An apparatus and method for inspecting articles incorporating positive temperature coefficient resistors. The inspection apparatus includes a computing device, a power source, a housing, a support, and a thermal imager, each mounted within an interior volume of the housing. The inspection method includes receiving a first thermal image of the unpowered article mounted within the support and receiving a second thermal image of the powered article after an optimized time delay. The method further includes outputting a health indication of the positive temperature coefficient resistors based on a comparison of the first thermal image and the second thermal image.

A system for monitoring a switchgear includes multiple infrared cameras with fields of view; a processing unit; and an output unit. The cameras acquire multiple image data of a plurality of phases of the switchgear, and the processing unit determines whether there is a phase imbalance in a specific phase comprising a determination from a plurality of image data that temperature information for a plurality of component parts and/or a plurality of connections for that specific phase has an overall enhanced temperature compared to the temperature information for the same plurality of component parts and/or the same plurality of connections for one or more other phases of the plurality of phases. The output unit is configured to output information that a fault or load imbalance has occurred in a phase.

An instrumented electric power voltage arrester includes a temperature sensor, wireless transmitter, and a visual over-temperature indicator. A disk shaped module, a replacement varister block, or a dummy block containing the sensor/transmitter is placed between varister blocks inside the arrester housing. A strap-on module is attached to the outside of the arrester housing. The sensor/transmitter utilizes a harvesting power supply that draws electric power for the electronics from the power line protected by the arrester. An ambient temperature sensor may be utilized to enhance accuracy. The temperature sensor/transmitter typically sends arrester monitoring data wirelessly to an RTU or handheld unit located outside the arrester, which relays the monitoring data to an operations control center that scheduled replacement of the arrester based on the monitoring data. A surge counter keeps track of the number of equipment and lightning related temperature surges experienced by the arrester.

A fault detection system and method includes a sensor; a processing unit; and an output unit. The sensor is configured to acquire temperature data at a sensor location of a device, wherein the temperature data comprises first temperature data and second temperature data acquired a first time period after the first temperature data. The processing unit determines a temperature magnitude comprising utilization of the first temperature data and/or the second temperature data, and determines a rate of change of temperature. The processing unit predicts a temperature at a location of the device using the temperature magnitude, the rate of change of temperature, and a correlation, wherein the correlation is a correlation of a plurality of temperature magnitudes and a plurality of rate of change of temperatures at the sensor location with a plurality of hotspot temperatures at the location.

Various embodiments include heat and volatile-organic-compounds detecting systems. In one example, the heat-detecting system includes at least one heat sensor mounted externally to a device, such as a local power-box (LPB). The heat sensor has an area-of-detection to detect heat emitted from at least one face of the LPB at one or more locations. The heat-detecting system also includes a high-absorptance infrared-collector (HAIC) formed within the LPB to collect excessive heat generated by a component within the LPB. The excessive heat is correlated to a pre-determined temperature level, and a temperature of the collected excessive heat is measured by the heat sensor. Each of the heat sensor and the HAIC are coupled to a control module. Other apparatuses, designs, and methods are disclosed.

An optically-monitored and/or optically-controlled electronic device is described. The device includes at least one of a semiconductor transistor or a semiconductor diode. An optical detector is configured to detect light emitted by the at least one of the semiconductor transistor or the semiconductor diode during operation. A signal processor is configured to communicate with the optical detector to receive information regarding the light detected. The signal processor is further configured to provide information concerning at least one of an electrical current flowing in, a temperature of, or a condition of the at least one of the semiconductor transistor or the semiconductor diode during operation.

An optically-monitored and/or optically-controlled electronic device is described. The device includes at least one of a semiconductor transistor or a semiconductor diode. An optical detector is configured to detect light emitted by the at least one of the semiconductor transistor or the semiconductor diode during operation. A signal processor is configured to communicate with the optical detector to receive information regarding the light detected. The signal processor is further configured to provide information concerning at least one of an electrical current flowing in, a temperature of, or a condition of the at least one of the semiconductor transistor or the semiconductor diode during operation.

An apparatus including a palette body, a plurality of heat distribution plates mounted on the body and positioned adjacent each other, a plurality of insulators positioned intermediate the adjacently positioned heat distribution plates, and a plurality of thermal camera calibration reference swatches including a near-ideal blackbody reference swatch, a diffuse reflective reference swatch, and a first material of the device under testing reference swatch, each reference swatch being mounted on a corresponding one of the heat distribution plates and thermally insulated from other reference swatches by the insulators.

A thermal monitoring system includes thermal monitoring devices that generate sensor data including thermal images depicting monitored elements (e.g. of an electrical switchgear system). The sensor data for all monitoring devices installed at a local deployment is collected by a gateway device, and relevant data from multiple local deployments is further aggregated by a cloud management system for further analysis. New event triggering rules determining how the thermal monitoring devices filter or record the sensor data are generated based on the aggregated data during a continuous learning process. The system detects patterns in the sensor data for the monitoring devices and/or local deployments as a whole and tracks deviations from these patterns, improving the accuracy of the event detection over time.

An apparatus for monitoring a switchgear includes: an input unit; a processing unit; and an output unit. The input unit is provides the processing unit with a monitor infra-red image of the switchgear. The processing unit implements a machine learning classifier algorithm to analyse the monitor infra-red image and determine if there is one or more anomalous hot spots in the switchgear. The machine learning classifier algorithm has been trained based on a plurality of different training infra-red images. The plurality of training infra-red images include a plurality of modified infra-red images generated from a corresponding plurality of infra-red images, each of the modified infra-red images having been modified to remove an effect of obscuration in the image. The output unit outputs information relating to the one or more anomalous hot spots.