According to one embodiment, a semiconductor device 1 includes a temperature sensor module 10 that outputs a non-linear digital value with respect to temperature and a substantially linear sensor voltage value with respect to the temperature, a storage unit 30 that stores the temperature, the digital value, and the sensor voltage value, and a controller 40 that calculates a characteristic formula using the temperature, the digital value, and the sensor voltage value stored in the storage unit 30, in which the temperature, the digital value, and the sensor voltage value stored in the storage unit 30 include absolute temperature under measurement of absolute temperature, the digital value at the absolute temperature, and the sensor voltage value at the absolute temperature.

An exemplary embodiment of the present invention provides systems and methods of compensating sensor drift. In one example embodiment, a system may comprise a primary sensor having a primary full-scale range and configured to output a primary environmental condition signal indicative of an environmental condition; a reference sensor having a reference full-scale range and configured to output a reference environmental condition signal indicative of the environmental condition, wherein the reference full-scale range is less than the primary full-scale range; and a drift compensation system configured to determine a drift compensation signal using the primary environmental signal and the reference environmental condition signal responsive to the reference environmental conditional signal being in the reference full-scale range and compensate the primary environmental condition signal using the drift compensation signal.

Representative implementations of devices and techniques provide calibration for a chip-based temperature sensor. Two or more measurements are taken using a high resolution temperature sensor digitizer, and used to determine a calibration for the temperature sensor, based on a reference temperature value calculated from the measurements.

Disclosed is a temperature sensor including a first current generator configured to generate a proportional to absolute temperature (PTAT) current, a second current generator configured to generate an inverse PTAT (IPTAT) current, the PTAT current and IPTAT current being combined to form a reference current having a sensitivity relative to temperature, a plurality of current mirrors to adjust the sensitivity and gain of the reference current, and a variable resistor to set an output calibration voltage based on the generated current.

A temperature detector and method of measuring temperature to obtain temperature readings in environments, such as fluids and gasses, by measuring electrical characteristics of the temperature detector that are influenced by the temperature. The temperature detector can be arranged such that a plurality of measurements can be obtained to provide sufficient diversity and redundancy of the measurements for enhanced diagnostics to be performed, such as optimization for fast dynamic response, calibration stability, in-situ response time testability, and in-situ calibration testability.

The invention relates to a device (100) for calibrating the temperature of a fiber-optic temperature sensor, with which an optical fiber (10) of a fiber-optic temperature sensor is to be provided. The device (100) comprises a device body (101) having a passage (109) through which the optical fiber (10) is to pass, and a means for transferring heat energy. The device (100) further comprises at least one portion (160a), referred to as a first fixed point, which is made from a first material having at least a first predefined temperature at which the state thereof changes. The first fixed point (160a) is thermally connected to the optical fiber (10) when the optical fiber (10) is provided with the device (100). The heat-transferring means is arranged in the device body (101) such that, during the actuation thereof, the heat-transferring means exchanges heat energy with the first fixed point (160a) so as to cause a change in the state thereof at the first predefined temperature.

A method of calibrating a thermal sensor device is provided. The method includes extracting an incremental voltage to temperature curve for a diode array from a first incremental voltage of the diode array at a first temperature. The diode array and a device under test (DUT) which includes a thermal sensor are heated. After heating the diode array, a first incremental temperature is determined from the incremental voltage to temperature curve for the diode array and a second incremental voltage of the diode array after heating the diode array. An incremental voltage to temperature curve is extracted for the DUT from the first incremental temperature, a first incremental voltage for the DUT at the first temperature, and a second incremental voltage of the DUT after heating the device under test. A temperature error for the thermal sensor is determined from the incremental voltage to temperature curve for the DUT.

Provided are a temperature sensor, an array substrate, and a display device. In the temperature sensor, a low-pass filter is disposed between a ring oscillator and a comparator, so that a square-wave signal output from the ring oscillator passes through the low-pass filter and a high-frequency component in the square-wave signal output from the ring oscillator is directly filtered out by the low-pass filter, thereby improving a signal-to-noise ratio of the ring oscillator and a test accuracy of the temperature sensor.

An environment sensor includes a heat generation component, a first sensor and a second sensor disposed such that conductive heat resistances between the first sensor and the heat generation component and between the second sensor and the heat generation component are different from each other, and a controller. The first sensor and the second sensor are capable of measuring a predetermined physical quantity. The first sensor and the second sensor obtain a measured value from the predetermined physical quantity. The measured value fluctuates depending on ambient temperature. The controller is configured to correct the measurement value of one of the first sensor and the second sensor based on the measurement value of the first sensor and the measurement value of the second sensor when the predetermined physical quantity is measured.

A biological data measurement device according to the present invention includes a substrate disposed at a position spaced a predetermined distance from a body surface BS of a living organism as a measuring object via a support member so that an air layer is formed between the substrate and the body surface, in which the substrate is provided with a thermometer including an infrared thermometer for measuring a body surface temperature and a substrate thermometer for measuring a substrate temperature, thereby measuring a deep body temperature with higher accuracy.