Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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21/00
Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
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G01B21/20
for measuring contours or curvatures, e.g. determining profile
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