Patent classifications
G01J2005/0074
Thermal image sensing system and thermal image sensing method
A thermal image sensing system including at least one thermal sensor, at least one light sensor, an image identification module, a storage module and a computing module is provided. The thermal sensor senses thermal radiation emitted by an object and generates a thermal radiation image signal correspondingly. The light sensor senses visible light reflected by the object and generates at least one visible light image signal correspondingly. The image identification module receives the visible light image signal generated by the light sensor and determines a material of the object according to the at least one visible light image signal. The storage module stores a radiation coefficient of the material of the object. The computing module calculates a surface temperature of the object according to the radiation coefficient of the material of the object and the thermal radiation emitted by the object. A thermal image sensing method is also provided.
EMISSIVITY INDEPENDENCE TUNING
Embodiments disclosed herein include a method of calibrating a processing tool. In an embodiment, the method comprises providing a first substrate with a first emissivity, a second substrate with a second emissivity, and a third substrate with a third emissivity. In an embodiment, the process may include running a recipe on each of the first substrate, the second substrate, and the third substrate, where the recipe includes a set of calibration attributes. In an embodiment, the method may further comprise measuring a layer thickness on each of the first substrate, the second substrate, and the third substrate. In an embodiment, the method further comprises determining if the layer thicknesses are uniform.
SPATIALLY ESTIMATING THERMAL EMISSIVITY
A technology is described for spatially estimating thermal emissivity. A method can include obtaining spectral emissivity data and satellite imaging data for a geographic area. A weighted emissivity model of emissivity values may be generated for surfaces included in the geographic area from the spectral emissivity data and the satellite imaging data, wherein the spectral emissivity data is mapped to the satellite imaging data to generate the weighted emissivity model. Thermal imaging data for the geographic area may be received from an airborne thermal imaging sensor and a thermal emissivity map can be generated for the geographic area using the thermal imaging data and the weighted emissivity model. The emissivity values from the weighted emissivity model can be used to estimate thermal emissivity values.
Multi-spectral temperature measuring device based on adaptive emissivity model and temperature measuring method thereof
A multi-spectral temperature measuring device based on adaptive emissivity model and temperature measuring method thereof are provided, which is configured to measure the temperature of the surface of an object under a high temperature background. The present invention relates to the technical field of radiation temperature measurement. The present invention provides a multi-spectral temperature measurement device based on an adaptive emissivity model, includes a pyrometer, a radiation detector, a constant temperature furnace, a cooling cavity, a cold air inlet pipe, a cold air outlet tube, and a thermocouple and thermocouple acquisition card. In order to more accurately measure the surface temperature of the object in a high-temperature environment, a BP network is provided to adaptively find the emissivity model, and through pre-training the network, the network has a high degree of recognition, and then classifies the spectral curve to accurately output the corresponding emissivity model.
Measurement device and measurement method for measuring temperature and emissivity of a measured surface
measurement device and a measurement method for measuring a temperature and an emissivity of a measured surface are provided. The measurement device includes a reflection converter, an optical receiver and a data processor. The reflection converter includes a reflector having a through hole and an absorber tube shifted between a first measurement position and a second measurement position relative to the reflector. In the first measurement position, the light incident end of the absorber tube approaches or contacts the measured surface, such that the optical receiver forms a first electrical signal. In the second measurement position, the light incident end of the absorber tube is located at or outside the through hole, such that the optical receiver forms a second electrical signal. The data processor is configured to determine a temperature and an emissivity of the measured surface according to the first electrical signal and the second electrical signal.
Cavity blackbody radiation source and method of making the same
A cavity black body radiation source is provided. The cavity black body radiation source comprises a blackbody radiation cavity, a black lacquer, and a carbon nanotube layer. The blackbody radiation cavity comprises an inner surface. The black lacquer is located on the inner surface. The carbon nanotube layer is located on a surface of the black lacquer away from the blackbody radiation cavity. The carbon nanotube layer comprises a plurality of carbon nanotubes and a plurality of microporous. A method of making the cavity blackbody radiation source is also provided.
Characterizing tropospheric boundary layer thermodynamic and refractivity profiles utilizing selected waveband infrared observations
Apparatus and methods are disclosed utilizing selected infrared waveband observations to determine selected profiles of interest. A correlative system is constructed and installed at a processor. Thermal and refractivity profiles and structure in a waveband of interest are extracted from observed infrared spectrum single waveband observations received for processing at the processor by the correlative system. The output provides the selected profiles of interest in the waveband of interest. The apparatus includes an infrared receiver and means for measuring angular displacement of received emissions relative to a horizon. The processor converts received emission into equivalent Planck blackbody temperatures across the observations and correlates structure and vertical distribution of the temperatures to provide thermodynamic and refractivity profiles of interest.
Multispectral plasmonic thermal imaging device
A computer-implemented method and thermal imaging device includes a layer of plasmonic material and a processor. The layer of plasmonic material receive electromagnetic radiation from an object and generates radiance measurements of the electromagnetic radiation at a plurality of wavelengths. The processor determines an emissivity and temperature of the object from the radiance measurements and forms a thermal-based electronic image of the object from the determined emissivity and temperature.
Multispectral plasmonic thermal imaging device
A computer-implemented method of forming a thermal-based electronic image of an object that includes receiving electromagnetic radiation emitted by the object at an optically sensitive layer including a superpixel having a plurality of pixels. Each pixel of the plurality of pixels includes a plasmonic absorber having a characteristic resonance wavelength and that generates a radiance measurement of the electromagnetic radiation at its characteristic resonance wavelength. The method further provides for determining, at a processor, an emissivity and temperature for the electromagnetic radiation received at the superpixel using the radiance measurements obtained at the pixels of the superpixel. In addition, the method provides for forming an image of the object from the determined emissivity and temperature.
Multispectral plasmonic thermal imaging device
A computer-eimplemented thermal imaging device having an optically-sensitive layer that includes a superpixel having at least one pixel. The at least one pixel includes a plasmonic absorber configured to obtain radiance measurements of electromagnetic radiation emitted from an object at a plurality of wavelengths. The device further includes a processor configured to determine an emissivity and temperature for the electromagnetic radiation received at the plasmonic material from the object using the radiance measurements and to form an image of the object from the determined emissivity and temperature.