Patent classifications
G01J9/02
MEASUREMENT APPARATUS OF WAVEFRONT AND POLARIZATION PROFILE OF VECTORIAL OPTICAL FIELDS
An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
OPTICAL SENSOR
The disclosure relates to multifunctional sensors for mobile applications, namely to a miniature optical sensor for remote micro- and macro-object detection and characterization. The disclosure makes it possible to reduce the size of the sensor, this provides for surface mount of the sensor in any microcircuit of a mobile device. The sensor is multifunctional, low-power, vibration-resistant. The sensor comprises at least one pair consisting of a radiation source and a corresponding radiation receiver, an optical circuit including a collimating element, a first optical element, a second optical element. The first optical element and the second optical element are interconnected by a common surface, the common surface being a semitransparent surface. The sensor may be used simultaneously as a microphone, a dust sensor, a lidar, and a photoplethysmogram (PPG) sensor.
OPTICAL SENSOR
The disclosure relates to multifunctional sensors for mobile applications, namely to a miniature optical sensor for remote micro- and macro-object detection and characterization. The disclosure makes it possible to reduce the size of the sensor, this provides for surface mount of the sensor in any microcircuit of a mobile device. The sensor is multifunctional, low-power, vibration-resistant. The sensor comprises at least one pair consisting of a radiation source and a corresponding radiation receiver, an optical circuit including a collimating element, a first optical element, a second optical element. The first optical element and the second optical element are interconnected by a common surface, the common surface being a semitransparent surface. The sensor may be used simultaneously as a microphone, a dust sensor, a lidar, and a photoplethysmogram (PPG) sensor.
DEVICE AND METHOD FOR DETECTING WAVEFRONT ERROR BY MODAL-BASED OPTIMIZATION PHASE RETRIEVAL USING EXTENDED NIJBOER-ZERNIKE THEORY
The disclosure provides a device for detecting a wavefront error by modal-based optimization phase retrieval using an extended Nijboer-Zernike (ENZ) theory. The detection device includes a point light source (1), a half mirror (2), a lens (3) to be tested, a plane mirror (4) and an image sensor (5). The wavefront error of the component under test is characterized by using a Zernike polynomial, and a Zernike polynomial coefficient is solved based on an ENZ diffraction theory. The present disclosure realizes the one-time full-aperture measurement on the wavefront error of a large-aperture optical component, and can use a partially overexposed image to achieve accurate wavefront error retrieval. Meanwhile, the present disclosure overcomes the contradiction between underexposure and high signal-to-noise ratio (SNR) caused by a limited dynamic range when the image sensor (5) acquires an image. The detection device is simple and does not have high requirements for the experimental environment.
DEVICE AND METHOD FOR DETECTING WAVEFRONT ERROR BY MODAL-BASED OPTIMIZATION PHASE RETRIEVAL USING EXTENDED NIJBOER-ZERNIKE THEORY
The disclosure provides a device for detecting a wavefront error by modal-based optimization phase retrieval using an extended Nijboer-Zernike (ENZ) theory. The detection device includes a point light source (1), a half mirror (2), a lens (3) to be tested, a plane mirror (4) and an image sensor (5). The wavefront error of the component under test is characterized by using a Zernike polynomial, and a Zernike polynomial coefficient is solved based on an ENZ diffraction theory. The present disclosure realizes the one-time full-aperture measurement on the wavefront error of a large-aperture optical component, and can use a partially overexposed image to achieve accurate wavefront error retrieval. Meanwhile, the present disclosure overcomes the contradiction between underexposure and high signal-to-noise ratio (SNR) caused by a limited dynamic range when the image sensor (5) acquires an image. The detection device is simple and does not have high requirements for the experimental environment.
Laser detection system
A laser detection system and method of two way communication comprising: a Mach Zehnder interferometer, the Mach Zehnder interferometer comprising: an entry beam splitter for splitting incident light into a first arm, having an arm length L1 and a second arm having an arm length L2; a modulation stage for receiving a modulation signal and applying a phase difference to the second arm, the magnitude of the phase difference depending upon the magnitude of the modulation signal; an exit beam splitter for recombining light from the first arm with light from the second arm to create a first output and a second output; a detection stage comprising a first detector at the first output for detecting intensity modulation caused by interference of the recombined light; and a signal processor communicably connected to both the modulation stage and the detection stage.
Laser detection system
A laser detection system and method of two way communication comprising: a Mach Zehnder interferometer, the Mach Zehnder interferometer comprising: an entry beam splitter for splitting incident light into a first arm, having an arm length L1 and a second arm having an arm length L2; a modulation stage for receiving a modulation signal and applying a phase difference to the second arm, the magnitude of the phase difference depending upon the magnitude of the modulation signal; an exit beam splitter for recombining light from the first arm with light from the second arm to create a first output and a second output; a detection stage comprising a first detector at the first output for detecting intensity modulation caused by interference of the recombined light; and a signal processor communicably connected to both the modulation stage and the detection stage.
Optical modulator with automatic bias correction
An optical modulator uses an optoelectronic phase comparator configured to provide, in the form of an electrical signal, a measure of a phase difference between two optical waves. The phase comparator includes an optical directional coupler having two coupled channels respectively defining two optical inputs for receiving the two optical waves to be compared. Two photodiodes are configured to respectively receive the optical output powers of the two channels of the directional coupler. An electrical circuit is configured to supply, as a measure of the optical phase shift, an electrical signal proportional to the difference between the electrical signals produced by the two photodiodes.
Optical modulator with automatic bias correction
An optical modulator uses an optoelectronic phase comparator configured to provide, in the form of an electrical signal, a measure of a phase difference between two optical waves. The phase comparator includes an optical directional coupler having two coupled channels respectively defining two optical inputs for receiving the two optical waves to be compared. Two photodiodes are configured to respectively receive the optical output powers of the two channels of the directional coupler. An electrical circuit is configured to supply, as a measure of the optical phase shift, an electrical signal proportional to the difference between the electrical signals produced by the two photodiodes.
Wavefront detector
A wavefront detector (100) and method for determining a signal wavefront (Ws) of a signal beam (Ls). A beam combiner (11) is configured to combine the signal beam (Ls) with a reference beam (Lr). An image detector (12) comprising an array of photosensitive pixels (12p) is configured to receive and measure an interference pattern (Wrs) of the combined signal and reference beams (Lr+Ls). A reference light source (14) is configured to generate the reference beam (Lr). A feedback controller (20) is configured to receive an interference signal (I.sub.B) based on measurement of at least part of the combined signal and reference beams (Lr+Ls), and control generation of the reference beam (Lr) by a feedback loop based on the interference signal (I.sub.B).