Patent classifications
G01B2210/60
Coordinate measuring machine probe identification apparatus and method
A coordinate measuring machine system has a base configured to support a workpiece, a movable portion configured to move relative to the base, and a control system configured to control movement of the base and/or the movable portion. The system also has a set of probes that each are configured to be removably couplable with the movable measurement portion. Each probe is configured to be removably couplable with the movable measurement portion, and has a shaft with a distal end and a proximal end. The proximal end has a region for coupling with the movable measurement portion, while the distal end has a region configured to interact with the workpiece. Each of the probes also has visual identifying indicia on the shaft. The visual identifying indicia are encoded to identify at least one characteristic of the probe. Specifically, the indicia are encoded as Base 3 or Base 4 indicia.
Apparatus for reading value measured with analog measuring tool
An apparatus reads a value measured with an analog measuring tool. The apparatus includes an imaging unit for obtaining a captured image of the analog measuring tool that is indicating a measured value, a retaining unit for retaining a 3D model of the analog measuring tool, a matching unit for specifying a 3D model matching the captured image, a guidance unit for outputting guidance information for correcting orientation of the analog measuring tool based on the matched 3D model, a reading unit for reading the measured value from the captured image to generate a measurement result, and an output unit for outputting the measurement result.
Coordinate measuring unit and method for recognizing measuring probe
A coordinate measuring unit includes a measuring probe and a processing device configured to compute the shape coordinates of an object to be measured on the basis of an output of the measuring probe. The measuring probe has a first identification code. The processing device includes a first determination portion configured to determine whether the first identification code outputted from the measuring probe is matched with a matching code, and a downstream determination portion configured to identify a second identification code outputted from the measuring probe to thereby recognize the measuring probe when the first identification code is matched with the matching code in the first determination portion and the measuring probe further has the second identification code. The coordinate measuring unit with the aforementioned configuration can efficiently recognize a number of measuring probes.
METHOD AND APPARATUS FOR A PRECISION POSITION SENSOR
A method and system to measure a parameter associated with a component, device, or system with a specified accuracy, including: providing one or more sensors operably disposed to detect the parameter; obtaining a coarse measurement of the parameter within a first range using the one or more sensors, wherein the first range includes minimum and maximum values for the parameter; obtaining a fine measurement of the parameter within a second range using the one or more sensors, wherein the second range is smaller than the first range and has a specified ratio to the first range that provides the specified accuracy; determining a current value of the parameter by combining the coarse and fine measurements; and providing the current value of the parameter to a communications interface, a storage device, a display, a control panel, a processor, a programmable logic controller, or an external device.
Downhole cement strain gauge
In one embodiment, a system includes a casing disposed within a wellbore, one or more data collection tools coupled to the casing, and one or more sensors disposed within an annulus of the wellbore. Each of the one or more sensors include a substrate, a strain-sensitive element coupled to the substrate, and a transceiver coupled to the substrate and configured to communicate with the one or more data collection tools.
Method and apparatus for a precision position sensor
A method and system to measure a parameter associated with a component, device, or system with a specified accuracy, including: providing one or more sensors operably disposed to detect the parameter; obtaining a coarse measurement of the parameter within a first range using the one or more sensors, wherein the first range includes minimum and maximum values for the parameter; obtaining a fine measurement of the parameter within a second range using the one or more sensors, wherein the second range is smaller than the first range and has a specified ratio to the first range that provides the specified accuracy; determining a current value of the parameter by combining the coarse and fine measurements; and providing the current value of the parameter to a communications interface, a storage device, a display, a control panel, a processor, a programmable logic controller, or an external device.
IMAGE PROCESSING METHODS AND APPARATUSES, COMPUTER READABLE STORAGE MEDIA, AND ELECTRONIC DEVICES
The present disclosure provides an image processing method, an image processing apparatus, a computer readable storage medium, and an electronic device. The method includes: in response to detecting that a camera component is turned on, controlling the camera component to collect a speckle image, the speckle image being an image formed by illuminating an object with laser speckles; detecting a target temperature of the camera component, and acquiring a corresponding reference image based on the target temperature, the reference image being an image with reference depth information and collected when calibrating the camera component; and calculating based on the speckle image and the reference image to acquire a depth image.
Sample shape measuring apparatus
A sample shape measuring apparatus includes a light source unit, an illumination optical system, a detection optical system, a light detection element, and a processing apparatus. A scanning unit relatively moves a light spot and the sample. Illumination light applied to the sample is transmitted through the sample, and light transmitted through the sample is incident on the detection optical system. The light detection element receives light. The illumination optical system or the detection optical system includes an optical member. The processing apparatus obtains a quantity of light based on a received light, calculates at least one of a difference and a ratio between the quantity of light and a reference quantity of light, calculates an amount of tilt at a surface of the sample, and calculates a shape of the sample from the amount of tilt.
Extended stylus for a coordinate measuring machine
A coordinate measuring machine for measuring coordinates or properties of a workpiece includes an extended stylus. The extended stylus includes an extension element and a connection element. The extension element includes a carrier portion mounted at the connection element so as to be rotatable about an axis of rotation. The extension element includes, on a side remote from the connection element, a shaft portion that is aligned so as to deviate from the axis of rotation. The coordinate measuring machine includes a measurement head to which the extended stylus is attached. The measurement head is configured to measure deflections of the stylus resulting from contacts of the extended stylus to the workpiece.
CMM apparatus for identifying and confirming the stylus
Various embodiments improve the performance and reliability of coordinate measuring machines by verifying that coordinate measuring machine is configured to use the appropriate probe or stylus for measuring an object. In some embodiments, confirmation that the appropriate probe or stylus is mounted is built into an automated part of the CMM's measurement process, thereby assuring that a confirmation step is performed and that the outcome is correct.