Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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2290/00
Aspects of interferometers not specifically covered by any group under G01B9/02
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G01B2290/55
Quantum effects
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