A measuring device (10) for the interferometric shape measurement of a surface (12) of a test object (14-1; 14-2)includes (i) a diffractive optical element (26-1; 26-2) that generates a test wave (28) from incoming measurement radiation (18), wherein the diffractive optical element radiates the test wave onto the surface of the test object, (ii) a deflection element (22) that is disposed upstream of the diffractive optical element in the beam path of the measurement radiation, and (iii) a holding device (24, 124) that holds the deflection element and that changes a position of the deflection element (22) through a combination of a tilting movement and a translation movement.

A measuring device (10) for the interferometric shape measurement of a surface (12) of a test object (14-1; 14-2)includes (i) a diffractive optical element (26-1; 26-2) that generates a test wave (28) from incoming measurement radiation (18), wherein the diffractive optical element radiates the test wave onto the surface of the test object, (ii) a deflection element (22) that is disposed upstream of the diffractive optical element in the beam path of the measurement radiation, and (iii) a holding device (24, 124) that holds the deflection element and that changes a position of the deflection element (22) through a combination of a tilting movement and a translation movement.

Provided are a damage diagram creation method, a damage diagram creation device, a damage diagram creation system, and a recording medium capable of detecting damage with high accuracy based on a plurality of images acquired by subjecting a subject to split imaging. In a damage diagram creation method, damage of a subject is detected from each image (each image in a state of being not composed) constituting a plurality of images (a plurality of images acquired by subjecting the subject to split imaging), and thus, damage detection performance is not deteriorated due to deterioration of image quality in an overlapping area. Therefore, it is possible to detect damage with high accuracy based on a plurality of images acquired by subjecting the subject to split imaging. Detection results for the respective images can be composed using a composition parameter calculated based on correspondence points between the images.

A device for performing a measurement of a strand-shaped object comprises at least one transmission apparatus configured to emit measuring radiation onto the strand-shaped object, which reflects the measuring radiation. At least one receiving apparatus is configured to receive the measuring radiation reflected by the strand-shaped object. An evaluation apparatus is configured to determine at least one of (1) the diameter and (2) the outer contour of the strand-shaped object based on the measuring radiation received by the at least one receiving apparatus. At least one retroreflector is configured to surround at least a portion of the strand-shaped object and retroreflect at least some of the measuring radiation reflected by the strand-shaped object.

A device for performing a measurement of a strand-shaped object comprises at least one transmission apparatus configured to emit measuring radiation onto the strand-shaped object, which reflects the measuring radiation. At least one receiving apparatus is configured to receive the measuring radiation reflected by the strand-shaped object. An evaluation apparatus is configured to determine at least one of (1) the diameter and (2) the outer contour of the strand-shaped object based on the measuring radiation received by the at least one receiving apparatus. At least one retroreflector is configured to surround at least a portion of the strand-shaped object and retroreflect at least some of the measuring radiation reflected by the strand-shaped object.

A method of determining a material property of an object. The method comprises: obtaining a real light intensity value for each of a first number of light source positions and each of a second number of light sensor positions, the real light intensity value indicating an intensity of light from the light source position that is reflected or diffused by an object to the light sensor position; determining a three-dimensional surface of the object; and for each of a plurality of points on the three-dimensional surface of the object, using a model that has been trained by machine learning, predicting the material property for the object at the point based on the obtained real light intensity values.

An analysis apparatus includes an acquisition part that acquires a plurality of interference images based on lights having a plurality of different wavelengths from an interference measurement apparatus, a removing part that outputs an interference component by removing a non-interference component included in an interference signal for each pixel in the plurality of the interference images, a conversion part that generates an analysis signal by performing a Hilbert transformation on the interference component, and a calculation part that calculates a distance between a reference surface and a surface of an object to be measured by specifying a phase gradient of a wavelength of light radiated onto the reference surface and the surface of the object to be measured on the basis of the interference component and the analysis signal.

An analysis apparatus includes an acquisition part that acquires a plurality of interference images based on lights having a plurality of different wavelengths from an interference measurement apparatus, a removing part that outputs an interference component by removing a non-interference component included in an interference signal for each pixel in the plurality of the interference images, a conversion part that generates an analysis signal by performing a Hilbert transformation on the interference component, and a calculation part that calculates a distance between a reference surface and a surface of an object to be measured by specifying a phase gradient of a wavelength of light radiated onto the reference surface and the surface of the object to be measured on the basis of the interference component and the analysis signal.

A parameter indicating a surface property of an object surface is plotted on the horizontal axis, a normal direction change rate of the shape of the object surface is plotted on the vertical axis, the minimum normal direction change rate visible to a person is associated with the parameter indicating the surface property of the object surface to create a visible area map, the relationship between the parameter indicating the surface property of a machining surface of a workpiece, and the maximum value of the normal direction change rate of the shape of the machining surface of the workpiece is displayed on the visible area map, and the object surface is evaluated.

A parameter indicating a surface property of an object surface is plotted on the horizontal axis, a normal direction change rate of the shape of the object surface is plotted on the vertical axis, the minimum normal direction change rate visible to a person is associated with the parameter indicating the surface property of the object surface to create a visible area map, the relationship between the parameter indicating the surface property of a machining surface of a workpiece, and the maximum value of the normal direction change rate of the shape of the machining surface of the workpiece is displayed on the visible area map, and the object surface is evaluated.