A supplemental device comprising: a connector configured to attach the supplemental device to an injection device in use; a sensor configured to generate sensor output dependent on an intensity of light on the sensor and having a field of view directed at a surface area of the injection device in use, the surface area being external to the supplemental device; a light source configured to generate illumination which in use can be directed out of the supplemental device onto the surface area; a shield configured to limit the field of view of the sensor such that the field of view is entirely directed at the surface area in use; and a processor configured to use the sensor output generated when illumination from the light source is reflected from the surface area to determine a property of the injection device.

A method of fabricating an optical computing device using a photonic crystal-based integrated computational element is provided. The method includes selecting a photonic crystal structure with a design suite stored in a non-transitory, computer-readable medium and obtaining a transmission spectrum for the selected photonic crystal. Further, the method includes determining a predictive power of a photonic crystal-based integrated computational element for a characteristic of a sample using the transmission spectrum and a spectral database. And adjusting the transmission spectrum to improve a predictive power of the photonic crystal-based integrated computational element for measuring a characteristic of a sample being analyzed. Also, fabricating the photonic crystal structure for the photonic crystal-based integrated computational element when the predictive power surpasses a pre-selected threshold.

A method of fabricating an optical computing device using a photonic crystal-based integrated computational element is provided. The method includes selecting a photonic crystal structure with a design suite stored in a non-transitory, computer-readable medium and obtaining a transmission spectrum for the selected photonic crystal. Further, the method includes determining a predictive power of a photonic crystal-based integrated computational element for a characteristic of a sample using the transmission spectrum and a spectral database. And adjusting the transmission spectrum to improve a predictive power of the photonic crystal-based integrated computational element for measuring a characteristic of a sample being analyzed. Also, fabricating the photonic crystal structure for the photonic crystal-based integrated computational element when the predictive power surpasses a pre-selected threshold.

A transducer such as a translinear proportional-to-absolute-temperature sensor uses two amplifiers, where each amplifier is used in a variety of modes. The first amplifier generates a measurement voltage though feedback in an analog circuit. The second amplifier samples and integrates the measurement in a switched-capacitor mode, and the output is stored on a capacitor. Then the first amplifier is set to measure its offset. The offset is sampled and integrated by the second amplifier, and the output is stored on a second capacitor. Then the first and second amplifiers are set to buffer the voltages stored on the capacitors. The measurement can then be offset-adjusted by digital or analog means. The adjusted measurement is then available to be used for calibration of, e.g., an image sensor. Other transducers, such as pressure sensors, strain sensors, gyroscopes, magnetometers, accelerometers, and xyz positioning sensors may employ the same dual amplifier approach.

A transducer such as a translinear proportional-to-absolute-temperature sensor uses two amplifiers, where each amplifier is used in a variety of modes. The first amplifier generates a measurement voltage though feedback in an analog circuit. The second amplifier samples and integrates the measurement in a switched-capacitor mode, and the output is stored on a capacitor. Then the first amplifier is set to measure its offset. The offset is sampled and integrated by the second amplifier, and the output is stored on a second capacitor. Then the first and second amplifiers are set to buffer the voltages stored on the capacitors. The measurement can then be offset-adjusted by digital or analog means. The adjusted measurement is then available to be used for calibration of, e.g., an image sensor. Other transducers, such as pressure sensors, strain sensors, gyroscopes, magnetometers, accelerometers, and xyz positioning sensors may employ the same dual amplifier approach.

An illumination device comprises one or more emitter modules having improved thermal and electrical characteristics. According to one embodiment, each emitter module comprises a plurality of light emitting diodes (LEDs) configured for producing illumination for the illumination device, one or more photodetectors configured for detecting the illumination produced by the plurality of LEDs, a substrate upon which the plurality of LEDs and the one or more photodetectors are mounted, wherein the substrate is configured to provide a relatively high thermal impedance in the lateral direction, and a relatively low thermal impedance in the vertical direction, and a primary optics structure coupled to the substrate for encapsulating the plurality of LEDs and the one or more photodetectors within the primary optics structure.

A supplemental device for use with an injection device, the supplemental device comprising: a plurality of light sources each being configured to illuminate a surface portion of an injection device, in use, with light of a different wavelength; at least one sensor for generating sensor outputs indicative of the respective intensities of light of different wavelengths reflected from the surface portion; and a processor for: controlling the plurality of light sources to illuminate the surface portion with light of first to third different wavelengths; obtaining first to third values for sensor outputs corresponding to the first to third different wavelengths respectively; performing one or more calculations using at least the first and second values to provide one or more further values; and using the third value and the or each further value, but not the first and second values, to determine a property of the injection device.

A method of correcting measured image data deviations of an image inspection system determining image data using a single measuring head and image measuring unit, by using a computer, includes measuring color spectrums of color fields using the head and unit, creating a color set from color spectrums of the head and unit, calculating spectrums from overprinting color combinations for the head and unit using a color model and the respective color set, calculating Lab color values for the head and unit based on spectrums of the head and unit, determining deviations between color values of the head and unit for supporting points, adding determined deviations to the color values of the measuring unit at the supporting points, creating an ICC profile based on corrected color values of the measuring unit for converting imprecise measured values thereof into accurate color values, and correcting imprecisely measured values of the measuring unit using the profile.

A method of making a dental restoration has the steps of capturing an image of a tooth, posterizing the image, determining a tooth color structure, providing information about a multicolored block having a block color structure, matching the tooth color structure and the block color structure, based on the matching, determining a position within the block in which the tooth color structure and the block color structure match, and machining the dental restoration from the block at the determined position. The invention helps facilitating the making of dental restorations at maximized aesthetics.

A process for producing a total match metric for matching color and appearance of a target coating and at least a specimen coating is provided. The total match metric (TMM) are produced based on color difference values (ΔE) at three or more color viewing angles, sparkle difference values (ΔS) at one or more sparkle viewing angles and flop difference value (Δf) between the target coating and the specimen coating using one or more linear functions, one or more non-linear functions, or a combination thereof. The total match metric can be used in producing matching coatings that match color and appearance of the target coating. The total match metric can be particularly useful for repair coating damages to vehicles.