G01J1/58

INFORMATION PROCESSING DEVICE, IMAGE ACQUISITION SYSTEM, INFORMATION PROCESSING METHOD, IMAGE INFORMATION ACQUISITION METHOD, AND PROGRAM
20170315056 · 2017-11-02 ·

[Object] To propose an information processing device, an image acquisition system, an information processing method, an image information acquisition method, and a program which enable a position of a surface of a measurement subject to be more simply specified.

[Solution] An information processing device according to the present invention includes: a representative luminance value specifying unit configured to, when luminance values constituting a plurality of fluorescence images of a measurement subject captured while a position of the measurement subject in a thickness direction is changed are sequentially rearranged from a highest luminance value on the basis of the fluorescence images for each of the fluorescence images corresponding to respective thickness positions, extract a luminance value ranked at a predetermined position from the highest luminance value and set the extracted luminance value as a representative luminance value of the fluorescence image at the thickness position to be noted; and a surface position specifying unit configured to use the representative luminance value for each of the fluorescence images and set the thickness position corresponding to the fluorescence image that gives the maximum representative luminance value as a position corresponding to a surface of the measurement subject.

Method and system for measuring radiation and temperature exposure of wafers along a fabrication process line
09823121 · 2017-11-21 · ·

A measurement wafer device for measuring radiation intensity and temperature includes a wafer assembly including one or more cavities. The measurement wafer device further includes a detector assembly. The detector assembly is disposed within the one or more cavities of the wafer assembly. The detector assembly includes one or more light sensors. The detector assembly is further configured to perform a direct or indirect measurement of the intensity of ultraviolet light incident on a surface of the wafer assembly. The detector assembly is further configured to determine a temperature of one or more portions of the wafer assembly based on one or more characteristics of the one or more light sensors.

Method and system for measuring radiation and temperature exposure of wafers along a fabrication process line
09823121 · 2017-11-21 · ·

A measurement wafer device for measuring radiation intensity and temperature includes a wafer assembly including one or more cavities. The measurement wafer device further includes a detector assembly. The detector assembly is disposed within the one or more cavities of the wafer assembly. The detector assembly includes one or more light sensors. The detector assembly is further configured to perform a direct or indirect measurement of the intensity of ultraviolet light incident on a surface of the wafer assembly. The detector assembly is further configured to determine a temperature of one or more portions of the wafer assembly based on one or more characteristics of the one or more light sensors.

Apparatus for Digital Infrared Detection and Methods of Use Thereof
20170241908 · 2017-08-24 ·

An apparatus has a transducer with a storage phosphor that is chargeable to emit light of a first wavelength in response to an excitation light of a second wavelength from an object scene, wherein the second wavelength is longer than the first wavelength. A digital light sensor is disposed to accumulate energy from the emitted light of the transducer and to generate a signal according to the accumulated energy. A charging illumination source is configured to direct a pulsed charging illumination of a third wavelength, shorter than the first wavelength, to the storage phosphor. A control logic processor is in signal communication with the digital light sensor and the charging illumination source and controls synchronization of the timing of pulsed charging illumination and energy acquisition and readout of the digital light sensor.

Techniques for lumen maintenance and color shift compensation
09743483 · 2017-08-22 · ·

Techniques are disclosed for maintaining consistent lumen output of a lighting assembly over time. By maintaining a consistent lumen output, it is possible to maintain acceptable color stability where color mixing of multiple outputs is used. The lighting assembly may be any lighting configuration that might suffer from lumen depreciation and/or color drift over time, and may include any type(s) of light source(s) that may be monitored and driven accordingly. The lighting assembly, in addition to light source(s), includes a photo detector and a directed light source, such as a laser. The directed light source provides a golden sample for use in calibrating the photo detector, which in turn monitors lumen output of the light source(s). Drive signals are adjusted to account for lumen depreciation of the monitored light source(s).

Techniques for lumen maintenance and color shift compensation
09743483 · 2017-08-22 · ·

Techniques are disclosed for maintaining consistent lumen output of a lighting assembly over time. By maintaining a consistent lumen output, it is possible to maintain acceptable color stability where color mixing of multiple outputs is used. The lighting assembly may be any lighting configuration that might suffer from lumen depreciation and/or color drift over time, and may include any type(s) of light source(s) that may be monitored and driven accordingly. The lighting assembly, in addition to light source(s), includes a photo detector and a directed light source, such as a laser. The directed light source provides a golden sample for use in calibrating the photo detector, which in turn monitors lumen output of the light source(s). Drive signals are adjusted to account for lumen depreciation of the monitored light source(s).

Light emitting structure, photo-acoustic spectroscopy sensing device, method

A light emitting structure for a photo-acoustic spectroscopy sensing device for sensing a target gas comprises a light source configured for emitting light of an input wavelength. The light emitting structure further comprises a conversion structure that is configured for absorbing light of the input wavelength, and that is further configured for emitting light of an output wavelength. The output wavelength of the conversion structure is adapted to an absorption wavelength of the target gas. The conversion structure comprises an output conversion layer that comprises a plurality of nanoparticles. The nanoparticles of the output conversion layer are configured for emitting light of the output wavelength.

Illumination device and method for calibrating and controlling an illumination device comprising a phosphor converted LED
09736903 · 2017-08-15 · ·

An illumination device described herein includes at least a phosphor converted LED, which is configured for emitting illumination for the illumination device, a first photodetector and a second photodetector. A spectrum of the illumination emitted from the phosphor converted LED comprises a first portion having a first peak emission wavelength and a second portion having a second peak emission wavelength, which differs from the first peak emission wavelength. The first photodetector has a detection range, which is configured for detecting only the first portion of the spectrum emitted by the phosphor converted LED. The second photodetector has a detection range, which is configured for detecting only the second portion of the spectrum emitted by the phosphor converted LED. Methods are provided herein for calibrating and controlling each portion of the phosphor converted LED spectrum, as if the phosphor converted LED were two separate LEDs.

Illumination device and method for calibrating and controlling an illumination device comprising a phosphor converted LED
09736903 · 2017-08-15 · ·

An illumination device described herein includes at least a phosphor converted LED, which is configured for emitting illumination for the illumination device, a first photodetector and a second photodetector. A spectrum of the illumination emitted from the phosphor converted LED comprises a first portion having a first peak emission wavelength and a second portion having a second peak emission wavelength, which differs from the first peak emission wavelength. The first photodetector has a detection range, which is configured for detecting only the first portion of the spectrum emitted by the phosphor converted LED. The second photodetector has a detection range, which is configured for detecting only the second portion of the spectrum emitted by the phosphor converted LED. Methods are provided herein for calibrating and controlling each portion of the phosphor converted LED spectrum, as if the phosphor converted LED were two separate LEDs.

UTILITY LIGHT MALFUNCTION DETERMINATION
20170280539 · 2017-09-28 ·

A method and system for automatically determining a utility light malfunction is provided. The method includes receiving, from a first hardware device, luminance data specifying current luminance levels associated with utility light apparatuses. Location data specifying a geographical location for each utility light apparatus is retrieved and the luminance data and location data are analyzed with respect to historical luminance data and historical location data associated with the utility light apparatuses. The analysis results in determining that a group of utility light apparatuses include first current luminance levels differing from previous luminance levels of the group. A list and associated map specifying a group of geographical locations associated with the group is generated. A control signal enabling control of a vehicle is transmitted to the vehicle and associated video data is retrieved via the vehicle during travel in accordance with the map.