The current technology relates to a device for performing location triangulation on an object of interest. The device can include an elongate frame defining a sensor plane. The device can further include distance sensors equally spaced and fixed to the elongate frame. A distance sensor can sense an object distance outwardly from the sensor plane. The device can further include a processor coupled to the distance sensors and configured to triangulate a location of a first object outwardly from the sensor plane based on the object distance sensed by the plurality of distance sensors. Other example systems and methods are also described.

An apparatus and method for implementing a technique for adaptively assigning weighting factors to position and orientation determinations in an electromagnetic or hybrid tracking system having multiple transmitters or multiple receivers. The apparatus may reduce the impact of eddy current distortion to the position and orientation determinations.

A method for identifying joining positions of workpieces includes capturing images of a joint by a camera, determining measurement data for the joining positions associated with a course of the joint from the images of the joint, determining a mathematical model of the joint course from a part of the measurement data, providing a curve based on the mathematical model for positioning a welding laser during a laser welding process along the curve.

A method for identifying joining positions of workpieces includes capturing images of a joint by a camera, determining measurement data for the joining positions associated with a course of the joint from the images of the joint, determining a mathematical model of the joint course from a part of the measurement data, providing a curve based on the mathematical model for positioning a welding laser during a laser welding process along the curve.

Provided are a measurement support device, an endoscope system, a processor for an endoscope system, and a measurement support method capable of easily and highly accurately measuring the size of a subject. In the measurement support device related to one aspect of the invention, the position of a spot by measurement auxiliary light is measured, and information indicating the actual size of a subject is acquired on the basis of the measurement result to create and display a marker. Moreover, an optical axis of the measurement auxiliary light has an inclination angle that is not 0 degrees with respect to an optical axis of the imaging optical system in a case where the optical axis of the measurement auxiliary light is projected on a plane including the optical axis of the imaging optical system.

Provided are a measurement support device, an endoscope system, a processor for an endoscope system, and a measurement support method capable of easily and highly accurately measuring the size of a subject. In the measurement support device related to one aspect of the invention, the position of a spot by measurement auxiliary light is measured, and information indicating the actual size of a subject is acquired on the basis of the measurement result to create and display a marker. Moreover, an optical axis of the measurement auxiliary light has an inclination angle that is not 0 degrees with respect to an optical axis of the imaging optical system in a case where the optical axis of the measurement auxiliary light is projected on a plane including the optical axis of the imaging optical system.

A linear displacement measuring apparatus for determining an absolute position includes a linear rail composed of individual rail segments arranged after one another in the direction of a longitudinal axis. Each of the rail segments has a material measure which comprises at least one incremental track which extends along the longitudinal axis and has equidistantly arranged position markings. In addition to the incremental track, the material measure of one of the rail segments has an absolute track with position markings for coding a plurality of absolute positions. A scanning device can be moved along the rail segments and comprises a sensor arrangement for scanning the material measures with a first sensor, a second sensor and a third sensor. The first sensor and the second sensor are offset relative to one another in the direction of the longitudinal axis and are used to detect the position markings of the incremental track.

A linear displacement measuring apparatus for determining an absolute position includes a linear rail composed of individual rail segments arranged after one another in the direction of a longitudinal axis. Each of the rail segments has a material measure which comprises at least one incremental track which extends along the longitudinal axis and has equidistantly arranged position markings. In addition to the incremental track, the material measure of one of the rail segments has an absolute track with position markings for coding a plurality of absolute positions. A scanning device can be moved along the rail segments and comprises a sensor arrangement for scanning the material measures with a first sensor, a second sensor and a third sensor. The first sensor and the second sensor are offset relative to one another in the direction of the longitudinal axis and are used to detect the position markings of the incremental track.

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.