A multi-point measurement of a scene captured in an image frame may be used to process the image frame, such as by applying white balance corrections to the image frame. In some examples, the image frame may be segmented into portions that are illuminated by different illumination sources. Different portions of the image frame may be white balanced differently based on the color temperature of the illumination source for the corresponding portion. Infrared measurements of multiple points in the scene may be used to determine a characteristic of the illumination source of different portions of the scene. For example, a picture that includes indoor and outdoor portions may be illuminated by at least two illumination sources that produce different infrared measurements values. White balancing may be applied differently to these two portions to correct for color temperature of the different sources.

A multi-point measurement of a scene captured in an image frame may be used to process the image frame, such as by applying white balance corrections to the image frame. In some examples, the image frame may be segmented into portions that are illuminated by different illumination sources. Different portions of the image frame may be white balanced differently based on the color temperature of the illumination source for the corresponding portion. Infrared measurements of multiple points in the scene may be used to determine a characteristic of the illumination source of different portions of the scene. For example, a picture that includes indoor and outdoor portions may be illuminated by at least two illumination sources that produce different infrared measurements values. White balancing may be applied differently to these two portions to correct for color temperature of the different sources.

Systems and methods for measuring temperature in an environment by creating a first beam having an energy of about 50 mJ/pulse, and a pulse duration of about 100 ps. A second beam is also created, having an energy of about 2.3 mJ/pulse, and a pulse duration of about 58 ps. The first beam and the second beam are directed into a probe region, thereby expressing an optical output. Properties of the optical output are measured at a sampling rate of at least about 100 kHz, and temperature measurements are derived from the measured properties of the optical output. Such systems and methods can be used to measure temperature in environments exhibiting highly turbulent and transient flow dynamics.

An organic light emitting diode analyzer is provided to test electrical and spectroscopic characteristics organic light emitting diodes (OLED). The analyzer includes a spectrometer, a luminance and color meter, a header of the luminance and color meter, an OLED a source meter, an OLED holder and a computer. The OLED analyzer is a characterization system to measure the electrical and spectral characteristics and feature of the OLED. The luminance and color meter includes a color sensor, and the luminance and color meter measures a luminance of the OLED, a color temperature of the OLED, and color coordinates of the OLED. The spectrometer measures a wavelength of the OLED, an irradiance, a color index, the color temperature, color coordinates and the irradiance (W/m.sup.2.Math.nm). The source meter applies positive voltages to the OLED, and the source meter measures a current through the OLED.

A system for drying an electrode includes a drying unit which dries an electrode which is moving on a transfer line; a thermal imaging camera which photographs a surface of the electrode in real time; a calculation unit which stores an image taken by the thermal imaging camera, and generates temperature distribution data in a width direction of the electrode from the image; and an output unit which outputs the image and the temperature distribution data in a width direction of the electrode.

Disclosed herein is a sensor system including four interconnected resistors, where two of the resistors are photoconductive detectors, where the photoconductive detectors are illuminated with light at least at two different wavelengths, where two of the resistors does not change their resistance due to the illumination, where an external voltage is applicable to the sensor system, where a differential voltage is measurable, which depends on the resistance changes of the illuminated photoconductive detectors, where the differential voltage gives a mathematical ratio of the four respective resistances.

A radiation temperature measuring device includes: an infrared sensor that detects a wavelength including an absorption band by atmosphere; an absorption rate calculation unit that calculates an absorption rate by the atmosphere when measuring a surface temperature of an object from output of the infrared sensor; an output storage unit that stores conversion information for converting the output of the infrared sensor into the surface temperature of the object; a surface temperature calculation correction unit that calculates the surface temperature of the object from the output of the infrared sensor, the absorption rate calculated by the absorption rate calculation unit, and the conversion information; and an absorption rate storage unit that stores in advance the absorption rate by the atmosphere when the conversion information is set, in which the calculated surface temperature of the object is corrected with the absorption rate stored in the absorption rate storage unit.

A system for monitoring brick in a rotary kiln includes an infrared sensor and a computing system configured to: obtain a digital model of a brick layer of a rotary kiln having a plurality of bricks, wherein the digital model of the brick layer is based on a measured brick thickness correlated with a measured infrared temperature for each brick; obtain infrared data of the rotary kiln with the at least one infrared imaging sensor; determine the measured infrared temperature for each brick; determine a brick thickness of a first brick in the brick layer of the rotary kiln based on the measured infrared temperature assigned to the first brick with the digital model of the brick layer; and provide the brick thickness of the first brick in a brick thickness report.

A system for monitoring brick in a rotary kiln includes an infrared sensor and a computing system configured to: obtain a digital model of a brick layer of a rotary kiln having a plurality of bricks, wherein the digital model of the brick layer is based on a measured brick thickness correlated with a measured infrared temperature for each brick; obtain infrared data of the rotary kiln with the at least one infrared imaging sensor; determine the measured infrared temperature for each brick; determine a brick thickness of a first brick in the brick layer of the rotary kiln based on the measured infrared temperature assigned to the first brick with the digital model of the brick layer; and provide the brick thickness of the first brick in a brick thickness report.

Aspects of the present disclosure describe rapid temperature measurement by wavelength modulation spectroscopy (WMS) that determines gas temperature from 2ƒ signals from two absorption lines by WMS methodologies even when the gas concentration is sufficiently high to saturate optical absorptions. In sharp contrast to the prior art, rapid temperature measurement by WMS according to aspects of the present disclosure employs both a 2ƒ signal ratio and gas concentration determined from the 2ƒ signal.