A ceiling-mounted sensing unit includes (i) one or more air temperature sensors; (ii) an infrared sensor having a field of view oriented towards a floor of the room; and (iii) a microcontroller receiving readings from both the air temperature sensors and the infrared sensor, the microcontroller providing an estimated temperature at a predetermined distance above the floor of the room based on a model of the room. The model may be based on a double-exponential smoothing function obtained by matching a Kalman filter model. Alternately, the model may be itself a Kalman filter model or a machine learning trained linear model obtained using a linear regression technique, such as L2 regularization. The Kalman filter model uses a state vector that includes both the estimated temperature and a rate of change in the estimated change in temperature. The machine-trained model may be verified using a k-fold cross-validation technique.

The present subject matter proposes a novel pulse compression favourable non-periodic thermal wave imaging that enhance the energy concentration capabilities and defect detection sensitivity and resolution in comparison with presently used pulse compression favourable thermal wave imaging approaches. This is due to most of the supplied energy is concentrated in the main lobe and very less energy will be redistributed to side lobes by the proposed Complimentary Golay coded excited thermal wave imaging.

An integrated photonics chip for thermal imaging comprises a photonics substrate including a plurality of receiver elements. Each receiver element comprises a first grating coupler optically coupled to a first waveguide filter and configured to receive a first wavelength of light at a given angle, with the first waveguide filter configured to pass the first wavelength of light; and a second grating coupler optically coupled to a second waveguide filter and configured to receive a second wavelength of light at the given angle, with second waveguide filter configured to pass the second wavelength of light. Each receiver element receives the wavelengths of light from an object of interest that emits the light due to blackbody radiation, and receives the wavelengths of light at respectively different angles. Each grating coupler receives a unique wavelength of light with respect to the other wavelengths of light received by the other grating couplers.

A cooking appliance includes a cooktop having at least one heating element for heating a cookware member on or to be placed on the cooktop, the at least one heating element being adjustable between a working-power level wherein the at least one heating element is energized to generate heat and a zero-power level wherein the at least one heating element is not energized. The cooking appliance further includes a temperature sensor configured to detect a temperature or rate of temperature change of a cooking element. The cooking appliance further includes a control device configured to adjust the at least one heating element from the working-power level to the zero-power level based on the temperature or rate of temperature change of the cooking element. The at least one heating element will remain at the zero-power level until a user intervenes to re-energize the at least one heating element.

A tire temperature monitoring system, method, and associated devices for installation into a vehicle. The system and method adapted to determine the optimal tire temperature for increased vehicle performance through the collection of tire temperature, various external conditions, historical data, and predictive algorithms to inform a user to the optimal temperature through a visual display.

A method and an apparatus for determining the heating state of an optical element in a microlithographic optical system involves at least one contactless sensor which is based on the reception of electromagnetic radiation from the optical element. The radiation range captured by the sensor is varied for the purposes of ascertaining a temperature distribution in the optical element.

A scale composition determination device (10) determines that Fe.sub.2O.sub.3 has been generated in the outermost layer of a scale (SC) in the case where the absolute value of a difference between temperatures of a steel material SM measured by radiation thermometers (20a, 20b) is equal to or more than a predetermined temperature, and determines that Fe.sub.2O.sub.3 has not been generated in the outermost layer of the scale (SC) in the case where the absolute value of the difference between the temperatures of the steel material SM measured by the radiation thermometers (20a, 20b) is not equal to or more than the predetermined temperature.

The present invention designs a measurement scheme for the longitudinal temperature of the film during nitride epitaxial growth, belongs to the field of semiconductor measurement technology. Epitaxial growth technology is one of the most effective methods for preparing nitride materials. The temperature during the growth process restricts the performance of the device. The non-contact temperature measurement method is generally used to measure the temperature of the graphite disk as the base, which can't obtain the longitudinal temperature. The present invention respectively measures the surface temperature of the epitaxial layer and the temperature of the graphite disk by ultraviolet and infrared radiation temperature measurement technologies, and then uses the finite element simulation method to perform thermal field analysis from the bottom surface of the substrate to the surface of the epitaxial layer, so that the longitudinal temperature is obtained, thereby providing a favorable basis for temperature regulation during nitride growth.

A method for detecting differences in surface properties of one or more components is provided wherein the infrared radiation emitted by the component at a specific temperature of the component is detected as irradiance on a selected receiver surface relative to the component. When detecting at different positions or on a plurality of components, the solid angle covered by the receiver surface and the distance from the component surface is almost unchanged and differences in the detected irradiance can then be equated with differences in the surface properties of the components. The invention further relates to use of such methods for monitoring and optionally adjusting the surface quality of a component, as well as to a device for adjusting the surface properties in the series production of components.

Devices and corresponding methods can be provided to monitor or measure temperature of a target or to control a process. Targets can have low, unknown, or variable emissivity. Devices and corresponding methods can be used to measure temperatures of thin film, partially transparent, or opaque targets, as well as targets not filling a sensor's field of view. Temperature measurements can be made independent of emissivity of a target surface by, for example, inserting a target between a thermopile sensor and a background surface maintained at substantially the same temperature as the thermopile sensor. In embodiment devices and methods, a sensor temperature can be controlled to match a target temperature by minimizing or zeroing a net heat flux at the sensor, as derived from a sensor output signal. Alternatively, a target temperature can be controlled to minimize the heat flux.