A luminous flux including laser light of different wavelengths outgoing from a light source unit is split into two luminous fluxes, the first luminous flux is focused on a sample with an objective lens, and the second luminous flux functions as reference light without radiating it onto the sample. Signal light reflected from the sample and the reference light are multiplexed by a polarized beam splitter and are made to interfere on four photodetectors out of phase in a photodetection unit. A signal processing unit acquires the optical axis distribution of an object in the sample by using the outputs of the plural photodetectors for every input wavelength, acquiring a detection signal and calculating the ratio of intensities of the detection signals at the different input wavelengths for every position in the sample.

A digitizer and processor device for a swept-source optical coherence tomography (SS-OCT) imaging system, comprising: an input configured to receive an OCT signal; a control input configured to receive a k-clock signal; a combiner unit (130) receiving the OCT signal and the k-clock signal configured to output a composite signal; a digitizing unit (60) arranged to convert the composite signal into a digital composite signal (69); a data processing unit (70) arranged to determine a profile of optical density in a sample that generated the OCT signal based on the digital composite signal (69).

A method for determining a retardance of a layer of a sample. The method includes: transmitting a first portion of a polarized light to a sample arm of an optical system and a second portion of the polarized light to a reference arm of the optical system; combining first return light returned from the sample arm and second return light from the reference arm; detecting, using a detector, the combined light along a first polarization state and a second polarization state to produce polarization data, the second polarization state being different from the first polarization state; determining, using a processor coupled to the detector, polarization states of light returning from upper and lower surfaces of a layer of the sample based on detecting the combined light; and determining, using the processor, a retardance of the layer of the sample based on the determined polarization states.

An optical distance measurer includes: a beam splitter splitting a laser beam and outputting as measurement light and reference light; a measurement light beam splitter splitting the measurement light and outputting as first measurement light and second measurement light; a reference light beam splitter splitting the reference light and outputting as first reference light and second reference light; a first optical system having a first Rayleigh length, the first optical system emitting the first measurement light to a target object; and a second optical system having a second Rayleigh length different from the first Rayleigh length, the second optical system emitting the second measurement light to the target object; a first receiver receiving the first reference light and first reflection light that is the first measurement light reflected by the target object and outputting a first receiving signal indicating the first reference light and the first reflection light; and a second receiver receiving the second reference light and second reflection light that is the second measurement light reflected by the target object and outputting a second receiving signal indicating the second reference light and the second reflection light.

An optical system includes a light source, a target device, an image detector, and an autocollimator that receives a beam of electromagnetic radiation from the light source, directs the beam to the target device, and directs the beam to the image detector. The autocollimator includes a first polarizing beam splitter that directs the beam to the target device and receives the beam reflected off of the target device, a second polarizing beam splitter that receives the beam from the first polarizing beam splitter, directs the beam to a diffraction grating device, returns diffracted electromagnetic radiation from the diffraction grating device to an array of detectors, and directs the diffractive electromagnetic radiation, a camera that measures an interference pattern of diffracted electromagnetic radiation from the second polarizing beam splitter and captures an image, and a lens assembly that focuses electromagnetic radiation from the target device to the diffraction grating device.

The invention relates to an OCT system with an OCT light source for emitting OCT light into an object beam path and a reference beam path. The system comprises a detector for detecting an interference signal produced by the object beam path and the reference beam path. A polarization-dependent delay element is arranged in the object beam path. The invention also relates to a corresponding OCT method. The invention allows the effects of parasitic reflections to be reduced.

Systems and methods for dynamic optical interferometer locking using entangled photons are provided. In certain embodiments, a system includes an optical source for generating a pair of photons. Also, the system includes first and second emitter/receivers that emit first and second photons towards first and second remote reflectors and receive reflected first and second photons along first and second optical paths. Additionally, the system includes a mode combiner for combining the reflected first photon and second photon into a first and second output port. Moreover, the system includes a coarse adjuster that performs coarse adjustments and a fine adjuster that performs fine adjustments to the first and second optical paths. Further, the system includes a plurality of photodetectors that detect photons from the first and second output ports. Additionally, the system includes a processor that controls the coarse and fine adjustments based on received signals from the photodetectors.

An apparatus comprising: a double path interferometer comprising a sample path for an object and a reference path; a source of linearly polarized light for the double path interferometer, a phase plate positioned in the sample path; means for superposing the sample path and reference path to create a beam of light for detection; means for spatially modulating the beam of light to produce a modulated beam of light; means for dispersing the modulated beam of light to produce a spatially modulated and dispersed beam of light; a first detector, a second detector, and means for splitting the spatially modulated and dispersed beam of light, wherein light of a first linear polarization is directed to the first detector and light of a second linear polarization, orthogonal to the first linear polarization, is directed to the second detector.

The interferometer 10 according to this disclosure includes: a first optical component 12 that splits each of the P polarization component and the S polarization component of the light to be measured into the first optical path R1 and the second optical path R2 and combines the light to be measured; a second optical component 13 placed in the first optical path; a third optical component 14 that splits the light to be measured into the P polarization component and the S polarization component; and a P polarization detector 11a and an S polarization detector 11b that respectively detect the P polarization component and the S polarization component split by the third optical component, wherein the second optical component has an optical surface that changes the propagation direction of the light to be measured and gives a phase difference between the P polarization component and the S polarization component.

The invention discloses a method for measuring a complex degree of coherence of a random optical field by using a mutual intensity-intensity correlation, including the steps of: building a test optical path; rotating a quarter-wave plate to enable the fast axis of the quarter-wave plate to be consistent with a polarization direction of reference light, to obtain light intensity distribution information of a first combined light; rotating the quarter-wave plate to enable the slow axis of the quarter-wave plate to be consistent with the polarization direction of the reference light, to obtain light intensity distribution information of a second combined light; blocking the reference light to obtain light intensity distribution information of to-be-tested light; blocking the to-be-tested light to obtain light intensity distribution information of the reference light; and calculating the amplitude and phase of a complex degree of coherence of the to-be-tested light.