Patent classifications
G01J5/70
Temperature compensation in infrared imaging systems and methods
Techniques for facilitating temperature compensation are provided. In one example, an infrared imaging system includes a focal plane array configured to capture radiation from a scene and generate image data based on the radiation. The focal plane array further captures radiation from an element associated with the infrared imaging system during capture of the radiation from the scene. The infrared imaging system further includes a temperature sensor configured to determine a temperature of the focal plane array. The infrared imaging system further includes a processing circuit configured to determine a temperature associated with the element based on the temperature of the focal plane array. The processing circuit is further configured to determine a temperature associated with an object in the scene based on the infrared image data, the temperature associated with the element, and the temperature of the focal plane array. Related devices and methods are also provided.
Reflectivity measurement apparatus and method of measuring reflectivity therefor
In a heating appliance comprising a substrate for receiving an item of cookware, a method of measuring reflectivity comprises emitting a time-varying electromagnetic signal from a first side of the substrate, a portion of the time-varying electromagnetic signal propagating through the substrate. Electromagnetic radiation is then received at the first side of the substrate, the received electromagnetic radiation comprising a background ambient component received and a component reflected by the substrate. A gain factor is applied to translate the received electromagnetic radiation to a receive electrical signal. An offset signal component is then identified from the receive electrical signal, the offset signal component arising from the background ambient component of the received electromagnetic radiation. The gain factor from the offset signal component is then estimated using a characterisation of the offset signal component, and the reflectivity is calculated using the receive electrical signal and the estimated gain factor.
Non-contact temperature measurement in thermal imaging systems and methods
- Louis Tremblay ,
- Pierre M. Boulanger ,
- Justin Muncaster ,
- James Klingshirn ,
- Robert Proebstel ,
- Giovanni Lepore ,
- Eugene Pochapsky ,
- Katrin Strandemar ,
- Nicholas Högasten ,
- Karl Rydqvist ,
- Theodore R Hoelter ,
- Jeremy P. Walker ,
- Per O. Elmfors ,
- Austin A. Richards ,
- Dylan M. Rodriguez ,
- John C. Day ,
- Hugo Hedberg ,
- Tien Nguyen ,
- Fredrik Gihl ,
- Rasmus Loman
Systems and methods include an image capture component configured to capture infrared images of a scene, and a logic device configured to identify a target in the images, acquire temperature data associated with the target based on the images, evaluate the temperature data and determine a corresponding temperature classification, and process the identified target in accordance with the temperature classification. The logic device identifies a person and tracks the person across a subset of the images, identify a measurement location for the target in a subset of the images based on target feature points identified by a neural network, and measure a temperature of the location using corresponding values from one or more captured thermal images. The logic device is further configured calculate a core body temperature of the target using the temperature data to determine whether the target has a fever and calibrate using one or more black bodies.
Non-contact temperature measurement in thermal imaging systems and methods
- Louis Tremblay ,
- Pierre M. Boulanger ,
- Justin Muncaster ,
- James Klingshirn ,
- Robert Proebstel ,
- Giovanni Lepore ,
- Eugene Pochapsky ,
- Katrin Strandemar ,
- Nicholas Högasten ,
- Karl Rydqvist ,
- Theodore R Hoelter ,
- Jeremy P. Walker ,
- Per O. Elmfors ,
- Austin A. Richards ,
- Dylan M. Rodriguez ,
- John C. Day ,
- Hugo Hedberg ,
- Tien Nguyen ,
- Fredrik Gihl ,
- Rasmus Loman
Systems and methods include an image capture component configured to capture infrared images of a scene, and a logic device configured to identify a target in the images, acquire temperature data associated with the target based on the images, evaluate the temperature data and determine a corresponding temperature classification, and process the identified target in accordance with the temperature classification. The logic device identifies a person and tracks the person across a subset of the images, identify a measurement location for the target in a subset of the images based on target feature points identified by a neural network, and measure a temperature of the location using corresponding values from one or more captured thermal images. The logic device is further configured calculate a core body temperature of the target using the temperature data to determine whether the target has a fever and calibrate using one or more black bodies.
