In a substrate processing apparatus, a substrate is processed with use of a processing liquid. A first operation component and a second operation component are used in the substrate process. A first operation value of the first operation component and a second operation value of the second operation component are acquired by an operation value acquirer. Whether an abnormality has occurred is determined by an abnormality determiner based on the correlation between the first operation value and the second operation value that are acquired by the operation value acquirer.

Described herein are systems and methods for applying machine learning to telematics data to generate a unique vehicle fingerprint by periodically receiving telematics data generated at a plurality of sensors of a vehicle; standardizing the telematics data; aggregating the standardized telematics data; applying a trained machine learning model to embed the aggregated telematics data into a low-dimensional state; and generating a unique vehicle fingerprint, the vehicle fingerprint comprising a static component, a dynamic component, or both a static component and a dynamic component; including iterative repetition to update the dynamic component of the vehicle fingerprint.

Described herein are systems and methods for applying machine learning to telematics data to generate a unique vehicle fingerprint by periodically receiving telematics data generated at a plurality of sensors of a vehicle; standardizing the telematics data; aggregating the standardized telematics data; applying a trained machine learning model to embed the aggregated telematics data into a low-dimensional state; and generating a unique vehicle fingerprint, the vehicle fingerprint comprising a static component, a dynamic component, or both a static component and a dynamic component; including iterative repetition to update the dynamic component of the vehicle fingerprint.

An electronic device is provided. The electronic device includes a magnetic sensor, an acceleration sensor, and a processor operatively connected to the magnetic sensor and the acceleration sensor, wherein the processor is configured to acquire multiple pieces of first magnetic data by using the magnetic sensor in a first area where the electronic device is located, generate a virtual marker corresponding to the first area by using the multiple pieces of first magnetic data, determine the movement of the electronic device on the basis of multiple pieces of first acceleration data in a first direction, the data being acquired by using the acceleration sensor, determine the posture of the electronic device on the basis of multiple pieces of second acceleration data in a second direction that is perpendicular to the first direction, the data being acquired by using the acceleration sensor, and determine, on the basis of at least one of the movement of the electronic device and the posture of the electronic device, multiple pieces of third magnetic data to be used for comparison with the virtual marker, among multiple pieces of second magnetic data acquired within a designated radius with reference to the first area by using the magnetic sensor.

According to one embodiment, a recognition apparatus includes processing circuitry. The processing circuitry generates a first feature quantity exhibiting a feature of sensor data based on the sensor data, converts the first feature quantity into a second feature quantity exhibiting a feature contributing to identification of a class of the sensor data, generates a significant feature quantity exhibiting a feature that is significant in the identification of the class based on a cross-correlation between the first feature quantity and the second feature quantity, generates an integrated feature quantity considering features of the first feature quantity and the second feature quantity, based on the second feature quantity and the significant feature quantity, and identifies the class based on the integrated feature quantity.

According to one embodiment, a recognition apparatus includes processing circuitry. The processing circuitry generates a first feature quantity exhibiting a feature of sensor data based on the sensor data, converts the first feature quantity into a second feature quantity exhibiting a feature contributing to identification of a class of the sensor data, generates a significant feature quantity exhibiting a feature that is significant in the identification of the class based on a cross-correlation between the first feature quantity and the second feature quantity, generates an integrated feature quantity considering features of the first feature quantity and the second feature quantity, based on the second feature quantity and the significant feature quantity, and identifies the class based on the integrated feature quantity.

Enhanced resolution for a real-time clock is implemented, which includes a real-time clock configured to operate at a first time resolution, at least one processing unit configured to operate at a second time resolution, wherein the second time resolution has a higher frequency than the first time resolution, a memory for storing data at a location including data from the real-time clock and the at least one processing unit, an interrupt configured to load information into the memory at the location using the at least one processing unit, the interrupt further configured to operate at a frequency associated with the second time resolution, a timing service configured to read information from the memory at the location, the timing service configured to operate at the second time resolution, and a calibration module configured to re-calibrate the real-time clock.

Enhanced resolution for a real-time clock is implemented, which includes a real-time clock configured to operate at a first time resolution, at least one processing unit configured to operate at a second time resolution, wherein the second time resolution has a higher frequency than the first time resolution, a memory for storing data at a location including data from the real-time clock and the at least one processing unit, an interrupt configured to load information into the memory at the location using the at least one processing unit, the interrupt further configured to operate at a frequency associated with the second time resolution, a timing service configured to read information from the memory at the location, the timing service configured to operate at the second time resolution, and a calibration module configured to re-calibrate the real-time clock.

A sensor device for process variable determination in an industrial environment, comprising a sensor base and a first expansion module. The sensor base includes circuitry that determines the process variable, a first mechanical interface for mechanically accommodating a first expansion module and a first communication interface to the first expansion module for transmitting measurement and/or control data. In this case, the first expansion module has a second mechanical interface to the sensor base, a third mechanical interface for mechanically accommodating a second expansion module, a second communication interface to the sensor base for transmitting measurement and/or control data, and a third communication interface to the second expansion module for transmitting measurement and/or control data.

A sensor device for process variable determination in an industrial environment, comprising a sensor base and a first expansion module. The sensor base includes circuitry that determines the process variable, a first mechanical interface for mechanically accommodating a first expansion module and a first communication interface to the first expansion module for transmitting measurement and/or control data. In this case, the first expansion module has a second mechanical interface to the sensor base, a third mechanical interface for mechanically accommodating a second expansion module, a second communication interface to the sensor base for transmitting measurement and/or control data, and a third communication interface to the second expansion module for transmitting measurement and/or control data.