A holographic interferometer, comprising: an imaging device capturing an interference pattern created by at least two polarized light beams; a structured phase retardation element located in an optical path of at least one polarized light beam of the at least two polarized light beams; and a polarizer located between the imaging device and the structured phase retardation element, the polarizer projects each polarization of each of the at least two polarized light beams on a single axis to create the interference pattern on the imaging device.

Devices and methods employing stationary homodyne interferometry to aid in the determination of the magnitude and polarity of electrophoretic mobility and zeta potential of particles are provided. The devices use an optical quadrature interferometer having a sample holder loadable with an electrophoresis sample chamber that may contain sample particles undergoing electrophoresis, the optical quadrature interferometer being configured to perform optical velocimetry on the particles and to generate a quadrature signal comprising characteristics related to the speeds and directions of the particles. The quadrature signal may be used to determine the speeds and directions of particles. The speeds and directions of particles may be used, together with other information, for the determination of the magnitudes and polarities of the electrophoretic mobility and zeta potential of the particles. Constraints on vibration, light source coherence length, and measurement resolution may be relaxed.

One or more devices, systems, methods and storage mediums for optical imaging medical devices, such as, but not limited to, Optical Coherence Tomography (OCT), single mode OCT, and/or multi-modal OCT apparatuses and systems, and methods and storage mediums for use with same, for performing automated polarization control, polarization diversity and/or balanced detection are provided herein. One or more embodiments may achieve polarization diversity and balanced detection (or photo-detection) under any imaging circumstances. One or more embodiments, may achieve polarization control functionality regardless of whether such control is automatic or manual. Additionally, one or more embodiments may achieve automated polarization control, may achieve balanced detection (or photo-detection), and/or may address potential disturbances, such as, but not limited to, polarization drift over time, temperature and/or mechanical perturbations or variations. One or more embodiments may include an optical receiver where polarization diversity and balanced detection may be optimized via motorized controls.

An interferometer having a fundamental beam generator, a first second harmonic generator, a waveplate, a second second harmonic generator, a harmonic separator, and a polarizing beam splitter, mounted uniaxially, (i.e., the components are aligned along one optical axis), wherein the interferometer is adapted to change a diameter of a beam to match a diameter of a sample, and to change the diameter of the beam back to its original diameter.

An interferometry system includes a plurality of coherent light sources that each generate a beam of coherent light. Separate waveguide pathways are optically associated with each coherent light source. Each separate waveguide pathway has an endpoint configured to emit at least a portion of the beam of coherent light from the associated light source. A plurality of photodetectors is optically associated with waveguide pathways. In some cases, a retroreflector receives the light emitted from the endpoints, modulates the received light, and directs the modulated light back to the endpoints. The modulated light and a portion of the coherent light reflected from the endpoint of the waveguide pathway receiving the modulated light is directed a photodetector.

The present invention relates to an apparatus and a method for measuring a thickness and a refractive index of a multilayer thin film using an angle-resolved spectral interference image according to polarization. More specifically, the present invention relates to an apparatus for measuring a thickness and a refractive index of a multilayer thin film using an angle-resolved spectral interference image according to polarization in an apparatus for measuring a thickness and a refractive index of a measurement object coated with the multilayer thin film, the apparatus including: an illumination optical module having a light source emitting light; a first beam splitter configured to reflect some of the light emitted from the illumination optical module; an objective lens configured to input some of the light reflected from the first beam splitter to the measurement object constituted by the multilayer thin film and reflect the remaining light to a reference plane to form interference light on a back focal plane; a second beam splitter in which interference light where the reflected light incident and reflected to the measurement object interferes with the reflected light reflected from the reference plane is incident, wherein some of the interference light is reflected and the remaining interference light is transmitted; a first angle-resolved spectral image acquiring unit configured to receive interference light reflected from the second beam splitter and first-polarize the interference light located in the back focal plane of the objective lens to acquire a first polarized interference image; and a second angle-resolved spectral image acquiring unit configured to receive interference light transmitted from the second beam splitter and second-polarize the interference light located in the back focal plane of the objective lens to acquire a second polarized interference image.

An ellipsometer includes a first separation unit configured to separate a first reflected light into two reflected lights, a first polarizing optical element configured to separate each of the two reflected lights into two linearly polarized lights, a first interference device configured to form an interference fringe by allowing components of the two linearly polarized lights to interfere with each other, a second separation unit configured to separate a second reflected light into two reflected lights, a second polarizing optical element configured to separate each of the two reflected lights into two linearly polarized lights, and a second interference device configured to form an interference fringe by allowing components of the two linearly polarized lights to interfere with each other.

The present disclosure relates to an apparatus and method for measuring the thickness and refractive index of a multilayer thin film by measuring angle-resolved spectral reflectance according to light polarization. According to an exemplary embodiment of the present disclosure, the apparatus and method for measuring the thickness and refractive index of a multilayer structure using angle-resolved spectroscopic reflectometry is capable of measuring and analyzing thickness and refractive index of each layer of a structure having a multilayer thin film through an s-polarized imaging and a p-polarized imaging of the reflective light located in a back focal plane of an objective lens which are acquired through an angle-resolved spectral imaging acquisition part.

A simultaneous phase-shift point diffraction interferometer and method for detecting wave aberration. The interferometer comprises an ideal spherical wave generation module, an optical system to be measured, an image plane mask, a polarization phase shift module, a two-dimensional polarization imaging photodetector and a data processing unit. Single photodetector is adopted to realize simultaneous detection of more than three phase shift interference patterns, and has the advantages that environmental interference suppression, a flexible optical path, high measurement accuracy, and calibration of system errors of the interferometer may be realized.

A broadband interferometry for a measurement range extension beyond a coherence length of a light source includes a wavelength tunable laser as the light source outputting a coherence wavelength beam; and an interferometer disposed between the wavelength tunable laser and a target to be measured and including a reference arm, a measurement arm and a device combining a reference beam and measurement mean to produce a combined interference beam, wherein a local oscillation of the reference beam is replicated by a cavity multiplication or cascading optical delayed lines with a fiber optic cavity, and quantifiable optical properties including a wavelength group delay, a chromatic dispersion, a polarization mode dispersion and a model dispersion are inserted into the local oscillation of the reference beam to incrementally quantify the replicated copies of the local oscillation as the number of the delayed copies of the local oscillation increase for extension of a measurement rage to the target.