A photoelectric conversion apparatus includes an interferometer configured to cause interference in wavelength swept light Lx output from a wavelength swept light source X and is configured to convert the interfered wavelength swept light by photoelectric conversion. A signal processing apparatus calculates, in chronological order, relative frequencies fr(t) indicating frequencies relative to interference signals i(t) obtained by the photoelectric conversion of the interference light iL, and measures a difference between a maximum value and a minimum value of the relative frequencies fr(t), as a sweep frequency width Δf of the wavelength swept light Lx.

A photoelectric conversion apparatus includes an interferometer configured to cause interference in wavelength swept light Lx output from a wavelength swept light source X and is configured to convert the interfered wavelength swept light by photoelectric conversion. A signal processing apparatus calculates, in chronological order, relative frequencies fr(t) indicating frequencies relative to interference signals i(t) obtained by the photoelectric conversion of the interference light iL, and measures a difference between a maximum value and a minimum value of the relative frequencies fr(t), as a sweep frequency width Δf of the wavelength swept light Lx.

A spectropolarimetric apparatus according to an embodiment of the present invention includes a light source attachment/detachment unit to which a light source is detachably coupled, a polarization interferometer configured to split light emitted from the light source coupled to the light source attachment/detachment unit into a plurality of polarized light beams using a polarization beam splitter and irradiate at least some of the split polarized light beams to a reflective sample to output the reflected light, and a spectrometer configured to measure physical properties of the reflective sample by analyzing the output light, wherein a wavelength of the light source coupled to the light source attachment/detachment unit varies depending on the reflective sample.

A spectropolarimetric apparatus according to an embodiment of the present invention includes a light source attachment/detachment unit to which a light source is detachably coupled, a polarization interferometer configured to split light emitted from the light source coupled to the light source attachment/detachment unit into a plurality of polarized light beams using a polarization beam splitter and irradiate at least some of the split polarized light beams to a reflective sample to output the reflected light, and a spectrometer configured to measure physical properties of the reflective sample by analyzing the output light, wherein a wavelength of the light source coupled to the light source attachment/detachment unit varies depending on the reflective sample.

Quantitative phase gradient microscopes (QPGM) using metasurface layers including birefringent lenses are disclosed. The birefringent lenses are manufactured by patterning nanoposts on two different transparent substrates or on opposite sides of the same transparent substrate. Methods to generate phase gradient images (PGI) of objects using the described devices are also disclosed.

Quantitative phase gradient microscopes (QPGM) using metasurface layers including birefringent lenses are disclosed. The birefringent lenses are manufactured by patterning nanoposts on two different transparent substrates or on opposite sides of the same transparent substrate. Methods to generate phase gradient images (PGI) of objects using the described devices are also disclosed.

Methods for design and production of highly sensitive active and passive light detecting devices and systems. Orders of magnitude improvement in optical signal detection is made possible in high noise or low contrast scenes. The current invention creates a small spectral difference between two parts of a split light stream. When recombined, the altered light streams partially correlate, and that generates fall amplitude signal oscillation at a frequency that depends on the constituent spectrum. The full amplitude signals and spectrum dependent oscillation make signal discrimination much better than intensity-only methods. The effect of read noise, amplifier noise, dark current noise, and thermal noise due to photo detector shunt resistance, become less important when compared to light detection using prior art methods.

In a general aspect, a method is presented for increasing the measurement precision of an optical instrument. The method includes determining, based on optical data and environmental data, a measured value of an optical property measured by the optical instrument. The optical instrument includes an optical path and a sensor configured to measure an environmental parameter. The method also includes determining a predicted value of the optical property based on a model representing time evolution of the optical instrument. The method additionally includes calculating an effective value of the optical property based on the measured value, the predicted value, and a Kalman gain. The Kalman gain is based on respective uncertainties in the measured and predicted values and defines a relative weighting of the measured and predicted values in the effective value.

In a general aspect, a method is presented for increasing the measurement precision of an optical instrument. The method includes determining, based on optical data and environmental data, a measured value of an optical property measured by the optical instrument. The optical instrument includes an optical path and a sensor configured to measure an environmental parameter. The method also includes determining a predicted value of the optical property based on a model representing time evolution of the optical instrument. The method additionally includes calculating an effective value of the optical property based on the measured value, the predicted value, and a Kalman gain. The Kalman gain is based on respective uncertainties in the measured and predicted values and defines a relative weighting of the measured and predicted values in the effective value.

An optical locker may include an assembly. The assembly may include a beam splitter, configured to split an input beam into at least three beams; an etalon having at least three regions, positioned so that each beam passes through a different region; a detector configured to measure output intensities, Tn, of the etalon for the beam; and a controller configured to determine a ratio, Ta/Tb, of the output intensities, wherein that ratio has a slope at the output intensities which is above a threshold, obtain a target frequency of the input beam, and determine an actual frequency of the input beam based on the target frequency and the ratio of the output intensities.