G01B11/002

CONTAINER MEASUREMENT SYSTEM

A container measuring system includes a distance image acquiring part and a calculation part. The distance image acquiring part is provided on a working machine for performing a work of loading into a container, and is capable of acquiring a distance image of the container. The calculation part processes the distance image of the container acquired by the distance image acquiring part. The calculation part calculates a three-dimensional position of a flat face part constituting the container on the basis of the distance image of the container. The calculation part calculates three-dimensional information including a three-dimensional position and a three-dimensional shape of the container on the basis of the three-dimensional position of the flat face part.

METHOD OF INSPECTING FLATNESS OF SUBSTRATE
20220341731 · 2022-10-27 ·

A method of inspecting flatness of substrate is provided and includes providing a substrate. N first inspecting points are selected from the surface of the substrate along a first straight line, where the coordinate of the i-th first inspecting point is (X.sub.i,Y.sub.i,Z.sub.i). By using a formula “D=Σ.sub.i=1.sup.N−1√{square root over ((X.sub.i+1−X.sub.i).sup.2+(Y.sub.i+1−Y.sub.i).sup.2+(Z.sub.i+1−Z.sub.i).sup.2)}”, a first measurement length D is calculated. By using a formula “F=(D−S)/S”, a first flatness index F is calculated. S is the horizontal distance between 1.sup.st first inspecting point and N-th first inspecting point. When the first flatness index F is larger than a first threshold, the substrate is determined to be unqualified.

SYSTEMS AND METHODS FOR ABSOLUTE SAMPLE POSITIONING
20220344192 · 2022-10-27 ·

A sample mapping system includes a sample chuck including absolute reference marks, an imaging metrology tool to capture sets of alignment images at locations associated with sample marks on a sample on the sample chuck, and a controller. A particular set of alignment images at a particular location may include at least one alignment image associated with a particular sample mark and at least one alignment image associated with a particular portion of the absolute reference marks within a field of view of the imaging metrology tool visible through the sample. The controller may determine absolute coordinates of the sample marks based on the sets of alignment images. Determining the absolute coordinates of the particular sample mark may include determining the absolute coordinates of the particular sample mark based on a position of the particular sample mark relative to the particular portion of the absolute reference marks.

SYSTEMS AND METHODS FOR OBJECT MEASUREMENT

The present disclosure relates to systems and methods for object measurement. The systems may obtain an image of an object with a light bar acquired by an imaging device. The light bar may be formed by an optical sensor irradiating the object with a light beam. The systems may obtain a measurement model. The measurement model may be configured to simulate a curved surface formed by the light beam. The systems may determine position information of at least a portion of the object based at least in part on the image of the object with the light bar and the measurement model.

Locating system and method for determining a current position in an elevator shaft of an elevator system

A locating system for determining a current position in an elevator shaft of an elevator system extending in a main extension direction includes a first distance sensor by which a first distance and a second distance, which second distance is perpendicular to the first distance, from a first reference element can be measured, as well as a tilt sensor by which a rotation about a horizontal first axis and a horizontal second axis perpendicular to the first axis can be measured, and a measuring system by which a position of the locating system can be determined in the main extension direction of the elevator shaft.

WORKPIECE HOLDING APPARATUS, WORKPIECE HOLDING METHOD, PROGRAM, AND CONTROL APPARATUS

A workpiece holding apparatus include holding means for attracting and holding each workpiece in turn from among workpieces placed in a 3D space; first information acquisition means for acquiring 3D information of workpieces; candidate calculation means for calculating, based on the acquired 3D information of the workpieces, candidate holding points, the candidate holding points being, when the holding means holds each of the workpieces in turn, candidates for a holding point of that workpiece; second information acquisition means for acquiring information about each of other workpieces present within a predetermined range from each of the candidate holding points on the workpieces; and control means for selecting one of the candidate holding points based on the information about the workpiece acquired by the second information acquisition means, and controlling the holding means so that the holding means holds the workpiece at the selected candidate holding point.

Method, system and apparatus for mobile dimensioning

A computing device includes: a tracking sensor including a camera; a controller connected with the tracking sensor, the controller configured to: control the tracking sensor to track successive poses of the computing device in a frame of reference; detecting a plurality of dimensioning events associated with an object; in response to detecting each of the dimensioning events, generate a respective position in the frame of reference based on a current one of the poses; generate, based on the positions, an object boundary in the frame of reference; and dimension the object based on the generated object boundary.

LEAD FRAME, SEMICONDUCTOR DEVICE AND EXAMINATION METHOD
20230084496 · 2023-03-16 ·

A lead frame includes a die pad that includes a mounting surface for a semiconductor chip, and a film-like member that is arranged on the mounting surface of the die pad. The die pad includes a through hole that is formed in an area that includes an outer periphery of the film-like member.

Estimating tracking sensor parametrization using known surface constraints

A sensor system and a method of operating a sensor system including a plurality of sensors tracking a moving object in an area having known bounding surfaces. The apparatus and method calculate a time-specific position of the object based on data and sensor parameters from at least two of the plurality of sensors and determine errors between the calculated time-specific positions calculated. The method and apparatus calculate a minimum system error attributable to the at least two sensors by constraining at least one dimension in the data of the sensor used in the calculated time-specific position of the object associated with the sensor, the constraining based on an object/surface interaction, the minimum system error calculated by solving for modified sensor parameters for each sensor.

OBJECT RANGING APPARATUS, METHOD, AND COMPUTER READABLE MEDIUM
20230075659 · 2023-03-09 · ·

An object recognition unit recognizes an object included in an image captured by a camera mounted on a vehicle. A first distance estimation unit estimates a distance between the vehicle and the recognized object based on the image. A second distance estimation unit estimates the distance between the vehicle and the recognized object based on the image by using an estimation method different from that of the first distance estimation unit. A combining unit combines a result of estimating the distance obtained by the first distance estimation unit and a result of estimating the distance obtained by the second distance estimation unit based on at least one of an amount of change in the distance estimated by the second distance estimation unit, a steering wheel angle of the vehicle, and information about an acceleration in an up-down direction, and outputs a result of the combination as a ranging result.