G01J1/42

Illuminating apparatus and illuminance collection system

An illuminating apparatus includes an illuminance sensor mounted on a vehicle and configured to detect an illuminance outside the vehicle as a detected illuminance, a location sensor mounted on the vehicle and configured to detect a location of the vehicle as a detected location, and a controller configured to store one or more illuminance thresholds that are thresholds of the illuminance and monitor whether there is a crossover phenomenon that the detected illuminance crosses one of the one or more illuminance thresholds. The controller is configured to transmit crossing data, including information indicating the detected location when the crossover phenomenon occurs and information indicating the detected illuminance when the crossover phenomenon occurs, to a management apparatus outside the vehicle.

Illuminating apparatus and illuminance collection system

An illuminating apparatus includes an illuminance sensor mounted on a vehicle and configured to detect an illuminance outside the vehicle as a detected illuminance, a location sensor mounted on the vehicle and configured to detect a location of the vehicle as a detected location, and a controller configured to store one or more illuminance thresholds that are thresholds of the illuminance and monitor whether there is a crossover phenomenon that the detected illuminance crosses one of the one or more illuminance thresholds. The controller is configured to transmit crossing data, including information indicating the detected location when the crossover phenomenon occurs and information indicating the detected illuminance when the crossover phenomenon occurs, to a management apparatus outside the vehicle.

METHOD OF MANUFACTURING SURFACE-EMITTING LASERS, METHOD OF TESTING SURFACE-EMITTING LASERS, AND SURFACE-EMITTING-LASER-TESTING APPARATUS
20220407284 · 2022-12-22 · ·

In a method of manufacturing surface-emitting lasers, a substrate having a major surface including a plurality of areas each provided with a plurality of surface-emitting lasers is prepared. A first laser beam emitted when a direct-current voltage is applied to each of an n number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, n being an integer of 2 or greater. A second laser beam emitted when an alternating-current voltage is applied to each of an m number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, m being a natural number smaller than n. Whether the n number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the first laser beam. Whether the m number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the second laser beam.

CONTROL SYSTEM FOR DIMMABLE FILM
20220413326 · 2022-12-29 ·

Described herein are liquid crystal (LC) assemblies that are dimmable and techniques for manufacturing LC assemblies. Example LC assemblies are described that include a flexible substrate, a twisted nematic liquid crystal, a polarizer with cellulose triacetate and an ultraviolet blocker, a polycarbonate layer, polyvinyl butyral as a connecting layer, or any combination of these features. A flexible substrate can permit an LC assembly to be applied to a window or other rigid surface, even if the surface has a three-dimensional curvature. LC assemblies featuring Guest-Host or vertical alignment configurations are also described. In some embodiments, a dimmable LC assembly is provided as part of a kit including a control unit adapted to electrically connect to the LC assembly via a cable. Both the LC assembly and the control unit can be mounted to a window or other rigid surface. The control unit can be powered using a photovoltaic cell.

Optoelectronic modules operable to recognize spurious reflections and to compensate for errors caused by spurious reflections

An optoelectronic module including a light emitter to generate light to be emitted from the module, a plurality of spatially distributed light sensitive elements arranged to detect light from the emitter that is reflected by an object outside the module, and one or more dedicated spurious-reflection detection pixels.

Limitation of noise on light detectors using an aperture

The present disclosure relates to limitation of noise on light detectors using an aperture. One example embodiment includes a system. The system includes a lens disposed relative to a scene and configured to focus light from the scene onto a focal plane. The system also includes an aperture defined within an opaque material disposed at the focal plane of the lens. The aperture has a cross-sectional area. In addition, the system includes an array of light detectors disposed on a side of the focal plane opposite the lens and configured to intercept and detect diverging light focused by the lens and transmitted through the aperture. A cross-sectional area of the array of light detectors that intercepts the diverging light is greater than the cross-sectional area of the aperture.

Systems and methods for adjusting light emitted from a display

Systems and methods for adjusting light emitted from a display of a device are provided. The adjusting includes obtaining, from light of an environment detected by at least one sensor, a measured color of light of the environment, and obtaining, from light of the environment detected by at least one sensor, a measured brightness of light of the environment. In response to the obtaining the measured color and the measured brightness of light, a color of light emitted from the display is adjusted from an initial color prior to the adjusting to a target color that matches the measured color. Further, a brightness of light emitted from the display is adjusted from an initial brightness emitted by the display prior to the adjusting to a target brightness that matches the measured brightness of light.

Laser crystallizing apparatus

A laser crystallizing apparatus includes a first light source unit configured to emit a first input light having a linearly polarized laser beam shape. A second light source unit is configured to emit a second input light having a linearly polarized laser beam shape. A polarization optical system is configured to rotate the first input light and/or the second input light at a predetermined rotation angle. An optical system is configured to convert the first input light and the second input light, which pass through the polarization optical system, into an output light. A target substrate is seated on a stage and output light is directed onto the target substrate. A monitoring unit is configured to receive the first input light or the second input light from the polarization optical system and measure a laser beam quality thereof.

Method and device for detecting a focal position of a laser beam

A method and a device for detecting a focal position of a laser beam, particularly a machining laser beam in a laser machining head, includes an optical element which is arranged in the laser beam converging toward the focal point and which is designed to outcouple a reflection from the laser beam path, and a sensor arrangement which is designed to detect beam characteristics of said laser beam in the region of the focal point in the laser extension direction, and which measures the outcoupled reflection of the laser beam at at least two locations that are offset to one another in the extension direction, in order to determine the current focal position.

Light source, optical device, measuring device, robot, electronic apparatus, movable structure, and manufacturing apparatus

According to one embodiment, a light source includes a plurality of light-emitting elements each including one or more surface-emitting lasers; and a plurality of detecting elements located on a same substrate as the light-emitting elements. The detecting elements individually detect quantities of output light of the light-emitting elements.