In a polarimeter, a polarization modulator changes a polarization phase of an output optical pulse with a modulation function that varies in time over the duration of the optical pulse. A static polarization state analyzer, which includes a one or more static polarization component analyzers and detectors, receives the modulated optical pulse after interaction with a target medium and provides time varying intensities of the polarization components of the received pulse. A signal processing module determines a polarization property of the target medium, such as a Mueller matrix, dependent upon time varied intensities over the duration of the received optical pulse. A time-division optical multiplexer may be used to combine the outputs from multiple static polarization component analyzers to form a single time-multiplexed signal comprising a plurality of optical pulses that are separated in time and passed to a single photo-detector.

An object detection system uses a change in a linear polarization statistic between a first image at a first time and a second image at a second time to determine the presence or the likelihood of an object beneath a surface. The presence of the object may be determined by regions of anomalously high changes in the polarization statistic. The system may use a polarization change detection detector which may simultaneously capture images in multiple polarization channels. Further, the polarization change detection detector may be coupled with a laser interferometry system. Further, the polarization change detection detector may be used to capture a time series of images to determine the polarization decorrelation time for each pixel in the field of view to provide additional detail regarding an object detected beneath the surface.

An object detection system uses a change in a linear polarization statistic between a first image at a first time and a second image at a second time to determine the presence or the likelihood of an object beneath a surface. The presence of the object may be determined by regions of anomalously high changes in the polarization statistic. The system may use a polarization change detection detector which may simultaneously capture images in multiple polarization channels. Further, the polarization change detection detector may be coupled with a laser interferometry system. Further, the polarization change detection detector may be used to capture a time series of images to determine the polarization decorrelation time for each pixel in the field of view to provide additional detail regarding an object detected beneath the surface.

The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements to improve measurement accuracy are also disclosed.

The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements to improve measurement accuracy are also disclosed.

A device for determining a polarization state of an electromagnetic wave, includes a power splitter that splits an electromagnetic input wave into at least three partial waves; and at least three polarization converters for changing the polarization state of the partial waves. One of the polarization converters is associated with one of the three partial waves. The device includes an output coupler to which the partial waves are supplied after passing through the respective polarization converter and which includes at least three outputs. The output coupler is configured and the polarization converters are arranged and configured such that output waves exiting from the outputs of the output coupler have an intensity that each is dependent on one of the Stokes parameters of the input wave.

An imaging spectropolarimeter for examining targets with polarized light, the spectropolarimeter including a light source adapted to produce polarized light directed at a target. Embodiments also include a three-camera camera system defining a three-camera camera axis with a first camera unit comprising a first analyzer set at 0, a lens and a first multi-pixel sensor, a second camera unit comprising a second analyzer set at 45, a lens and a second multi-pixel sensor, and a third camera unit comprising a third analyzer set at 90, a lens and a third multi-pixel sensor. At least two beam splitters adapted to direct a portion of polarized light reflected from the target to each of the first, second and third camera units. Preferred systems include a processor adapted to produce polarimetric images of the target utilizing intensity information collected by the multi-pixel sensors.

A polarimeter for measuring a polarization rotation caused by a measurement object is provided, the polarimeter including an optically active material. The polarimeter includes a light source unit for irradiating a measurement object with light having a specific polarization; an anisotropic meta surface element for splitting reaction light, obtained by reacting the light of the specific polarization irradiated by the light source unit with the measurement object, into first and second reaction light; and a detection unit for detecting the first and second reaction light separated by the anisotropic meta surface element according to polarization. The polarization rotation caused by the measurement object may be calculated by comparing detection signals of the first and second reaction light detected by the detection unit.

An optical component can include a substrate. The optical component can include a metasurface disposed on the substrate. The metasurface can include one or more linearly birefringent elements. A spatially-varying Jones matrix and a far-field of the metasurface can define a transfer function of the metasurface configured to generate a controlled response in the far-field according to polarization of light incident on the metasurface.

A single-shot Mueller matrix polarimeter (1700), MMP, comprising: a polarization state generator (1706), PSG, arranged to receive a source optical field (1704) and provide a probe field (1708) having a plurality of spatial portions, each portion having a different polarization state; a polarization state analyser (1718), PSA, arranged to receive a modified probe field (1716) resulting from interaction of the probe field generated by the PSG with a sample under investigation, and further arranged to apply, to each of a corresponding plurality of spatial portions of the modified probe field, a plurality of retardances and a plurality of fast axis orientations; and a detector (1720) arranged to detect an output (1722) of the PSA.