A diode voltage from a diode circuit can be combined with a proportional to absolute temperature (PTAT) voltage generated by a PTAT circuit to determine a temperature sensor voltage. This temperature sensor voltage may correspond to a temperature of a circuit or a localized temperature. By determining the temperature sensor voltage using a combination of a PTAT voltage and diode voltage, it is possible to remove or a PTAT circuit used to generate a bandgap voltage, which may shrink the temperature sensor and increase the accuracy of the temperature sensor circuit.

A process for controlled heating of a sensor of an aftertreatment system comprising accessing several parameters, including an exhaust mass flow, an outlet temperature, an ambient air temperature, and an ambient air velocity, calculating a temperature of the sensor based on a thermal model and the accessed parameters, comparing the calculated temperature to a threshold temperature, and activating a controlled heating process for the sensor responsive to the calculated temperature being below the threshold temperature. The controlled heating process can include activating a heater to heat the sensor.

A microscale thermocouple probe for intracellular temperature measurements comprises a cantilever structure including a suspended portion extending from a support, where the suspended portion includes first and second conductive lines on a surface thereof. The first and second conductive lines extend along the surface and meet at a tip of the suspended portion to define a thermocouple junction.

A system for determining a temperature of an object includes a three-dimensional (3D) printer configured to successively deposit a first layer of material, a second layer of material, and a third layer of material to form the object. The 3D printer is configured to form a recess in the second layer of material. The material is a metal. The system also includes a temperature sensor configured to be positioned at least partially with the recess and to have the third layer deposited thereon. The temperature sensor is configured to measure a temperature of the first layer of material, the second layer of material, the third layer of material, or a combination thereof.

According to one embodiment, a semiconductor device 1 includes a temperature sensor module 10 that outputs a non-linear digital value with respect to temperature and a substantially linear sensor voltage value with respect to the temperature, a storage unit 30 that stores the temperature, the digital value, and the sensor voltage value, and a controller 40 that calculates a characteristic formula using the temperature, the digital value, and the sensor voltage value stored in the storage unit 30, in which the temperature, the digital value, and the sensor voltage value stored in the storage unit 30 include absolute temperature under measurement of absolute temperature, the digital value at the absolute temperature, and the sensor voltage value at the absolute temperature.

A device for thermal treatment of samples includes: a base unit with a receiving region for a sample carrier; a temperature control block arranged in the receiving region; a lid; a temperature sensor for detecting a temperature of the temperature control block; a control unit for heating and cooling the temperature control block; and a reference element for in situ calibrating, validating and/or adjusting of the temperature sensor, which reference element is comprised of a material having at least one phase change at at least one predetermined phase change temperature in a temperature range suitable for calibrating the temperature sensor, during which phase change the material remains in the solid state.

The present invention includes an apparatus for determining and/or monitoring a process variable, especially the temperature, or the flow, of a medium in a containment, including a temperature sensor for registering temperature and a flexible, a heat insulating support element, which is arrangeable on an outer surface of a wall of the containment, wherein the temperature sensor is secured to the support element.

A novel high temperature thermal sensing method and device is disclosed that can employ a dual-sensing platinum resistor encased in a mono-crystalline alpha-alumina (sapphire) substrate. The device can comprise four platinum trace elements, oriented with 90° rotational symmetry atop a 1120 oriented crystal lattice substrate. The resistance temperature detectors (RTD) temperature measurement calibration can then be monitored for drift and corrected by comparing the differential strain-derived measurement of temperature to the temperature derived from the RTD measurement. This can allow the device to self-calibrate via comparison of two functionally independent measures of electron mobility and operate in extreme environments which have previously caused RTD sensors to drift from their initial calibration and introduce an undefined measurement error.

A biological data measurement device includes a substrate disposed at a position spaced a predetermined distance from a body surface of a living organism as a measuring object via a support member so that an air layer is formed between the substrate and the body surface. The substrate is provided with a temperature measurement device including an infrared thermometer for measuring a body surface temperature Tsk of the body surface and a substrate thermometer for measuring a substrate temperature Tsub of the substrate. The temperature measurement device measures the body surface temperature Tsk and the substrate temperature Tsub in the same place at least twice of a first timing A and a second timing B.

A temperature detection system includes a housing, a thermal imaging system at least partially disposed within the housing, and a data correction system communicatively coupled with the thermal imaging system. The thermal imaging system is configured to capture at least one thermal image of a subject. The data correction system is configured to correct at least one error associated with the at least one thermal image of the subject.