G01J5/52

Plane source blackbody

The present invention relates to a surface source blackbody. The plane source blackbody comprises a panel, and a plurality of carbon nanotubes. The panel comprises a first surface and a second surface opposite to the first surface. A carbon nanotube array is located on the first surface of the panel. The carbon nanotube array comprises a plurality of carbon nanotubes. The plurality of carbon nanotubes are substantially perpendicular to the first surface of the panel. The carbon nanotube array has a high emissivity, so the plane source blackbody using the carbon nanotube array as a surface material has a high effective emissivity.

SYSTEMS AND APPROACHES FOR OBTAINING TEMPERATURE MEASUREMENTS USING THERMAL IMAGING
20210302238 · 2021-09-30 ·

A temperature detection system includes a housing, a thermal imaging system at least partially disposed within the housing, an arm operably coupled with and extending from the housing, and a reference illumination system operably coupled with the arm. The thermal imaging system is adapted to capture at least one thermal image of a subject. The reference illumination system includes a substrate having at least one reference calibration unit operably coupled therewith such that the substrate is at least partially constructed from a solid metal embedded therein. The at least one reference calibration unit is visible to the thermal imaging system.

System and Method for Contactless Temperature Screening
20210302235 · 2021-09-30 ·

A method is disclosed. The method includes capturing, by an infrared camera, a first image of a first temperature controlled surface having a first known temperature below a temperature threshold, the infrared camera having an array of infrared sensors, the first image having first pixels, the first pixels having first data indicative of a plurality of first temperatures; capturing, by the infrared camera, a second image of a second temperature controlled surface having a second known temperature above the temperature threshold, the second image having second pixels, the second pixels having second data indicative of a plurality of second temperatures; and calibrating a plurality of the pixels in the array of infrared sensors with the first data and the second data.

Measurement device and measurement method for measuring temperature and emissivity of a measured surface

measurement device and a measurement method for measuring a temperature and an emissivity of a measured surface are provided. The measurement device includes a reflection converter, an optical receiver and a data processor. The reflection converter includes a reflector having a through hole and an absorber tube shifted between a first measurement position and a second measurement position relative to the reflector. In the first measurement position, the light incident end of the absorber tube approaches or contacts the measured surface, such that the optical receiver forms a first electrical signal. In the second measurement position, the light incident end of the absorber tube is located at or outside the through hole, such that the optical receiver forms a second electrical signal. The data processor is configured to determine a temperature and an emissivity of the measured surface according to the first electrical signal and the second electrical signal.

Cavity blackbody radiation source and method of making the same

A cavity black body radiation source is provided. The cavity black body radiation source comprises a blackbody radiation cavity, a black lacquer, and a carbon nanotube layer. The blackbody radiation cavity comprises an inner surface. The black lacquer is located on the inner surface. The carbon nanotube layer is located on a surface of the black lacquer away from the blackbody radiation cavity. The carbon nanotube layer comprises a plurality of carbon nanotubes and a plurality of microporous. A method of making the cavity blackbody radiation source is also provided.

Plane source blackbody

The present invention relates to a plane source blackbody. The plane source blackbody comprises a panel, a black lacquer layer, and a carbon nanotube array. The panel comprises a first surface and a second surface opposite to the first surface. The black lacquer layer and the carbon nanotube array are located on the first surface. The carbon nanotube array comprises a plurality of carbon nanotubes. Each of the carbon nanotubes comprises a top end and a bottom end. The bottom end of each of the carbon nanotubes is immersed into the black lacquer layer and the top end of each of the carbon nanotubes is exposed out from the black lacquer layer. The plurality of carbon nanotubes are substantially perpendicular to the first surface of the pane.

DEPOSITION APPARATUS AND METHOD FOR INSPECTING NOZZLE USING THE SAME

A method for inspecting a nozzle includes: measuring a temperature of the nozzle; comparing the temperature of the nozzle with a reference temperature; and determining whether or not the nozzle is clogged based on the temperature of the nozzle.

DEPOSITION APPARATUS AND METHOD FOR INSPECTING NOZZLE USING THE SAME

A method for inspecting a nozzle includes: measuring a temperature of the nozzle; comparing the temperature of the nozzle with a reference temperature; and determining whether or not the nozzle is clogged based on the temperature of the nozzle.

RADIOMETRIC MODELING FOR OPTICAL IDENTIFICATION OF SAMPLE MATERIALS

Methods and systems for implementing and utilizing radiometric characterization in combination with reference material characterization of an optical sensor to more accurately and efficiently measure material properties are disclosed. In some embodiments, a method for for optically measuring material properties includes an optical sensor being radiometrically characterized based on measured optical responses. A model is generated and includes model components of the optical sensor. A parameterized model is generated by fitting n variable parameters of the model components using the optical responses. The optical sensor is utilized to measure an optical response to a reference material and a re-parameterized model is generated by re-fitting m of the n variable parameters of the model components based, at least in part, on the measured optical response to the reference material, wherein m is less than n.

DIVIDED-APERTURE INFRA-RED SPECTRAL IMAGING SYSTEM
20210123810 · 2021-04-29 ·

Various embodiments disclosed herein describe a divided-aperture infrared spectral imaging (DAISI) system that is adapted to acquire multiple IR images of a scene with a single-shot (also referred to as a snapshot). The plurality of acquired images having different wavelength compositions that are obtained generally simultaneously. The system includes at least two optical channels that are spatially and spectrally different from one another. Each of the at least two optical channels are configured to transfer IR radiation incident on the optical system towards an optical FPA unit comprising at least two detector arrays disposed in the focal plane of two corresponding focusing lenses. The system further comprises at least one temperature reference source or surface that is used to dynamically calibrate the two detector arrays and compensate for a temperature difference between the two detector arrays.