G01J2009/002

ADAPTIVE OPTICAL APPARATUS, OPTICAL SYSTEM, AND OPTICAL WAVEFRONT COMPENSATION METHOD

An adaptive optical apparatus includes a first deformable mirror that includes a reflecting surface reflecting light propagated through an atmosphere, and a drive unit having a plurality of drive elements and changing an uneven shape of the reflecting surface, a second deformable mirror that includes a reflecting surface reflecting the light from the first deformable mirror and a drive unit having a plurality of drive elements and changing an uneven shape of the reflecting surface, a detector that detects light intensity of the light from the first deformable mirror and the second deformable mirror, and a controller that controls the drive unit of each of the first deformable mirror and the second deformable mirror. The controller is configured to execute a first update operation of controlling the drive unit of one deformable mirror based on a detected value by the detector.

METHOD AND OPTICAL SYSTEM FOR ACQUIRING THE TOMOGRAPHICAL DISTRIBUTION OF WAVE FRONTS OF ELECTROMAGNETIC FIELDS

The invention relates to a method for the two-dimensional reconstruction of wave fronts (104) of light for use in an optical system (100) comprising: measuring the distribution function of the light intensity in at least two images at different optical planes (101, 102) having an optical path difference. In particular this method is suitable for probing the tomographical distribution of wave fronts of electromagnetic fields with an image detector, e.g. any standard two-dimensional camera.

On-Chip Wavefront Sensor, Optical Chip, and Communication Device
20240039628 · 2024-02-01 ·

An on-chip wavefront sensor, an optical chip, and a communication device are disclosed. The on-chip wavefront sensor includes an antenna array configured for separating received spatial light to obtain a plurality of sub-light spots; a reference light source module configured for generating a plurality of intrinsic light beams; a phase shifter array configured for performing phase shifting processing on the intrinsic light beams to obtain reference light; and an optical detection module configured for performing coherent balanced detection according to the reference light and the sub-light spots to obtain a photocurrent corresponding to each of the sub-light spots.

Optical apparatus
11896303 · 2024-02-13 · ·

An optical apparatus is comprising an optical imaging arrangement generating either an image of the original object field or the field of the original sample at the pupil plane which consist of both amplitude and phase information. The apparatus is further comprising a digital adaptive optics arrangement with a wave front sensor and a computing unit, which is adapted to generate at least one orthogonally translated digital copy of the original sample object field at the spatial Fourier or pupil plane and to analytically calculate a wave front error based on the phase difference between the original sample wave front and its digital copy or copies.

WAVEFRONT SENSOR, WAVEFRONT MEASUREMENT APPARATUS, METHOD OF MANUFACTURING OPTICAL ELEMENT, AND METHOD OF MANUFACTURING OPTICAL SYSTEM
20190361226 · 2019-11-28 ·

A wavefront sensor includes a splitting element configured to split an incident light beam into a plurality of light beams, an image sensor configured to receive the plurality of light beams, and a processing unit configured to calculate a wavefront of the incident light beam based on an intensity distribution of the plurality of light beams received by the image sensor. The splitting element is either in direct contact with the image sensor or in contact with the image sensor via a plate glass. In the calculation of the wavefront, the processing unit corrects a relative positional deviation between the splitting element and the image sensor by calculating a rotation about a rotation axis.

ARRANGEMENT AND METHOD FOR WAVEFRONT ANALYSIS

The present invention relates to an arrangement and to a method for wavefront analysis comprising a radiation source (8) that emits an electromagnetic wavefront of electromagnetic radiation (1) to be analyzed; a spatially resolving detector unit (4, 4a, 4b, 4c) for detecting the electromagnetic wavefront; and an electronic evaluation unit (5, 7) connected to the detector unit (4, 4a, 4b, 4c). The at least one beam guidance unit (3) for guiding the electromagnetic radiation (1), that is only diffractive and/or reflective, has at least one opening (3a, 3b, 3c) and the detector unit (4, 4a, 4b, 4c) is arranged behind the at least one opening (3a, 3b, 3c) of the beam guidance unit (3) in the direction of propagation of the electromagnetic radiation (1) for detecting a diffraction pattern of the electromagnetic radiation (1) diffracted at the at least one opening (3a, 3b, 3c).

METHOD AND DEVICE FOR ANALYSING AN ELECTROMAGNETIC WAVE IN HIGH DEFINITION
20190285481 · 2019-09-19 · ·

The present invention relates to a method comprising reception of an incident electromagnetic wave (9) by a diffractive element (2) and conversion of this incident electromagnetic wave (9) into a diffracted electromagnetic wave (10) by the diffractive element (2); reception of the diffracted electromagnetic wave (10) by a matrix-array sensor (4) comprising a matrix-array of pixels that are aligned along one or two axes of pixel alignment (13, 14). The method comprises a plurality of acquisitions, by the matrix-array sensor (4), of a signal of the diffracted electromagnetic wave (10) corresponding to a plurality of relative positions between the diffractive element (2) and the matrix-array sensor (4). The invention also relates to a device (1) implementing this method.

WAVEFRONT SENSOR AND METHOD OF RECONSTRUCTING DISTORTED WAVEFRONTS
20190265107 · 2019-08-29 ·

A wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.

ADAPTIVE OPTICS SYSTEM AND OPTICAL DEVICE

The present invention is intended to provide an adaptive optics system and an optical device that allow correction of wavefront phase aberration with higher accuracy than before and have a wider correction range than the conventional ones, regardless of the distance between the observation target and the fluctuation layer, and the size of the observation target. An adaptive optics system includes: a wavefront phase modulator that makes aberration correction to incident light and emits the corrected light; and an imaging-conjugated position adjustment mechanism that adjusts freely within a specimen the position of a surface imaging-conjugated with a fluctuation correction surface formed by the wavefront phase modulator. The imaging-conjugated position adjustment mechanism adjusts the fluctuation correction surface to be imaging-conjugated with a fluctuation layer existing in the specimen.

Optical system phase acquisition method and optical system evaluation method

When the optical system is illuminated with an illumination light flux emitted from one extant input image point, an interference image generated by superimposing an extant output light flux output from the optical system and a reference light flux coherent with the extant output light flux is imaged to acquire interference image data, and thus to acquire measured phase distribution, and this acquisition operation is applied to each extant input image point. Thus, each measured phase distribution is expanded by expanding functions n(u, v) having coordinates (u, v) on a phase defining plane as a variable to be represented as a sum with coefficients n{Ajn.Math.n(u, v)}. When the optical system is illuminated with a virtual illumination light flux, a phase (u, v) of a virtual output light flux is determined by performing interpolation calculation based on coordinates of a virtual light emitting point.