G01K3/08

Atmospheric turbulence detection method and atmospheric turbulence detection device

An atmospheric turbulence detection method includes: providing a temperature difference measuring device including a thermocouple element and two sensing probes, wherein the thermocouple element has two opposite end portions, the two sensing probes are respectively disposed at the two end portions, and there is an ambient distance between the two end portions; placing the temperature difference measuring device in an atmospheric environment to generate an electromotive force by a temperature difference between the two end portions; analyzing the electromotive force to convert the electromotive force into an ambient temperature difference of an environment where the two end portions of the thermocouple element are located, an atmospheric refractive index structure constant is calculated according to the ambient temperature difference and the ambient distance, and a value of the atmospheric refractive index structure constant corresponds to an ambient disturbance of an atmospheric turbulence. An atmospheric turbulence detection device is also provided.

Atmospheric turbulence detection method and atmospheric turbulence detection device

An atmospheric turbulence detection method includes: providing a temperature difference measuring device including a thermocouple element and two sensing probes, wherein the thermocouple element has two opposite end portions, the two sensing probes are respectively disposed at the two end portions, and there is an ambient distance between the two end portions; placing the temperature difference measuring device in an atmospheric environment to generate an electromotive force by a temperature difference between the two end portions; analyzing the electromotive force to convert the electromotive force into an ambient temperature difference of an environment where the two end portions of the thermocouple element are located, an atmospheric refractive index structure constant is calculated according to the ambient temperature difference and the ambient distance, and a value of the atmospheric refractive index structure constant corresponds to an ambient disturbance of an atmospheric turbulence. An atmospheric turbulence detection device is also provided.

SYSTEMS AND METHODS FOR DETERMINING AN OPERATING MODE OF A BATTERY
20220404426 · 2022-12-22 ·

A system for determining an operating mode of a battery includes a voltage sensor configured to detect a present voltage across terminals of the battery. The system further includes a non-transitory memory configured to store previously detected voltages across the terminals of the battery, and a previous operating mode of the battery. The system further includes a processor coupled to the voltage sensor and the non-transitory memory and configured to determine the operating mode of the battery by comparing the present voltage across the terminals of the battery to the previously detected voltages of the battery and based on the previous operating mode of the battery.

SYSTEMS AND METHODS FOR DETERMINING AN OPERATING MODE OF A BATTERY
20220404426 · 2022-12-22 ·

A system for determining an operating mode of a battery includes a voltage sensor configured to detect a present voltage across terminals of the battery. The system further includes a non-transitory memory configured to store previously detected voltages across the terminals of the battery, and a previous operating mode of the battery. The system further includes a processor coupled to the voltage sensor and the non-transitory memory and configured to determine the operating mode of the battery by comparing the present voltage across the terminals of the battery to the previously detected voltages of the battery and based on the previous operating mode of the battery.

System and method for empirical electrical-space-heating-based estimation of overall thermal performance of a building
11531936 · 2022-12-20 · ·

The overall thermal performance of a building UA.sup.Total can be empirically estimated through a short-duration controlled test. Preferably, the controlled test is performed at night during the winter. A heating source is turned off after the indoor temperature has stabilized. After an extended period, such as 12 hours, the heating source is briefly turned back on, such as for an hour, then turned off. The indoor temperature is allowed to stabilize. The energy consumed within the building during the test period is assumed to equal internal heat gains. Overall thermal performance is estimated by balancing the heat gained with the heat lost during the test period.

System and method for empirical electrical-space-heating-based estimation of overall thermal performance of a building
11531936 · 2022-12-20 · ·

The overall thermal performance of a building UA.sup.Total can be empirically estimated through a short-duration controlled test. Preferably, the controlled test is performed at night during the winter. A heating source is turned off after the indoor temperature has stabilized. After an extended period, such as 12 hours, the heating source is briefly turned back on, such as for an hour, then turned off. The indoor temperature is allowed to stabilize. The energy consumed within the building during the test period is assumed to equal internal heat gains. Overall thermal performance is estimated by balancing the heat gained with the heat lost during the test period.

TEMPERATURE SENSING CIRCUIT WITH SHUT OFF

A temperature sensor circuit for sensing the temperature of an electronic component is disclosed. The temperature sensor circuit comprises a first transistor configured to be thermally isolated from the electronic component and being configured to sense an ambient temperature and a second transistor configured to be thermally linked to the electronic component and being configured to sense a temperature at the electronic component. The temperature sensor circuit is a differential circuit having a first path and a second path with the first and second transistors being arranged on the first and second paths of the differential circuit, respectively, such that the temperature sensor circuit generates an output voltage inversely proportional to a temperature difference between the ambient temperature and the temperature at the electronic component. The temperature sensor circuit also comprises a shut-off switch configured to activate or deactivate the temperature sensor circuit.

TEMPERATURE SENSING CIRCUIT WITH SHUT OFF

A temperature sensor circuit for sensing the temperature of an electronic component is disclosed. The temperature sensor circuit comprises a first transistor configured to be thermally isolated from the electronic component and being configured to sense an ambient temperature and a second transistor configured to be thermally linked to the electronic component and being configured to sense a temperature at the electronic component. The temperature sensor circuit is a differential circuit having a first path and a second path with the first and second transistors being arranged on the first and second paths of the differential circuit, respectively, such that the temperature sensor circuit generates an output voltage inversely proportional to a temperature difference between the ambient temperature and the temperature at the electronic component. The temperature sensor circuit also comprises a shut-off switch configured to activate or deactivate the temperature sensor circuit.

VARIABLE ATTENUATION CIRCUIT UTILIZING VARACTOR DIODES

A variable attenuator circuit is disclosed. The variable attenuator circuit comprises a plurality of varactor diodes configured to attenuate an RF signal between an RF input and an RF output; a reference voltage input, and a control voltage input configured to vary the attenuation of the variable attenuator circuit based upon a control voltage. A radio frequency module and wireless device comprising said variable attenuator are also provided.

WAFER TEST SYSTEM AND OPERATING METHOD THEREOF
20230384365 · 2023-11-30 ·

A wafer test system includes a chuck for supporting a wafer including a plurality of dies, a probe head for inputting a test signal for an electrical test to the probe card and receiving an electrical test result corresponding to the test signal, a probe card for inputting test signals to the dies through a plurality of pins and receiving test result, a sensing device mounted on the surface of the probe card, for sensing an active state occurring in the wafer when the electrical test is performed, and a determination unit for receiving the electrical test result and the active state information for the dies and determining whether each of the dies has failed using the result of the electrical test on the wafer and active state information.