Infrared imaging device and fixed pattern noise data generation method
Provided here are: an infrared imaging element that receives infrared light to capture a thermal image; an element temperature sensor that detects a temperature of the infrared imaging element; an FPN memory that stores therein FPN data at each of the temperatures; a frame memory that saves a plurality of pieces of frame data composed of thermal images captured by the infrared imaging element in a fixed period of time; and an FPN data generation unit that, when an imaging target is determined not to have changed on the basis of the frame data, acquires from the FPN memory, the FPN data corresponding to the temperature of the infrared imaging element at which said frame data were obtained; and performs averaging processing between average values AF of the plurality of pieces of frame data and the thus-acquired FPN data, to thereby regenerate the FPN data in an updated manner.
Infrared imaging device and fixed pattern noise data generation method
Provided here are: an infrared imaging element that receives infrared light to capture a thermal image; an element temperature sensor that detects a temperature of the infrared imaging element; an FPN memory that stores therein FPN data at each of the temperatures; a frame memory that saves a plurality of pieces of frame data composed of thermal images captured by the infrared imaging element in a fixed period of time; and an FPN data generation unit that, when an imaging target is determined not to have changed on the basis of the frame data, acquires from the FPN memory, the FPN data corresponding to the temperature of the infrared imaging element at which said frame data were obtained; and performs averaging processing between average values AF of the plurality of pieces of frame data and the thus-acquired FPN data, to thereby regenerate the FPN data in an updated manner.
Systems, methods, and computer program products for detection limit determinations for hyperspectral imaging
Systems, methods, and computer program products for thermal contrast determinations are provided. An example imaging system includes a first infrared (IR) imaging device that generates first IR image data of a field of view of the first IR imaging device and a computing device connected with the first IR imaging device. The computing device receives probe temperature data from a temperature probe indicative of an external environment of the imaging system and receives the first IR image data from the first IR imaging device. The computing device determines background temperature data based upon the first IR image data, determines gas temperature data based upon the probe temperature data, and determines a thermal contrast for each pixel based upon a comparison between the background temperature data and the gas temperature data. The computing device further determines a detection limit for each pixel as a function of thermal contrast.
Method for manufacturing a detection device comprising an encapsulation structure comprising a thin opaque layer resting on a mineral peripheral wall
A method for manufacturing a detection device includes steps of: producing thermal detectors distributed in a detection array and a compensation array using mineral sacrificial layers; producing an encapsulation structure comprising a thin opaque layer extending above the compensation array; partially removing the mineral sacrificial layers by chemical etching, so as to release the detection array and the compensation array, and to obtain the peripheral wall then formed of a non-etched portion of the mineral sacrificial layers and surrounding the compensation array, the thin opaque layer then being suspended above the compensation array and resting on the peripheral wall.
Method for manufacturing a detection device comprising an encapsulation structure comprising a thin opaque layer resting on a mineral peripheral wall
A method for manufacturing a detection device includes steps of: producing thermal detectors distributed in a detection array and a compensation array using mineral sacrificial layers; producing an encapsulation structure comprising a thin opaque layer extending above the compensation array; partially removing the mineral sacrificial layers by chemical etching, so as to release the detection array and the compensation array, and to obtain the peripheral wall then formed of a non-etched portion of the mineral sacrificial layers and surrounding the compensation array, the thin opaque layer then being suspended above the compensation array and resting on the peripheral wall.
Infrared temperature measurement method, apparatus, and device, and storage medium
An infrared temperature measurement method, apparatus, device, and storage medium, which relate to the field of image processing is disclosed. The method comprises: determining a measurement temperature of a to-be-measured target based on a grayscale image captured to obtain a first measurement temperature; determining key point coordinates of the target based on a target image; determining a first distance based on the key point coordinates and configuration information of an infrared temperature measurement device, the first distance is a distance between the target and the infrared temperature measurement device; determining an actual temperature of the target based on the first measurement temperature and the first distance. In this way, the target image ranging and grayscale image temperature measurement can be combined, which not only reduces the influence of distance on the measurement temperature, but also avoids the problem of inaccurate measurement temperature when the distance does not meet the requirements.