlaps with the first portion. The overlapping region is not illuminated by the DCA. A non-overlapping portion of the second portion is illuminated, captured, and depth information determined.

A depth camera assembly (DCA) optimizes illumination and image capture of a local area to generate depth information of the local area. The DCA determines depth information for a first portion of the local area viewable at a first pose. The DCA is moved from the first pose to a second pose, where a second portion of the local area is viewable and overlaps with the first portion. The overlapping region is not illuminated by the DCA. A non-overlapping portion of the second portion is illuminated, captured, and depth information determined.

A three dimensional scanning apparatus is used to detect a contour of an object, and includes an illumination light source, a first aperture element, a reference pattern generator and an optical receiver. The illumination light source emits an illumination beam. The reference pattern generator provides a reference pattern by projection of the illumination beam, and transmits the reference pattern toward the object via the first aperture element. The optical receiver receives a detection pattern reflected from the object, so as to analyze difference between the reference pattern and the detection pattern for acquiring the contour. The first aperture element has two first lateral sides and two second lateral sides opposite to each other. A first length of one of the first lateral sides is greater than a second length of one of the second lateral sides.

A three dimensional scanning apparatus is used to detect a contour of an object, and includes an illumination light source, a first aperture element, a reference pattern generator and an optical receiver. The illumination light source emits an illumination beam. The reference pattern generator provides a reference pattern by projection of the illumination beam, and transmits the reference pattern toward the object via the first aperture element. The optical receiver receives a detection pattern reflected from the object, so as to analyze difference between the reference pattern and the detection pattern for acquiring the contour. The first aperture element has two first lateral sides and two second lateral sides opposite to each other. A first length of one of the first lateral sides is greater than a second length of one of the second lateral sides.

An image measuring apparatus and program that enable easy designation of measurement points and intuitive, easy-to-understand operation is provided. The image measuring apparatus according to the present invention captures an image of a measurement object, and measures dimensions of measurement points of the measurement object by analyzing the image. The image measuring apparatus comprises: a display unit that displays the image of the measurement object; a measurement support item applying unit that causes the display unit to display a measurement support item superimposed on the image of the measurement object displayed on the display unit; an input unit that accepts input operations by a user for moving the measurement support item.

An image measuring apparatus and program that enable easy designation of measurement points and intuitive, easy-to-understand operation is provided. The image measuring apparatus according to the present invention captures an image of a measurement object, and measures dimensions of measurement points of the measurement object by analyzing the image. The image measuring apparatus comprises: a display unit that displays the image of the measurement object; a measurement support item applying unit that causes the display unit to display a measurement support item superimposed on the image of the measurement object displayed on the display unit; an input unit that accepts input operations by a user for moving the measurement support item.

A surface shape measuring apparatus for measuring a specular surface includes an illuminator configured to illuminate the specular surface with a first light pattern, an imaging device configured to capture an image of a second light pattern which is light transmitted through the illuminator after the first light pattern from the illuminator is reflected by the specular surface, and a processing apparatus configured to acquire a positional deviation amount of the second light pattern from a predetermined position in the image captured by the imaging device, and to output information related to a surface shape of the specular surface acquired from the positional deviation amount.