Provided is an operating method of a measuring apparatus measuring a wavefront of a target. The operating method includes measuring a measurement wavefront on the basis of the wavefront of the target, measuring reference slope information and first to third slope information respectively corresponding to a reference direction and first to third directions on the basis of the measurement wavefront, obtaining first to third rotation angles on the basis of the measured reference slope information and first to third slope information, and outputting a wavefront of which an error is corrected, which is generated by rotation errors on the basis of the obtained first to third rotation angles, wherein the first to third rotation angles are differences in angle between the reference direction and the first to third directions.

A wavefront measurement device includes: a phase modulation unit having a spatial light modulator on which incident light is incident; a pattern generation unit configured to generate a phase pattern to be inputted to the spatial light modulator; an imaging unit having an imaging region for imaging an image of a portion of the incident light modulated by the spatial light modulator as measurement light; and an analysis unit configured to analyze a wavefront of the incident light based on an imaging result by the imaging unit, in which the pattern generation unit generates a plurality of phase patterns for which a measurement virtual pattern is shifted to positions different from each other such that a focused spot of the measurement light modulated by the spatial light modulator shifts over time to different positions in the imaging region.

Disclosed is a method for determining a wavefront gradient, the method involving irradiating a transmission filter unit with a light and measuring the intensity of light transmitted, followed by another irradiating and measuring of the light transmitted, and calculating a spatial contrast K from a difference of the first intensity and the second intensity and also calculating a local wavefront gradient from the K value and a calibration factor c.

A telescope includes a light beam splitting device disposed on an optical axis of the telescope, the light beam splitting device including a plurality of mirror surfaces configured to split a beam of light incident on the telescope into a plurality of beams of light; and a mounting device configured to mount a plurality of optical detectors to the telescope such that the plurality of optical detectors respectively correspond to the plurality of beams of light split by the light beam splitting device.

A relatively high-resolution image from a conventional camera can be computationally combined with a relatively low-resolution wavefront measurement from, for example, a Shack-Hartmann sensor in order to construct a relatively high-resolution light-field image.

In an optical wavefront measuring device, a SLM generates a plurality of different through holes, so that light beams pass through the through holes and form a plurality of light patterns. The distance between an infinite objective lens module and a test lens is adjusted so that the light patterns enter into a wavefront sensor in the form of approximately parallel light after passing through the infinite objective lens module and the test lens. The wavefront sensor captures a plurality of WS images which do not have a fold-over phenomenon according to the light patterns. Computer by using an algorithm to obtain wavefront change information, and then reconstructs a wavefront on the basis of the wavefront change information.

A method for performing optical wavefront sensing includes providing an amplitude transmission mask having a light input side, a light output side, and an optical transmission axis passing from the light input side to the light output side. The amplitude transmission mask is characterized by a checkerboard pattern having a square unit cell of size . The method also includes directing an incident light field having a wavelength to be incident on the light input side and propagating the incident light field through the amplitude transmission mask. The method further includes producing a plurality of diffracted light fields on the light output side and detecting, at a detector disposed a distance L from the amplitude transmission mask, an interferogram associated with the plurality of diffracted light fields. The relation

[00001]$0<L<\frac{1}{8}.Math.\frac{{}^2}{}.Math..Math.\mathrm{or}.Math..Math.\frac{1}{4}.Math.\frac{{}^2}{}.Math.\left(2.Math.n-1\right)<L<\frac{1}{4}.Math.\frac{{}^2}{}.Math.\left(2.Math.n+1\right)$

is satisfied, where n is an integer greater than zero.

The disclosure relates to a method for characterizing and operating a display, such as a light-field display or a display with or without a phase screen, comprising: an input stage wherein at least one test signal is provided as input to the display, a capture stage for obtaining display output information, said capture stage comprising capturing, by at least one acquisition system placed at a distance from the display, an impulse response of the display in response to the at least one provided test signal, wherein said capturing of an impulse response comprises measuring the at the at least one acquisition system received intensity distribution of the light emitted by the display in response to the at least one test signal, and/or capturing the wavefront phase of the light emitted by the display in response to the at least one test signal.

Disclosed is a method for obtaining a transverse phase gradient of a wave field from at least a first and a second wavefield intensity map comprising the steps of: capturing at a first incoherent tilt aberration said first wave field intensity map of a target at a first degree of incoherent tilt aberration, using a filter positioned between a source of electromagnetic radiation and an electromagnetic radiation detector capturing said first wave field intensity map: capturing at a second and different incoherent tilt aberration said second wave field intensity map of said target at a second degree of incoherent tilt aberration, using a filter positioned between a source of electromagnetic radiation and an electromagnetic radiation detector capturing said second wave field intensity map: determining said transverse phase gradient on the basis of at least a difference of logarithms of wavefield intensity maps divided by the magnitude of the difference between said first incoherent tilt aberration and said second incoherent tilt aberration. An imaging system, a computer program product and a use of the method is further disclosed.

Conformal imaging vibrometer using adaptive optics with scene-based wave front sensing. An extended object is located at the first end of a link, and a reference-free, adaptive optical, conformal imaging vibrometer using scene-based wave front sensing is located at the second end of the link. An aberrated, free space or guided-wave path exists between the ends of the link. The adaptive optical system compensates for path distortions. Using a single interrogation beam, whole-body vibrations of opaque and reflective objects can be probed, as well as transparent and translucent objects, the latter pair employing a Zernike heterodyne interferometer.